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Topic: Service Composition
Results
2011 / IEEE / 978-1-4577-0574-8
By: Feng Chen; Bing Shao; Jinfeng Li; Qinhua Wang; Jin Dong; Changrui Ren;
By: Feng Chen; Bing Shao; Jinfeng Li; Qinhua Wang; Jin Dong; Changrui Ren;
2011 / IEEE / 978-1-4577-0842-8
By: Hacid, H.; Maaradji, A.; Crespi, N.; Daigremont, J.; Lateef, A.; Skraba, R.;
By: Hacid, H.; Maaradji, A.; Crespi, N.; Daigremont, J.; Lateef, A.; Skraba, R.;
2011 / IEEE / 978-1-4577-0842-8
By: Alexander, J.; Deichl, K.; Wei Tan; Madduri, R.; Jia Zhang; Foster, I.;
By: Alexander, J.; Deichl, K.; Wei Tan; Madduri, R.; Jia Zhang; Foster, I.;
2011 / IEEE / 978-1-4577-0863-3
By: Foster, I.; Madduri, R.; Jia Zhang; Wei Tan; Goble, C.; De Roure, D.;
By: Foster, I.; Madduri, R.; Jia Zhang; Wei Tan; Goble, C.; De Roure, D.;
2011 / IEEE / 978-1-4577-0879-4
By: Schuldt, H.; Milano, D.; Pautasso, C.; Peternier, A.; Stojnic, N.; Bonetta, D.; Binder, W.; Trummer, I.; Faltings, B.;
By: Schuldt, H.; Milano, D.; Pautasso, C.; Peternier, A.; Stojnic, N.; Bonetta, D.; Binder, W.; Trummer, I.; Faltings, B.;
2011 / IEEE / 978-1-61284-350-6
By: Ghafoor, Kayhan Zrar; Pinyol, Francesc; de Pozuelo, Ramon Martin; Alcober, Jesus; Gonzalez, Alberto J.;
By: Ghafoor, Kayhan Zrar; Pinyol, Francesc; de Pozuelo, Ramon Martin; Alcober, Jesus; Gonzalez, Alberto J.;
2011 / IEEE / 978-1-4577-0879-4
By: Sadok, D.; Lima, T.; Dias, C.; Azevedo, E.; Dantas, R.; Ohlman, B.; Kamienski, C.;
By: Sadok, D.; Lima, T.; Dias, C.; Azevedo, E.; Dantas, R.; Ohlman, B.; Kamienski, C.;
2011 / IEEE / 978-1-4577-0842-8
By: Unger, T.; Leymann, F.; Eberle, H.; Pistore, M.; Marconi, A.; Sirbu, A.;
By: Unger, T.; Leymann, F.; Eberle, H.; Pistore, M.; Marconi, A.; Sirbu, A.;
2011 / IEEE / 978-1-4577-0407-9
By: Gaoxuan Wang; Yinxiu Huang; Xiaocen Zhang; Lican Huang; Ren Wang;
By: Gaoxuan Wang; Yinxiu Huang; Xiaocen Zhang; Lican Huang; Ren Wang;
2011 / IEEE / 978-1-61284-319-3
By: Leymann, F.; Schleicher, D.; Levenshteyn, R.; Vandikas, K.; Niemoller, J.;
By: Leymann, F.; Schleicher, D.; Levenshteyn, R.; Vandikas, K.; Niemoller, J.;
2011 / IEEE / 978-1-61284-319-3
By: Liebau, N.C.; Vandikas, K.; Fikouras, I.; Mokrushin, L.; Dohring, M.;
By: Liebau, N.C.; Vandikas, K.; Fikouras, I.; Mokrushin, L.; Dohring, M.;
2011 / IEEE / 978-1-4577-1127-5
By: Sanchez-Esguevillas, A.; de las Heras, R.; Cadenas, A.; Carro, B.; Calavia, L.; Aguiar, J.M.; Baladron, C.;
By: Sanchez-Esguevillas, A.; de las Heras, R.; Cadenas, A.; Carro, B.; Calavia, L.; Aguiar, J.M.; Baladron, C.;
2011 / IEEE / 978-1-4577-0476-5
By: Mendes, R.; Zomaya, A.Y.; Taheri, J.; Batista, T.; Delicato, F.C.; Pires, P.F.;
By: Mendes, R.; Zomaya, A.Y.; Taheri, J.; Batista, T.; Delicato, F.C.; Pires, P.F.;