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Topic: Simulation Languages
Results
2011 / IEEE / 978-1-4577-0125-2
By: Porter, J.; Eyisi, E.; Sztipanovits, J.; Koutsoukos, X.; Kottenstette, N.;
By: Porter, J.; Eyisi, E.; Sztipanovits, J.; Koutsoukos, X.; Kottenstette, N.;
2011 / IEEE / 978-1-4577-0781-0
By: Kuo-Fong Kao; Chih-Wei Lu; Chih-Hung Chang; Chorng-Shiuh Koong; Chu, W.C.; Pao-Ann Hsiung; Nien-Lin Hsueh; Chao-Tung Yang;
By: Kuo-Fong Kao; Chih-Wei Lu; Chih-Hung Chang; Chorng-Shiuh Koong; Chu, W.C.; Pao-Ann Hsiung; Nien-Lin Hsueh; Chao-Tung Yang;
2011 / IEEE / 978-1-4577-0781-0
By: Taguchi, K.; Komoto, T.; Futatsugi, K.; Yoshioka, N.; Mouratidis, H.;
By: Taguchi, K.; Komoto, T.; Futatsugi, K.; Yoshioka, N.; Mouratidis, H.;
2011 / IEEE / 978-1-4577-0434-5
By: Gomes, L.; Barros, J.P.; Pereira, F.; Moutinho, F.; Ribeiro, J.;
By: Gomes, L.; Barros, J.P.; Pereira, F.; Moutinho, F.; Ribeiro, J.;
2011 / IEEE / 978-0-7695-4425-0
By: Azevedo, C.L.B.; Guizzardi, G.; Quartel, D.; van Sinderen, M.; Almeida, J.P.A.;
By: Azevedo, C.L.B.; Guizzardi, G.; Quartel, D.; van Sinderen, M.; Almeida, J.P.A.;
2011 / IEEE / 978-1-4577-1542-6
By: Lankhorst, M.M.; Jonkers, H.; Iacob, M.-E.; Proper, E.; Quartel, D.A.C.;
By: Lankhorst, M.M.; Jonkers, H.; Iacob, M.-E.; Proper, E.; Quartel, D.A.C.;
2011 / IEEE / 978-2-9530504-4-8
By: Wuebbelmann, J.; Westerkamp, C.; Pulvermueller, E.; Iyenghar, P.;
By: Wuebbelmann, J.; Westerkamp, C.; Pulvermueller, E.; Iyenghar, P.;
2011 / IEEE / 978-1-4577-1743-7
By: Fummi, F.; Di Guglielm, L.; Vinco, S.; Stefanni, F.; Pravadelli, G.;
By: Fummi, F.; Di Guglielm, L.; Vinco, S.; Stefanni, F.; Pravadelli, G.;
Exploring Integrated Circuit Verification Methodology for Verification and Validation of PLC Systems
2011 / IEEE / 978-1-4577-1880-9By: Joshi, S.; Subbaraman, S.; Patil, M.M.;
2011 / IEEE / 978-1-4673-0107-7
By: Jianwen Li; Bin Gu; Yanxia Qi; Geguang Pu; Yongxin Zhao; Zheng Wang;
By: Jianwen Li; Bin Gu; Yanxia Qi; Geguang Pu; Yongxin Zhao; Zheng Wang;
2011 / IEEE / 978-1-4673-0090-2
By: Mangs, J.-E.; Melander, B.; Kelner, J.; Sadok, D.; Santos, M.; Endo, P.; Goncalves, G.;
By: Mangs, J.-E.; Melander, B.; Kelner, J.; Sadok, D.; Santos, M.; Endo, P.; Goncalves, G.;
2012 / IEEE / 978-1-4577-0557-1
By: Yu-Wen Tung; Keller, R.M.; Justice, H.L.; Carter, A.; Stone, C.A.;
By: Yu-Wen Tung; Keller, R.M.; Justice, H.L.; Carter, A.; Stone, C.A.;
2012 / IEEE / 978-1-4673-1807-5
By: Jezequel, J.-M.; Sunye, G.; Barais, O.; Nain, G.; Pazat, J.-L.; Fouquet, F.; Daubert, E.; Morin, B.;
By: Jezequel, J.-M.; Sunye, G.; Barais, O.; Nain, G.; Pazat, J.-L.; Fouquet, F.; Daubert, E.; Morin, B.;
2012 / IEEE / 978-1-4673-1423-7
By: Taha, W.; Chapoutot, A.; Ames, A.; Gaspes, V.; Cartwright, R.; Yingfu Zeng; Brauner, P.;
By: Taha, W.; Chapoutot, A.; Ames, A.; Gaspes, V.; Cartwright, R.; Yingfu Zeng; Brauner, P.;
2012 / IEEE / 978-1-4673-2670-4
By: Gong Xiong; Wang Xiaoping; Chen Liping; Wang Lei; Gu Bin; Zhou Fanli; Zhang Hongchang;
By: Gong Xiong; Wang Xiaoping; Chen Liping; Wang Lei; Gu Bin; Zhou Fanli; Zhang Hongchang;