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Topic: Secondary Electron Emission

Results

Modeling Facility Effects on Secondary Electron Emission Experiment

2012 / IEEE
By: Velez, J.-C.M.; Belhaj, M.; Pu Wang; Wang, J.;

Secondary Electron Emission on Space Materials: Evaluation of the Total Secondary Electron Yield From Surface Potential Measurements

2012 / IEEE
By: Belhaj, M.; Payan, D.; Balcon, N.; Inguimbert, V.; Tondu, T.;

Generation of low-frequency homogeneous dielectric barrier discharge at atmospheric pressure

2012 / IEEE
By: Yoshioka, Y.; Osawa, N.;

Toward Terahertz Magnetrons: 210-GHz Spatial-Harmonic Magnetron With Cold Cathode

2012 / IEEE
By: Naumenko, V.D.; Avtomonov, N.I.; Markov, V.A.; Suvorov, A.N.; Schunemann, K.; Vavriv, D.M.;

Effects of bulk doping on surface insulating performance of alumina ceramic in vacuum

2011 / IEEE
By: Huang, Y.; Huang, X.J.; Tang, B.H.; Lei, Y.J.; Zeng, M.; You, X.F.;

Effects of the Operating Conditions on the Electrical Characteristics of Pulse Discharges in Atmospheric-Pressure Pure Helium

2012 / IEEE
By: Zhenyu Tan; Bo Chen; Xinxin Song;

Self-organisation processes and physics of magnetic insulation failure

2004 / IEEE / 978-5-87911-088-3
By: Fedorov, V.M.; Agafonov, A.V.; Tarakanov, V.P.;

Numerical simulation of sub-nanosecond electron beam extraction from gas-filled diode

2004 / IEEE / 978-5-87911-088-3
By: Orlovskii, V.M.; Yatsui, K.; Jiang, W.; Tarasenko, V.F.;

Simulation of Current Free Double layers in highly electronegative plasma using Monte Carlo Collision in OOPIC Pro and XOOPIC

2011 / IEEE / 978-1-61284-329-2
By: Hershkowitz, N.; Henderson, C.;

Effects of shape-gene on the secondary electron emission of curved-surfaces in low-octane primacy electrons

2011 / IEEE / 978-1-4244-9439-2
By: Jianfei Long; Licheng Tian;

Hop structure optimization

2011 / IEEE / 978-1-61284-329-2
By: Rowe, T.; Pearlman, M.; Browning, J.;

Simulation of metal surfaces secondary electron emission in multipactor

2011 / IEEE / 978-1-4577-0321-8
By: Wanzhao Cui; Yu Li; Rui Wang; Na Zhang;

High-power 95 GHz pulsed magnetrons

2011 / IEEE / 978-966-335-357-9
By: Moiseenko, A.E.; Suvorov, A.N.; Naumenko, V.D.;

A four-stage depressed collector for a W-band gyro-BWO

2011 / IEEE / 978-1-4577-0509-0
By: Liang Zhang; Ronald, K.; Phelps, A.D.R.; Cross, A.W.; Donaldson, C.R.; Wenlong He;

Radiation damage evaluation on LYSO and LuYAP materials through dpa calculation assisted by Monte Carlo method

2011 / IEEE / 978-1-4673-0120-6
By: Pinera, I.; Cruz, C.M.; Leyva, A.; Diaz, A.; Van Espen, P.; Abreu, Y.;

Fabrication and characterization of pressed Y2O3 doped Ba-W dispenser cathode

2012 / IEEE / 978-1-4673-0369-9
By: Yang, Fan; Wang, Yiman; Liu, Wei; Wang, Jinshu;

Theoretical analysis for different PDP protective layer materials

2012 / IEEE / 978-1-4673-0369-9
By: Li, Qiaofen; Tu, Yan; Yang, Lanlan; Tolner, Harm;

Mechanism Analysis of the Flashover Quenching the Photoconductive Semiconductor Switch in $\hbox{SF}_{6}$

2012 / IEEE
By: Wei Shi; Zenggong Jiang;

Self-sputtering runaway in high power impulse magnetron sputtering: The role of secondary electrons and multiply charged metal ions

2008 / American Institute of Physics
By: André Anders;

Erratum: Electron inelastic scattering and secondary electron emission calculated without the single-pole approximation [J. Appl. Phys. 104, 114907 (2008)]

2009 / American Institute of Physics
By: S. F. Mao; Y. G. Li; R. G. Zeng; Z. J. Ding;

Effect of secondary electron emission on the Jeans instability in a dusty plasma

2007 / American Institute of Physics
By: Susmita Sarkar; Banamali Roy; Saumyen Maity; Manoranjan Khan; M. R. Gupta;

