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Topic: Scanning Squid Microscopy
Results
1999 / IEEE
By: Bohr, J.; Snigirev, O.V.; Tishin, A.M.; Chupakhin, S.A.; Muck, M.; Gudoshnikov, S.A.; Dechert, J.; Kalabukhov, A.S.; Heiden, C.;
By: Bohr, J.; Snigirev, O.V.; Tishin, A.M.; Chupakhin, S.A.; Muck, M.; Gudoshnikov, S.A.; Dechert, J.; Kalabukhov, A.S.; Heiden, C.;
2000 / IEEE / 0-7803-5860-0
By: Christen, H.M.; Frazier, B.M.; Knauss, L.A.; Skinner, K.L.; McDaniel, E.B.; Cheney, M.E.; Vanderlinde, W.E.;
By: Christen, H.M.; Frazier, B.M.; Knauss, L.A.; Skinner, K.L.; McDaniel, E.B.; Cheney, M.E.; Vanderlinde, W.E.;
2001 / IEEE
By: Chinone, K.; Ikeda, K.; Nagata, A.; Nakayama, S.; Koyanagi, M.; Odawara, A.; Morooka, T.; Tanaka, K.; Mawatari, Y.;
By: Chinone, K.; Ikeda, K.; Nagata, A.; Nakayama, S.; Koyanagi, M.; Odawara, A.; Morooka, T.; Tanaka, K.; Mawatari, Y.;
2001 / IEEE
By: Clatterbuck, D.M.; Morris, J.W., Jr.; Clarke, J.; Hsiao-Mei Cho; Heinig, N.F.; Shaw, T.J.; Tae-Kyu Lee;
By: Clatterbuck, D.M.; Morris, J.W., Jr.; Clarke, J.; Hsiao-Mei Cho; Heinig, N.F.; Shaw, T.J.; Tae-Kyu Lee;
2001 / IEEE / 0-7803-6675-1
By: Mai, Z.H.; Fleet, E.F.; Knauss, L.A.; Soh, C.E.; Chin, J.M.; Palaniappan, M.;
By: Mai, Z.H.; Fleet, E.F.; Knauss, L.A.; Soh, C.E.; Chin, J.M.; Palaniappan, M.;
2003 / IEEE / 0-7803-8139-4
By: Takeuchi, I.; Murakami, M.; Simpers, J.H.; Lin, C.-L.; Gao, C.; Aronova, M.A.; Chang, K.-S.;
By: Takeuchi, I.; Murakami, M.; Simpers, J.H.; Lin, C.-L.; Gao, C.; Aronova, M.A.; Chang, K.-S.;
2004 / IEEE / 0-7803-8315-X
By: Talanova, E.; Orozco, A.; Gaudestad, J.; Sullivan, D.J.D.; Knauss, L.A.; Tan, K.V.; Hsiung, S.; Komrowski, A.J.;
By: Talanova, E.; Orozco, A.; Gaudestad, J.; Sullivan, D.J.D.; Knauss, L.A.; Tan, K.V.; Hsiung, S.; Komrowski, A.J.;
2007 / IEEE
By: Koyanagi, S.; Hirayama, T.; Shoyama, T.; Inoue, M.; Kiss, T.; Shiohara, Y.; Mitsui, D.; Kato, T.; Yamada, Y.; Ibi, A.; Imamura, K.; Nakamura, T.;
By: Koyanagi, S.; Hirayama, T.; Shoyama, T.; Inoue, M.; Kiss, T.; Shiohara, Y.; Mitsui, D.; Kato, T.; Yamada, Y.; Ibi, A.; Imamura, K.; Nakamura, T.;
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