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Topic: Refrigerators
Results
2010 / IEEE / 978-1-4244-5261-3
By: Yeoh, L.A.; Srinivasan, A.; Hamilton, A.R.; Micolich, A.P.; Klochan, O.; Martin, T.P.;
By: Yeoh, L.A.; Srinivasan, A.; Hamilton, A.R.; Micolich, A.P.; Klochan, O.; Martin, T.P.;
2011 / IEEE / 978-1-4577-0061-3
By: Jin Hur; Byoung-Kuk Lee; Gyu-Yeong Choe; Jong-Soo Kim; Joon-Young Jeon; Hyun-Cheol Jin;
By: Jin Hur; Byoung-Kuk Lee; Gyu-Yeong Choe; Jong-Soo Kim; Joon-Young Jeon; Hyun-Cheol Jin;
2011 / IEEE / 978-1-4577-1002-5
By: Aoki, A.R.; Gama, P.H.R.P.; de Moraes, C.H.V.; Zamboni, L.; da Silva, L.E.B.; Lambert-Torres, G.; Riella, R.J.;
By: Aoki, A.R.; Gama, P.H.R.P.; de Moraes, C.H.V.; Zamboni, L.; da Silva, L.E.B.; Lambert-Torres, G.; Riella, R.J.;
2011 / IEEE / 978-1-4577-0668-4
By: Rasmussen, D.A.; McCarthy, K.J.; Harris, J.H.; Fehling, D.T.; Caughman, J.B.O.; Baylor, L.R.; McGill, J.M.; Foust, C.R.; Combs, S.K.; Unamuno, R.; Olivares, J.; Mirones, E.; Meitner, S.J.; Medrano, M.; Hidalgo, C.; Garcia, R.; Chamorro, M.;
By: Rasmussen, D.A.; McCarthy, K.J.; Harris, J.H.; Fehling, D.T.; Caughman, J.B.O.; Baylor, L.R.; McGill, J.M.; Foust, C.R.; Combs, S.K.; Unamuno, R.; Olivares, J.; Mirones, E.; Meitner, S.J.; Medrano, M.; Hidalgo, C.; Garcia, R.; Chamorro, M.;
2011 / IEEE / 978-1-61284-868-6
By: Pangercic, D.; Mosenlechner, L.; Kresse, I.; Maldonado, A.; Ruhr, T.; Klank, U.; Beetz, M.; Tenorth, M.;
By: Pangercic, D.; Mosenlechner, L.; Kresse, I.; Maldonado, A.; Ruhr, T.; Klank, U.; Beetz, M.; Tenorth, M.;
2011 / IEEE / 978-1-4577-1421-4
By: Garcia-Valle, R.; Douglass, P.J.; Togeby, M.; Ostergaard, J.; Nyeng, P.;
By: Garcia-Valle, R.; Douglass, P.J.; Togeby, M.; Ostergaard, J.; Nyeng, P.;
2012 / IEEE / 978-1-4673-0809-0
By: Jongwon Lee; Sunghoon Yim; Kyungpyo Hong; In Lee; Gabjong Han; Hojin Lee; YoungJin Park; Sunghwan Shin; Wan Kyun Chung; Seungmoon Choi; Dae Whan Kim; Dae Ho Ryoo; Byeong Ki Kang;
By: Jongwon Lee; Sunghoon Yim; Kyungpyo Hong; In Lee; Gabjong Han; Hojin Lee; YoungJin Park; Sunghwan Shin; Wan Kyun Chung; Seungmoon Choi; Dae Whan Kim; Dae Ho Ryoo; Byeong Ki Kang;
2012 / IEEE / 978-1-4673-0833-5
By: Van Hertem, D.; Van Ham, G.; Vande Meerssche, B.P.; Deconinck, G.;
By: Van Hertem, D.; Van Ham, G.; Vande Meerssche, B.P.; Deconinck, G.;
2012 / IEEE / 978-1-4673-1043-7
By: Hatwar, Rajeev; Ambad, Shrikant; Phatak, Girish; Joseph, Shany; Joshi, Pralhad; Atrey, M. D.; Gandhi, P.S.; Singh, T; Kumbhalkar, M D;
