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Topic: Reduced Instruction Set Computing
Results
2011 / IEEE / 978-1-4244-8115-6
By: Jianglei Lu; Guanglong Wang; Wenbin Huang; Jianhui Chen; Fengqi Gao;
By: Jianglei Lu; Guanglong Wang; Wenbin Huang; Jianhui Chen; Fengqi Gao;
2011 / IEEE / 978-1-4503-0636-2
By: Sangiovanni-Vincentelli, A.; Kuehlmann, A.; Welp, T.; Puggelli, A.;
By: Sangiovanni-Vincentelli, A.; Kuehlmann, A.; Welp, T.; Puggelli, A.;
2011 / IEEE / 978-1-4577-0399-7
By: Haibin Wu; Ying Wang; Yang Wang; Xiaoyang Yu; Deyun Chen; Shuchun Yu;
By: Haibin Wu; Ying Wang; Yang Wang; Xiaoyang Yu; Deyun Chen; Shuchun Yu;
2011 / IEEE / 978-1-61284-857-0
By: Aunet, S.; Wisland, D.T.; Tuan Vu Cao; Moradi, F.; Mahmoodi, H.;
By: Aunet, S.; Wisland, D.T.; Tuan Vu Cao; Moradi, F.; Mahmoodi, H.;
2011 / IEEE / 978-1-4577-0434-5
By: Garcia, P.; Tavares, A.; Ekpanyapong, M.; Cabral, J.; Cardoso, P.; Salgado, F.;
By: Garcia, P.; Tavares, A.; Ekpanyapong, M.; Cabral, J.; Cardoso, P.; Salgado, F.;
2011 / IEEE / 978-1-4577-1589-1
By: Matteucci, P.B.; Suaning, G.J.; Lovell, N.H.; Chen, S.C.; Byrnes-Preston, P.;
By: Matteucci, P.B.; Suaning, G.J.; Lovell, N.H.; Chen, S.C.; Byrnes-Preston, P.;
2011 / IEEE / 978-1-61284-172-4
By: Milea, L.; Grosu, V.; Voiculescu, V.-G.; Franti, E.; Oltu, O.; Schiopu, P.;
By: Milea, L.; Grosu, V.; Voiculescu, V.-G.; Franti, E.; Oltu, O.; Schiopu, P.;
2011 / IEEE / 978-1-4577-1498-6
By: Lukac, Z.; Scepanovic, N.; Lukic, N.; Jovanovic, P.; Ocovaj, S.;
By: Lukac, Z.; Scepanovic, N.; Lukic, N.; Jovanovic, P.; Ocovaj, S.;
2011 / IEEE / 978-1-4577-0255-6
By: Matutina, K.M.U.; Difuntorum, J.K.L.; Madamba, J.A.R.; Alvarez, A.B.; Tong, A.J.M.Z.;
By: Matutina, K.M.U.; Difuntorum, J.K.L.; Madamba, J.A.R.; Alvarez, A.B.; Tong, A.J.M.Z.;
2011 / IEEE / 978-1-4577-1785-7
By: Shu-Yu Hsu; Chen-Yi Lee; Chen, R.; Ten-Fang Yang; Jui-Yuan Yu; Po-Yao Chang; Yao-Lin Chen;
By: Shu-Yu Hsu; Chen-Yi Lee; Chen, R.; Ten-Fang Yang; Jui-Yuan Yu; Po-Yao Chang; Yao-Lin Chen;
2012 / IEEE / 978-1-4577-2120-5
By: Hou Ligang; Wu Wuchen; Yuan Ying; Liu Qi; Zhou Zhonghua; Geng Shuqin;
By: Hou Ligang; Wu Wuchen; Yuan Ying; Liu Qi; Zhou Zhonghua; Geng Shuqin;
2012 / IEEE / 978-1-4673-0772-7
By: Yuan-Hua Chu; Ting-Yu Shyu; Yu-Jung Tsai; Yu-Ting Kuo; Tay-Jyi Lin;
By: Yuan-Hua Chu; Ting-Yu Shyu; Yu-Jung Tsai; Yu-Ting Kuo; Tay-Jyi Lin;
2011 / IEEE / 978-1-61284-193-9
By: Yuteng Pan; Dongge Wang; Zhang Zhang; Sobelman, G.E.; Xiaofang Zhou; Dan Wang;
By: Yuteng Pan; Dongge Wang; Zhang Zhang; Sobelman, G.E.; Xiaofang Zhou; Dan Wang;
2012 / IEEE / 978-1-4673-1686-6
By: Rahmani, M.; Tahmasivand, A.; Aghaei, E.; Atani, R.E.; Darav, N.K.; Moazam, M.;
By: Rahmani, M.; Tahmasivand, A.; Aghaei, E.; Atani, R.E.; Darav, N.K.; Moazam, M.;
2012 / IEEE / 978-1-4673-0697-3
By: Ballan, O.; Reorda, M.S.; Sanchez, E.; Lagos-Benites, J.; Bernardi, P.; de Carvalho, M.; Ciganda, L.; Grosso, M.;
By: Ballan, O.; Reorda, M.S.; Sanchez, E.; Lagos-Benites, J.; Bernardi, P.; de Carvalho, M.; Ciganda, L.; Grosso, M.;
Diagnosis and correction of multiple design errors using critical path tracing and mutation analysis
2012 / IEEE / 978-1-4673-2355-0By: Jenihhin, Maksim; Raik, Jaan; Repinski, Urmas; Hantson, Hanno; Ubar, Raimund;
2012 / IEEE / 978-1-4673-2036-8
By: Salim, Ahmad Jamal; Soo, Yewguan; Samsudin, Nur Raihana; Salim, Sani Irwan Md;
By: Salim, Ahmad Jamal; Soo, Yewguan; Samsudin, Nur Raihana; Salim, Sani Irwan Md;
2015 / IEEE
By: Rolt, J.D.; Sanchez, E.; Ferreira, R.R.; Reorda, M.S.; Carro, L.; Moreira, A.F.; Nazar, G.L.;
By: Rolt, J.D.; Sanchez, E.; Ferreira, R.R.; Reorda, M.S.; Carro, L.; Moreira, A.F.; Nazar, G.L.;