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Topic: System-on-chip
Results
2011 / IEEE
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
2011 / IEEE
By: Bruguier, F.; Almeida, G.M.; Ost, L.; Busseuil, R.; Sassatelli, G.; Robert, M.; Torres, L.; Benoit, P.;
By: Bruguier, F.; Almeida, G.M.; Ost, L.; Busseuil, R.; Sassatelli, G.; Robert, M.; Torres, L.; Benoit, P.;
2011 / IEEE
By: Chien, G.; Chinq-Shiun Chiu; Tzung-Han Wu; Sheng-Jui Huang; Wen-Chang Lee; Hsiang-Hui Chang; Chi-Yao Yu; Sun, C.E.; Lan-Chou Cho; Yen-Horng Chen; Lu, I.S.; Chih-Chun Tang;
By: Chien, G.; Chinq-Shiun Chiu; Tzung-Han Wu; Sheng-Jui Huang; Wen-Chang Lee; Hsiang-Hui Chang; Chi-Yao Yu; Sun, C.E.; Lan-Chou Cho; Yen-Horng Chen; Lu, I.S.; Chih-Chun Tang;
2011 / IEEE
By: Yu-Huei Lee; Ying-Hsi Lin; Chen-Chih Huang; Ke-Horng Chen; Wen-Shen Chou; Yao-Yi Yang; Tzu-Chi Huang;
By: Yu-Huei Lee; Ying-Hsi Lin; Chen-Chih Huang; Ke-Horng Chen; Wen-Shen Chou; Yao-Yi Yang; Tzu-Chi Huang;
2012 / IEEE
By: Cheng-Wei Cao; Zhang, D.W.; Peng-Fei Wang; Xing, C.; Qing-Qing Sun; Xi Lin; Song-Gan Zang;
By: Cheng-Wei Cao; Zhang, D.W.; Peng-Fei Wang; Xing, C.; Qing-Qing Sun; Xi Lin; Song-Gan Zang;
2012 / IEEE
By: Cabal-Yepez, E.; Pena-Anaya, M.; Romero-Troncoso, R.J.; Osornio-Rios, R.A.; Garcia-Perez, A.;
By: Cabal-Yepez, E.; Pena-Anaya, M.; Romero-Troncoso, R.J.; Osornio-Rios, R.A.; Garcia-Perez, A.;
2012 / IEEE
By: Yu-Chi Su; Keng-Yen Huang; Liang-Gee Chen; Yi-Min Tsai; Shao-Yi Chien; Tse-Wei Chen;
By: Yu-Chi Su; Keng-Yen Huang; Liang-Gee Chen; Yi-Min Tsai; Shao-Yi Chien; Tse-Wei Chen;
2012 / IEEE
By: Xiaochun Ye; Da Wang; Hao Zhang; Dongrui Fan; Ninghui Sun; Guojie Li; Fenglong Song;
By: Xiaochun Ye; Da Wang; Hao Zhang; Dongrui Fan; Ninghui Sun; Guojie Li; Fenglong Song;
2012 / IEEE
By: Iwashita, T.; Satou, M.; Ohdaira, Y.; Saito, T.; Nishio, Y.; Horikoshi, Y.; Sonohara, H.; Suenaga, S.; Nomura, M.; Ikenaga, Y.; Mizuno, M.; Hayashi, Y.; Noguchi, K.; Nose, K.; Nishida, K.;
By: Iwashita, T.; Satou, M.; Ohdaira, Y.; Saito, T.; Nishio, Y.; Horikoshi, Y.; Sonohara, H.; Suenaga, S.; Nomura, M.; Ikenaga, Y.; Mizuno, M.; Hayashi, Y.; Noguchi, K.; Nose, K.; Nishida, K.;
2012 / IEEE