Preparation and characterization of impregnated Y2O3-W Matrix Scandate Cathode

2014 / IEEE
By: Yang, Fan; Wang, Jinshu; Liu, Wei; Wang, Yiman; Zhou, Meiling;

A treatment which improves surface withstand voltage in vacuum

1988 / IEEE
By: Kristiansen, M.; Leiker, G.R.; Hatfield, L.L.; DiCapua, M.S.; Hofer, W.W.; Colmenares, C.;

Current status of crossed-field devices

1988 / IEEE
By: MacMaster, G.H.;

Secondary electron emission in the course of the first Trichel-like pulse development in N/sub 2/+SF/sub 6/ mixtures

1989 / IEEE
By: Hosokawa, T.; Cernak, M.;

A new formula for secondary emission yield

1989 / IEEE
By: Vaughan, J.R.M.;

Electron emission from dielectric surface due to UV irradiation under atmospheric air condition

1988 / IEEE
By: Saeki, M.; Gosho, Y.;

Electron-beam poling of very thin PVDF and VDF-TrFE copolymer films

1988 / IEEE
By: Dransfeld, K.; Schuler, S.; Schilling, D.;

Negative charging and secondary emission of Teflon FEP under electron irradiation

1988 / IEEE
By: Berraissoul, A.; Gross, B.;

Breakdown of alumina RF windows

1989 / IEEE
By: Anami, S.; Matuda, N.; Saito, Y.; Tanaka, J.; Horikoshi, G.; Kinbara, A.;

Electron emission from electron-irradiated dielectrics

1991 / IEEE
By: Hessel, R.; Gross, B.;

Secondary electron emission from a thin coating on Lucite and Lexan substrates

1989 / IEEE
By: Hatfield, L.L.; Boerwinkle, E.R.;

Simulation of rod charging in TWT helix structures

1989 / IEEE / 0-7803-0817-4
By: Bowness, C.; Smith, B.H.; Dallos, A.;

Secondary electron emission

1989 / IEEE / 0-7803-0817-4
By: Shroff, A.M.; Tonnerre, J.C.;

Computer simulation study of primary and secondary anode loading in magnetrons

1991 / IEEE
By: Dombrowski, G.E.;

Reduced sputtering of the divertor plate for ITER by thermionic electron emission

1989 / IEEE
By: Embrechts, M.J.; Steiner, D.;

An approximation formula for the secondary emission yield

1990 / IEEE
By: Abuelma'atti, M.T.;

Comments, with reply, on "An approximation formula for the secondary emission yield" by M.T. Abuelma"atti

1991 / IEEE
By: Abuelma'atti, M.T.; Vaughan, J.R.M.;

Escape depth of secondary electrons from electron-irradiated polymers

1992 / IEEE
By: Hessel, R.; Gross, B.;

Secondary emission of beryllia on beryllium

1992 / IEEE
By: Shaw, B.A.; Shapiro, E.K.; Dallos, A.;

Escape depth of secondary electrons from electron-irradiated polymers

1991 / IEEE / 0-7803-0112-9
By: Hessel, R.; Gross, B.;

Secondary emission properties as a function of the electron incidence angle

1993 / IEEE
By: Hor, C.; Shih, A.;

Secondary emission formulas

1993 / IEEE
By: Vaughan, R.M.;

Dielectric materials for use as output window in high-power klystrons

1993 / IEEE
By: Matuda, N.; Anami, S.; Yamaguchi, S.; Saito, Y.; Michizono, S.; Kinbara, A.;

Measurements of electron-RF interactions and noise in a low frequency crossed-field amplifier

1990 / IEEE
By: Browning, J.; Ye, J.; Chan, C.;

High speed and high resolution diagnostics for the early phase of dielectric surface flashover

1992 / IEEE / 0-7803-0649-X
By: Hatfield, L.; Krompholz, H.; Masten, G.; Hegeler, F.;

High-current plasma lens

1993 / IEEE
By: Protsenko, I.M.; Zatuagan, A.V.; Dobrovolsky, A.N.; Goncharov, A.A.;

Secondary emission from small dust grains at high electron energies

1994 / IEEE
By: Mendis, D.A.; Chow, V.W.; Rosenberg, M.;

The early phase of dielectric surface flashover

1992 / IEEE / 0-7803-0565-5
By: Krompholz, H.; Masten, G.; Hegeler, F.; Hatfield, L.L.;

Observations of secondary electron emission from diamond films

1992 / IEEE / 0-7803-0817-4
By: File, D.; Rameshan, R.; Rose, M.F.; Krainsky, I.L.; Mearini, G.; Gilmour, A.S., Jr.; Dayton, J.A., Jr.; Bekker, T.L.;

The angular distribution of elastically scattered electrons and computed impact on collector performance

