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Topic: Switching Circuits
Results
A cost-effective multistage interconnection network with network overlapping and memory interleaving
1985 / IEEEBy: Shin, K.G.; Jyh-Charn Liu;
2011 / IEEE
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
By: Masse, C.; Huang, C.-W.P.; Zhan-Feng Zhou; McPartlin, M.J.; Madan, A.; Cressler, J.D.;
2011 / IEEE
By: Dusseau, L.; Deneau, C.; Vaille, J.; Saigne, F.; Perez, S.; Roche, N.J.; Lorfevre, E.; Boch, J.; Gonzalez-Velo, Y.; Platteter, D.G.; Legoulven, E.; Chatry, C.; Schrimpf, R.D.;
By: Dusseau, L.; Deneau, C.; Vaille, J.; Saigne, F.; Perez, S.; Roche, N.J.; Lorfevre, E.; Boch, J.; Gonzalez-Velo, Y.; Platteter, D.G.; Legoulven, E.; Chatry, C.; Schrimpf, R.D.;
2011 / IEEE
By: Mook Seng Leong; Yongxin Guo; Xiaojun Bi; Fujiang Lin; Brinkhoff, J.; Yong Zhong Xiong; Lei Wang; Lin Jia;
By: Mook Seng Leong; Yongxin Guo; Xiaojun Bi; Fujiang Lin; Brinkhoff, J.; Yong Zhong Xiong; Lei Wang; Lin Jia;
2012 / IEEE
By: Ahn, J.H.; Schreiber, R.; Muralimanohar, N.; McLaren, M.; Jouppi, N.; Davis, A.; Binkert, N.;
By: Ahn, J.H.; Schreiber, R.; Muralimanohar, N.; McLaren, M.; Jouppi, N.; Davis, A.; Binkert, N.;
2012 / IEEE
By: Hehn, T.; Manoli, Y.; Frey, A.; Kuehne, I.; Marinkovic, D.; Maurath, D.; Hagedorn, F.;
By: Hehn, T.; Manoli, Y.; Frey, A.; Kuehne, I.; Marinkovic, D.; Maurath, D.; Hagedorn, F.;
2012 / IEEE
By: Ito, T.; Ban, K.; Kobayashi, Y.; Sai, A.; Tachibana, R.; Tsubouchi, Y.; Wang, T.; Hosoya, M.; Hoshino, H.; Tsutsumi, Y.; Mitomo, T.; Tomizawa, T.; Kurose, D.; Tandai, T.;
By: Ito, T.; Ban, K.; Kobayashi, Y.; Sai, A.; Tachibana, R.; Tsubouchi, Y.; Wang, T.; Hosoya, M.; Hoshino, H.; Tsutsumi, Y.; Mitomo, T.; Tomizawa, T.; Kurose, D.; Tandai, T.;
2012 / IEEE
By: Toifl, T.; Menolfi, C.; Ruegg, M.; Reutemann, R.; Dreps, D.; Beukema, T.; Morf, T.; Gardellini, D.; Kossel, M.; Buchmann, P.; Brandli, M.; Francese, P.A.; Prati, A.;
By: Toifl, T.; Menolfi, C.; Ruegg, M.; Reutemann, R.; Dreps, D.; Beukema, T.; Morf, T.; Gardellini, D.; Kossel, M.; Buchmann, P.; Brandli, M.; Francese, P.A.; Prati, A.;
2012 / IEEE
By: Klauk, H.; Ante, F.; Zaki, T.; Burghartz, J.N.; Zschieschang, U.; Richter, H.; Letzkus, F.; Butschke, J.;
By: Klauk, H.; Ante, F.; Zaki, T.; Burghartz, J.N.; Zschieschang, U.; Richter, H.; Letzkus, F.; Butschke, J.;
2012 / IEEE
By: Wootae Lee; Seungjae Jung; Jubong Park; Hyunsang Hwang; Seonghyun Kim; Jiyong Woo; Daeseok Lee; Jungho Shin;
By: Wootae Lee; Seungjae Jung; Jubong Park; Hyunsang Hwang; Seonghyun Kim; Jiyong Woo; Daeseok Lee; Jungho Shin;
2012 / IEEE
By: Dongsoo Lee; Bo Soo Kang; Myoung-Jae Lee; Seung-Eon Ahn; U-In Chung; Dong-Sik Kim; Chang-Jung Kim;
By: Dongsoo Lee; Bo Soo Kang; Myoung-Jae Lee; Seung-Eon Ahn; U-In Chung; Dong-Sik Kim; Chang-Jung Kim;
2012 / IEEE
By: Hyun-Wook Seong; Sang-Hyun Park; Je-Hyung Cho; Myung-Joong Youn; Eun-Seok Choi; Jin-Sik Park; Hyoung-Suk Kim;
By: Hyun-Wook Seong; Sang-Hyun Park; Je-Hyung Cho; Myung-Joong Youn; Eun-Seok Choi; Jin-Sik Park; Hyoung-Suk Kim;
Evaluation of Switching Surge Risks on the Low-Voltage Auxiliary System of Frequent Start-Stop Plant
2012 / IEEEBy: Chun-Chi Chen; Chun-Yao Lee; Chih-Ju Chou;
1992 / IEEE / 000-0-0000-0000-0
By: Terry, R.; Mulbrandon, M.; Giuliani, J.L.; LePell, P.D.; Deeney, C.; Commisso, R.; Ottinger, P.;
By: Terry, R.; Mulbrandon, M.; Giuliani, J.L.; LePell, P.D.; Deeney, C.; Commisso, R.; Ottinger, P.;
2000 / IEEE
By: Horioka, K.; Watanabe, M.; Takayama, K.; Kishiro, J.; Ogawa, M.; Hasegawa, J.; Shiho, M.; Hotta, E.; Nakajima, M.;
By: Horioka, K.; Watanabe, M.; Takayama, K.; Kishiro, J.; Ogawa, M.; Hasegawa, J.; Shiho, M.; Hotta, E.; Nakajima, M.;
2004 / IEEE / 978-5-87911-088-3
By: Weidong Qin; Yujuan Wang; Hongtao Li; Bonan Ding; Shen Ding; Zhen Fu; Jianjun Deng;
By: Weidong Qin; Yujuan Wang; Hongtao Li; Bonan Ding; Shen Ding; Zhen Fu; Jianjun Deng;
2009 / IEEE / 978-1-4577-0493-2
By: Perez, S.; Roche, N.J.; Boch, J.; Velo, Y.G.; Canals, A.; Vaille, J.; Schrimpf, R.D.; Chatry, C.; Lorfevre, E.; Saigne, F.; Dusseau, L.;
By: Perez, S.; Roche, N.J.; Boch, J.; Velo, Y.G.; Canals, A.; Vaille, J.; Schrimpf, R.D.; Chatry, C.; Lorfevre, E.; Saigne, F.; Dusseau, L.;