By: Chao-Cheng Lee; Ying-Hsi Lin; Ke-Horng Chen; Shen-Yu Peng; Chen-Chih Huang; Yu-Huei Lee; Chao-Chang Chiu; Tsung-Yen Tsai;
By: Chao-Cheng Lee; Ying-Hsi Lin; Ke-Horng Chen; Shen-Yu Peng; Chen-Chih Huang; Yu-Huei Lee; Chao-Chang Chiu; Tsung-Yen Tsai;
2012 / IEEE
By: Banerjee, A.; Hyun Woo Choi; Natarajan, V.; Bhattacharya, S.; Sen, S.; Taenzler, F.; Srinivasan, G.; Chatterjee, A.;
By: Banerjee, A.; Hyun Woo Choi; Natarajan, V.; Bhattacharya, S.; Sen, S.; Taenzler, F.; Srinivasan, G.; Chatterjee, A.;
2012 / IEEE
By: Gammie, G.; Sinangil, M.E.; Ko, U.; Chandrakasan, A.P.; Buss, D.; Baldwin, G.; Ho, L.; Honnavara-Prasad, S.; Ickes, N.; Rong, B.; Datla, S.R.; Mair, H.; Wang, A.; Gu, J.; Rithe, R.;
By: Gammie, G.; Sinangil, M.E.; Ko, U.; Chandrakasan, A.P.; Buss, D.; Baldwin, G.; Ho, L.; Honnavara-Prasad, S.; Ickes, N.; Rong, B.; Datla, S.R.; Mair, H.; Wang, A.; Gu, J.; Rithe, R.;
2012 / IEEE
By: Boumaiza, S.; Balasubramanian, S.; Khalil, W.; Wilson, J.; Sarbishaei, H.; Creech, G.; Volakis, J.; Orlando, P.; Quach, T.;
By: Boumaiza, S.; Balasubramanian, S.; Khalil, W.; Wilson, J.; Sarbishaei, H.; Creech, G.; Volakis, J.; Orlando, P.; Quach, T.;
2012 / IEEE
By: Colombeau, B.; Chung, S.S.; Guo, B.N.; Hsieh, E.R.; Wu, J.Y.; Chan, M.; Lu, S.; Liao, C.I.; Chin, Y.L.; Chen, W.J.; Lin, G.P.; Tzeng, C.Y.; Li, C.I.; Tsai, C.H.; Yang, C.L.; Chen, I.C.;
By: Colombeau, B.; Chung, S.S.; Guo, B.N.; Hsieh, E.R.; Wu, J.Y.; Chan, M.; Lu, S.; Liao, C.I.; Chin, Y.L.; Chen, W.J.; Lin, G.P.; Tzeng, C.Y.; Li, C.I.; Tsai, C.H.; Yang, C.L.; Chen, I.C.;
2012 / IEEE
By: Shao-Yi Chien; Yi-Min Tsai; Keng-Yen Huang; Yu-Chi Su; Tse-Wei Chen; Liang-Gee Chen;
By: Shao-Yi Chien; Yi-Min Tsai; Keng-Yen Huang; Yu-Chi Su; Tse-Wei Chen; Liang-Gee Chen;
2009 / IEEE / 978-1-4577-0493-2
By: Reorda, M.S.; Grosso, M.; Paccagnella, A.; Rech, P.; Appello, D.; Melchiori, F.;
By: Reorda, M.S.; Grosso, M.; Paccagnella, A.; Rech, P.; Appello, D.; Melchiori, F.;
2011 / IEEE / 978-1-4503-0636-2
By: Shi-Yu Huang; Chia-Chien Weng; Shan-Chien Fang; Jia-Lu Liao; Chen-Wei Hsu; Jen-Chieh Yeh; Wen-Tsan Hsieh;
By: Shi-Yu Huang; Chia-Chien Weng; Shan-Chien Fang; Jia-Lu Liao; Chen-Wei Hsu; Jen-Chieh Yeh; Wen-Tsan Hsieh;
2011 / IEEE / 978-1-61284-175-5