1992 / IEEE / 0-7803-0817-4
By: Vaden, K.R.; Krainsky, I.L.; Mearini, G.T.; Dayton, J.A., Jr.; Curren, A.N.;

Rapid measurements of two dimensional ion beam current distribution for pulsed neutron source

1993 / IEEE / 0-7803-1203-1
By: Tron, A.M.;

Short bunch length detector for ion beam with high bunch density

1993 / IEEE / 0-7803-1203-1
By: Shako, V.V.; Tron, A.M.;

Prototype flying-wire beam-profile monitor

1993 / IEEE / 0-7803-1203-1
By: Wilke, M.D.; Warren, D.S.; Rendon, A.M.; Meyer, R.E.; Gilpatrick, J.D.; Fortgang, C.M.; Barlow, D.B.;

A high-current micro-pulse electron gun

1993 / IEEE / 0-7803-1203-1
By: Peter, W.; Mako, F.M.;

One-dimensional simulation studies of breakdown and electron beam generation processes for a hollow cathode pseudospark discharge

1993 / IEEE / 0-7803-1203-1
By: Cai, S.Y.; Striffler, C.D.;

Secondary electron emission properties of oxidized beryllium CFA cathodes

1994 / IEEE
By: Shih, A.; Abrams, R.H.; Hor, C.; Yater, J.;

An effective secondary electron emission suppression treatment for copper MDC electrodes

1993 / IEEE / 0-7803-1450-6
By: Jensen, K.A.; Long, K.J.; Curren, A.N.; Roman, R.F.;

A model of secondary emission for use in computer simulation of vacuum electronic devices

1993 / IEEE / 0-7803-1450-6
By: Chernin, D.; Kress, M.; Drobot, A.;

Study of the secondary electron emission of insulators by a Monte-Carlo simulation method

1993 / IEEE / 0-7803-0966-9
By: Ganachaud, J.P.; Mokrani, A.;

The Cassini mission Ka-band TWT

1994 / IEEE / 0-7803-2111-1
By: Harvey, W.L.; Zachar, Z.A.; Weeder, C.E.; Force, D.A.; Curren, A.N.; Long, K.J.; Palmer, R.W.; Dayton, J.A., Jr.;

Surface breakdown phenomena in alumina rf windows

1995 / IEEE
By: Saito, Y.;

Cathode photoelectron emission during a gas discharge in N/sub 2/ and dry air

1994 / IEEE / 0-7803-1942-7
By: Megens, M.G.M.; Kennedy, J.T.; Wetzer, J.M.;

Spatial and temporal distribution of potential in the pseudospark switch

1995 / IEEE
By: Puchkarev, V.F.; Gundersen, M.A.;

Comparison of FDTD particle pushing and direct differencing of Boltzmann's equation for SGEMP problems

1995 / IEEE
By: Holland, R.;

Test beam results of a low-pressure micro-strip gas chamber with a secondary-electron emitter

1995 / IEEE
By: Kwan, S.; Salomon, M.; Sbarra, C.; Zimmerman, J.; Anderson, D.F.;

A two-dimensional multispecies fluid model of the plasma in an AC plasma display panel

1995 / IEEE
By: McGrath, R.T.; Veerasingam, R.; Campbell, R.B.;

The secondary electron emission simulation of insulators: relation with some material physical constants

1995 / IEEE / 0-7803-2931-7
By: Renoud, R.; Vicario, E.; Rosenberg, N.;

Space charge influence generated by electronic beam on insulator secondary emission

1995 / IEEE / 0-7803-2931-7
By: Le Berre, P.;

The electric image effects at dielectric surfaces

1996 / IEEE
By: Cazaux, J.;

A fast electron beam lithography simulator based on the Boltzmann transport equation

1996 / IEEE
By: Glezos, N.; Raptis, I.;

Experimental studies on cold cathode magnetron gun

1995 / IEEE / 0-7803-2934-1
By: Zakutin, V.V.; Dovbnya, A.N.; Cherenshchikov, S.A.; Romasko, V.P.; Opanasenko, A.N.; Zhiglo, V.F.;

Analysis of multipacting in coaxial lines

1995 / IEEE / 0-7803-2934-1
By: Proch, D.; Yla-Oijala, P.; Somersalo, E.;

Temporal evolution of multipactor discharge

1995 / IEEE / 0-7803-2934-1
By: Gilgenbach, R.M.; Lau, Y.Y.; Kishek, R.;

Reduction of multipactor in RF ceramic windows using a simple titanium-vapor deposition system

1995 / IEEE / 0-7803-2934-1
By: Primdahl, K.; Maj, J.; Kustom, R.;