By: Hatwar, Rajeev; Ambad, Shrikant; Phatak, Girish; Joseph, Shany; Joshi, Pralhad; Atrey, M. D.; Gandhi, P.S.; Singh, T; Kumbhalkar, M D;
2015 / IEEE
By: Park, J.; Jeong, S.; Lee, C.; Lee, J.; Lim, J.H.; Jung, S.Y.; Yang, H.S.; Hwang, S.D.;
By: Park, J.; Jeong, S.; Lee, C.; Lee, J.; Lim, J.H.; Jung, S.Y.; Yang, H.S.; Hwang, S.D.;
2014 / IEEE
By: Wang, Qingtian; Hua, Jiaojiao; Cui, Jianguo; Jiang, Liying; Liu, Haigang; Cui, Xiao;
By: Wang, Qingtian; Hua, Jiaojiao; Cui, Jianguo; Jiang, Liying; Liu, Haigang; Cui, Xiao;
2014 / IEEE
By: Lacquaniti, V.; Serazio, D.; Roncaglione, L.; Rocci, R.; Fretto, M.; Monticone, E.; Trinchera, B.; Sosso, A.;
By: Lacquaniti, V.; Serazio, D.; Roncaglione, L.; Rocci, R.; Fretto, M.; Monticone, E.; Trinchera, B.; Sosso, A.;
2014 / IEEE
By: Desmet, Jan; Debruyne, Colin; Van Steenberge, Cis; Van Ryckeghem, Jurgen; Descheemaeker, Jan;
By: Desmet, Jan; Debruyne, Colin; Van Steenberge, Cis; Van Ryckeghem, Jurgen; Descheemaeker, Jan;
2014 / IEEE
By: Schwefel, Hans-Peter; Olsen, Rasmus L.; le Fevre Kristensen, Thomas; Madsen, Jacob Theilgaard; Totu, Luminita C.;
By: Schwefel, Hans-Peter; Olsen, Rasmus L.; le Fevre Kristensen, Thomas; Madsen, Jacob Theilgaard; Totu, Luminita C.;
2014 / IEEE
By: Ramgolam, Yatindra Kumar; Soyjaudah, Krishnaraj Madhavjee Sunjiv; Murdan, Anshu Prakash; Oree, Vishwamitra; Veerapen, Shanmuga;
By: Ramgolam, Yatindra Kumar; Soyjaudah, Krishnaraj Madhavjee Sunjiv; Murdan, Anshu Prakash; Oree, Vishwamitra; Veerapen, Shanmuga;
2014 / IEEE
By: Kitaide, Yujiro; Saito, Mitsunori; Iwasaki, Yoshikatsu; Maruyama, Naoki; Takiguchi, Kouji; Tsuchiya, Toshiaki; Yamagami, Yuuhei; Ishida, Shin; Hirota, Masafumi;
By: Kitaide, Yujiro; Saito, Mitsunori; Iwasaki, Yoshikatsu; Maruyama, Naoki; Takiguchi, Kouji; Tsuchiya, Toshiaki; Yamagami, Yuuhei; Ishida, Shin; Hirota, Masafumi;
2014 / IEEE
By: Panchang, Ashutosh; Green, Kelvin; LaViers, Amy; Bailey, Reid; Bates, Ryan; D'Agostini, Evan; Meng, Hanke;
By: Panchang, Ashutosh; Green, Kelvin; LaViers, Amy; Bailey, Reid; Bates, Ryan; D'Agostini, Evan; Meng, Hanke;
2013 / IEEE
By: Gaska, Ignas; Britz, Steven; Gaska, Remis; Shatalov, Max; Bilenko, Yuri; Shturm, Igor;
By: Gaska, Ignas; Britz, Steven; Gaska, Remis; Shatalov, Max; Bilenko, Yuri; Shturm, Igor;
2013 / IEEE
By: Dimuro, Gracaliz; Santos, Iverton; Botelho, Silvia S. da C.; Rosa, Vagner; Mota, Fernanda P.;
By: Dimuro, Gracaliz; Santos, Iverton; Botelho, Silvia S. da C.; Rosa, Vagner; Mota, Fernanda P.;