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Topic: Soft Switching
Results
2011 / IEEE / 978-1-4244-9312-8
By: Butterbach, S.; De Bernardinis, A.; Aubin, P.; Coquery, G.; Jeunesse, A.; Lallemand, R.;
By: Butterbach, S.; De Bernardinis, A.; Aubin, P.; Coquery, G.; Jeunesse, A.; Lallemand, R.;
2011 / IEEE / 978-90-75815-14-6
By: Lenke, R.; Etxeberria-Otadui, I.; San-Sebastian, J.; De Doncker, R.W.; Taraborrelli, S.; van Hoek, H.;
By: Lenke, R.; Etxeberria-Otadui, I.; San-Sebastian, J.; De Doncker, R.W.; Taraborrelli, S.; van Hoek, H.;
2011 / IEEE / 978-90-75815-14-6
By: Duron, J.; Pellerin, M.; Chaudhuri, T.; Weiss, M.; Stefanutti, P.; Lewdeni-Schmid, S.; Chuanhong Zhao; Steinke, J.K.;
By: Duron, J.; Pellerin, M.; Chaudhuri, T.; Weiss, M.; Stefanutti, P.; Lewdeni-Schmid, S.; Chuanhong Zhao; Steinke, J.K.;
2011 / IEEE / 978-90-75815-14-6
By: Thomas, S.; Trintis, I.; Teodorescu, R.; Munk-Nielsen, S.; Roggendorf, C.; Blank, T.;
By: Thomas, S.; Trintis, I.; Teodorescu, R.; Munk-Nielsen, S.; Roggendorf, C.; Blank, T.;
2011 / IEEE / 978-90-75815-14-6
By: Naetiladdanon, S.; Sangswang, A.; Jittakort, J.; Chudjuarjeen, S.; Koompai, C.;
By: Naetiladdanon, S.; Sangswang, A.; Jittakort, J.; Chudjuarjeen, S.; Koompai, C.;
2012 / IEEE / 978-1-4673-1561-6
By: Chacko, R.V.; Joseph, S.C.; Chandrasekar, V.; Lakaparampil, Z.V.;
By: Chacko, R.V.; Joseph, S.C.; Chandrasekar, V.; Lakaparampil, Z.V.;
2012 / IEEE / 978-1-4577-1216-6
By: Haibing Hu; Qian Zhang; Dehua Zhang; Batarseh, I.; Shen, J.; Grishina, A.;
By: Haibing Hu; Qian Zhang; Dehua Zhang; Batarseh, I.; Shen, J.; Grishina, A.;
2012 / IEEE / 978-1-4673-1408-4
By: Xuntuo Wang; Taylor, A.; Kane, J.; Patterson, J.; Szatmari-Voicu, G.; Hua Bai;
By: Xuntuo Wang; Taylor, A.; Kane, J.; Patterson, J.; Szatmari-Voicu, G.; Hua Bai;
2012 / IEEE / 978-1-4673-1408-4
By: Patterson, J.; Taylor, A.; Szatmari-Voicu, G.; Hua Bai; Wei Guo; Kane, J.;
By: Patterson, J.; Taylor, A.; Szatmari-Voicu, G.; Hua Bai; Wei Guo; Kane, J.;
2012 / IEEE / 978-1-4577-2085-7
By: Yong-Seok Lee; Se-Chun Kim; Jung-Hyo Lee; Dong-Ho Yu; Yong-Chae Jung; Chung-Yuen Won;
By: Yong-Seok Lee; Se-Chun Kim; Jung-Hyo Lee; Dong-Ho Yu; Yong-Chae Jung; Chung-Yuen Won;
Experimental considerations on adjustable dead-time controlled three-phase resonant snubber inverter
2012 / IEEE / 978-1-4577-2085-7By: Haruna, J.; Hoshi, N.; Hayama, H.;