Measurement of multipacting currents of metal surfaces in RF fields

1995 / IEEE / 0-7803-2934-1
By: Einfeld, D.; Proch, D.; Steinhauser, N.; Onken, R.;

Real-time secondary electron emission detector for high-rate X-ray crystallography

1996 / IEEE
By: Frumkin, I.; Breskin, A.; Chechik, R.; Kocsis, M.; Gabriel, A.;

Categorizing light output degradation failures in LEDs using the relationship between defect revealing mechanisms responsible for electroluminescence (EL), cathodoluminescence (CL), EBIC, and reverse bias photoemission (RP)

1995 / IEEE / 0-7803-2031-X
By: McElfresh, D.K.; Mann, R.S.;

A multi-megawatt X-band solid state microwave switch

1995 / IEEE / 0-7803-2669-5
By: Ruth, R.D.; Lee, T.G.; Tantawi, S.G.; Zolotorev, M.; Vlieks, A.E.;

Global modeling and PIC simulation of low-temperature plasma discharges

1995 / IEEE / 0-7803-2669-5
By: Lim, Y.Y.; Lee, J.H.; Lee, H.J.; Jae Koo Lee; Wang, M.C.; Lee, S.H.; Chung, T.H.;

An axisymmetric model for an RF plasma in contact with a surface having a nonuniform secondary electron emission coefficient

1996 / IEEE
By: Sides, P.J.; Weilu Xu;

Simulations of a triode system with an internal grid

1995 / IEEE / 0-7803-2669-5
By: Vahedi, V.; DiPeso, G.; Bardsley, J.N.;

New types of negative ion sources

1995 / IEEE / 0-7803-2669-5
By: Lapshin, V.I.; Borisko, V.N.;

High current density spotless vacuum arc as a glow discharge

1996 / IEEE / 0-7803-2906-6
By: Puchkarev, V.F.; Boehkarev, M.B.;

Flashover on a dielectric surface irradiated by EM wave

1996 / IEEE / 0-7803-2906-6
By: Galstjan, E.;

Influence of EM-field inhomogeneity on the initial stage of MW electron avalanche on a dielectric surface in vacuum

1996 / IEEE / 0-7803-2906-6
By: Galstjan, E.;

Verification of role of prebreakdown phenomena in the development of flashover in vacuum

1996 / IEEE / 0-7803-2906-6
By: Ziomek, W.; Moscicka-Grzesiak, H.;

Surface charging of insulators in vacuum-comparison of measured and calculated data

1996 / IEEE / 0-7803-2906-6
By: Yamamoto, O.; Lei, J.H.; Chalmers, I.D.;

Numerical design of high voltage insulator structure considering SEEA charge accumulation in vacuum

1996 / IEEE / 0-7803-2906-6
By: Konishi, T.; Tanabe, Y.; Matsuura, H.; Takuma, T.; Hara, T.; Yamamoto, O.;

Concepts for secondary electron emission from irradiated insulators

1996 / IEEE / 0-7803-2906-6
By: Frederickson, A.R.;

Intense ion beam on the quasibrillouin orbit in the magnetic field

1996 / IEEE / 0-7803-2906-6
By: Protsenko, I.; Litovko, I.; Goncharov, A.;

Analysis of potential ion-electron emission for different conditions

1996 / IEEE / 0-7803-2906-6
By: Polistchook, V.P.;

Secondary electron emission influence on electrical firmnes of low pressure discharge space

1996 / IEEE / 0-7803-2906-6
By: Vereschagin, N.; Sudakov, M.;

End-to-end electron beam modeling in O-type devices

1996 / IEEE / 0-7803-3322-5
By: Dionne, N.J.;

Numerical model of hydrogen radiofrequency discharges: comparisons with experiments

1996 / IEEE / 0-7803-3322-5
By: Fadlallah, M.; Belenguer, P.; Leroy, O.;

Understanding the conductivity in ion propulsion devices

1996 / IEEE / 0-7803-3322-5
By: Boeuf, J.P.; Garrigues, L.; Pitchford, L.C.;

Continued analysis of ion current collection in the plasma wake during the charging hazards and wake studies (CHAWS) experiment

1996 / IEEE / 0-7803-3322-5
By: Giffin, G.B.; Shaw, G.B.; Hastings, D.;

Saturation mechanisms for multipactors

1996 / IEEE / 0-7803-3322-5
By: Chernin, D.; Riyopoulos, S.;

Composite and diamond cold cathode materials

1996 / IEEE / 0-7803-3322-5
By: Worthington, M.S.; Doyle, E.; Ramacher, K.; Wheeland, C.L.;

Effect of random secondary delay times and emission velocities in electron multipactors

1997 / IEEE
By: Chernin, D.; Riyopoulos, S.; Dialetis, D.;

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Topic: Secondary Electron Emission

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