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Topic: Sockets
Results
The application of intelligent remote monitoring platform under Windows on physical theory education
2011 / IEEE / 978-1-61284-774-0By: Wan-Feng Xia; Hua Tan; Rong Jiang;
2011 / IEEE / 978-1-4577-0134-4
By: Teixeira, F.C.; Estrella, J.C.; Bruschi, S.M.; Santana, R.H.C.; Santana, M.J.;
By: Teixeira, F.C.; Estrella, J.C.; Bruschi, S.M.; Santana, R.H.C.; Santana, M.J.;
2011 / IEEE / 978-1-61284-774-0
By: Yun-juan Liang; Ya-feng Han; Jin-na Lv; Zhi-jun Zhang; Xue-yong Li;
By: Yun-juan Liang; Ya-feng Han; Jin-na Lv; Zhi-jun Zhang; Xue-yong Li;
2011 / IEEE / 978-1-61284-660-6
By: Rosing, T.; Diefenbaugh, P.; Kam, T.; Yanqin Jin; Gorbatov, E.; Ogras, U.; Ayoub, R.;
By: Rosing, T.; Diefenbaugh, P.; Kam, T.; Yanqin Jin; Gorbatov, E.; Ogras, U.; Ayoub, R.;
2011 / IEEE / 978-1-4577-0308-9
By: Chia-Chen Wu; Ling Cheng; Yiu-Tong Chu; Chien-Nan Lee; Chan-Yueh Yang;
By: Chia-Chen Wu; Ling Cheng; Yiu-Tong Chu; Chien-Nan Lee; Chan-Yueh Yang;
2011 / IEEE / 978-1-61284-088-8
By: Xiong Yingjun; Lu Mingzhou; Sun Yuwen; Zhao Xianlin; Shen Mingxia; Liu Longshen;
By: Xiong Yingjun; Lu Mingzhou; Sun Yuwen; Zhao Xianlin; Shen Mingxia; Liu Longshen;
2011 / IEEE / 978-1-61284-425-1
By: Doerfler, D.; Barrett, R.; Rajan, M.; Vaughan, C.; Pedretti, K.;
By: Doerfler, D.; Barrett, R.; Rajan, M.; Vaughan, C.; Pedretti, K.;
2011 / IEEE / 978-1-61284-726-9
By: Lan, A.; Wang Yue; Xiaolin Sun; Yanmin Zhou; Jinghui Zhao; Liu Yuyan; Gao Donghui;
By: Lan, A.; Wang Yue; Xiaolin Sun; Yanmin Zhou; Jinghui Zhao; Liu Yuyan; Gao Donghui;
2011 / IEEE / 978-1-58537-193-8
By: Burgess, K.; Ward, S.; Rost, T.; Schichl, J.; Duvvury, C.; Kunz, H.;
By: Burgess, K.; Ward, S.; Rost, T.; Schichl, J.; Duvvury, C.; Kunz, H.;
2011 / IEEE / 978-1-4577-0434-5
By: Murakami, M.; Iwakawa, A.; Tsuboi, O.; Soneda, H.; Nakazawa, F.; Nagao, N.; Matsuda, M.;
By: Murakami, M.; Iwakawa, A.; Tsuboi, O.; Soneda, H.; Nakazawa, F.; Nagao, N.; Matsuda, M.;
2011 / IEEE / 978-1-4577-1563-1
By: Bosilca, G.; Squyres, J.M.; Geoffray, P.; Shipman, G.; Dillow, D.; Atchley, S.; Minnich, R.;
By: Bosilca, G.; Squyres, J.M.; Geoffray, P.; Shipman, G.; Dillow, D.; Atchley, S.; Minnich, R.;