By: Cheng, K.; Khakifirooz, A.; Kulkarni, P.; Ponoth, S.; Haran, B.; Kumar, A.; Adam, T.; Reznicek, A.; Loubet, N.; He, H.; Kuss, J.; Wang, M.; Levin, T.M.; Monsieur, F.; Liu, Q.; Sreenivasan, R.; Cai, J.; Kimball, A.; Mehta, S.; Luning, S.; Zhu, Y.; Zhu, Z.; Yamamoto, T.; Bryant, A.; Lin, C.; Naczas, S.; Jagannathan, H.; Edge, L.F.; Allegret-Maret, S.; Dube, A.; Kanakasabapathy, S.; Schmitz, S.; Inada, A.; Seo, S.; Raymond, M.; Zhang, Z.; Yagishita, A.; Demarest, J.; Li, J.; Hopstaken, M.; Berliner, N.; Upham, A.; Johnson, R.; Holmes, S.; Standaert, T.; Smalley, M.; Zamdmer, N.; Ren, Z.; Wu, T.; Bu, H.; Paruchuri, V.; Sadana, D.; Narayanan, V.; Haensch, W.; O'Neill, J.; Hook, T.; Khare, M.; Doris, B.;
By: Cheng, K.; Khakifirooz, A.; Kulkarni, P.; Ponoth, S.; Haran, B.; Kumar, A.; Adam, T.; Reznicek, A.; Loubet, N.; He, H.; Kuss, J.; Wang, M.; Levin, T.M.; Monsieur, F.; Liu, Q.; Sreenivasan, R.; Cai, J.; Kimball, A.; Mehta, S.; Luning, S.; Zhu, Y.; Zhu, Z.; Yamamoto, T.; Bryant, A.; Lin, C.; Naczas, S.; Jagannathan, H.; Edge, L.F.; Allegret-Maret, S.; Dube, A.; Kanakasabapathy, S.; Schmitz, S.; Inada, A.; Seo, S.; Raymond, M.; Zhang, Z.; Yagishita, A.; Demarest, J.; Li, J.; Hopstaken, M.; Berliner, N.; Upham, A.; Johnson, R.; Holmes, S.; Standaert, T.; Smalley, M.; Zamdmer, N.; Ren, Z.; Wu, T.; Bu, H.; Paruchuri, V.; Sadana, D.; Narayanan, V.; Haensch, W.; O'Neill, J.; Hook, T.; Khare, M.; Doris, B.;
2011 / IEEE / 978-1-61284-175-5
By: Yu-Chi Su; Liang-Gee Chen; Shao-Yi Chien; Yi-Min Tsai; Tse-Wei Chen; Keng-Yen Huang;
By: Yu-Chi Su; Liang-Gee Chen; Shao-Yi Chien; Yi-Min Tsai; Tse-Wei Chen; Keng-Yen Huang;
2011 / IEEE / 978-1-4577-0642-4
By: Khiar, A.; Gantel, L.; Kessal, L.; Lemonnier, F.; Benkhelifa, A.; Miramond, B.;
By: Khiar, A.; Gantel, L.; Kessal, L.; Lemonnier, F.; Benkhelifa, A.; Miramond, B.;
2011 / IEEE / 978-1-61284-175-5
By: Suenaga, S.; Nose, K.; Nomura, M.; Ikenaga, Y.; Mizuno, M.; Hayashi, Y.; Noguchi, K.; Sonohara, H.; Nishida, K.; Satou, M.; Iwashita, T.; Nishio, Y.; Ohdaira, Y.; Saito, T.; Horikoshi, Y.;
By: Suenaga, S.; Nose, K.; Nomura, M.; Ikenaga, Y.; Mizuno, M.; Hayashi, Y.; Noguchi, K.; Sonohara, H.; Nishida, K.; Satou, M.; Iwashita, T.; Nishio, Y.; Ohdaira, Y.; Saito, T.; Horikoshi, Y.;