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Topic: Read Only Memory
Results
2012 / IEEE
By: Roizin, Y.; Lisiansky, M.; Corso, D.; Libertino, S.; Palumbo, F.; Finocchiaro, P.; Lombardo, S.; Pace, C.; Principato, F.;
By: Roizin, Y.; Lisiansky, M.; Corso, D.; Libertino, S.; Palumbo, F.; Finocchiaro, P.; Lombardo, S.; Pace, C.; Principato, F.;
2004 / IEEE / 978-5-87911-088-3
By: Ishibana, K.; Nakajima, R.; Yamamoto, K.; Kamada, K.; Ando, R.; Sergeeva, A.S.; Ginzburga, N.S.; Rozentala, R.M.; Zotovaa, I.V.;
By: Ishibana, K.; Nakajima, R.; Yamamoto, K.; Kamada, K.; Ando, R.; Sergeeva, A.S.; Ginzburga, N.S.; Rozentala, R.M.; Zotovaa, I.V.;
2011 / IEEE / 978-1-61284-385-8
By: Schwager, M.; Smith, R.N.; Sukhatme, G.S.; Rus, D.; Smith, S.L.;
By: Schwager, M.; Smith, R.N.; Sukhatme, G.S.; Rus, D.; Smith, S.L.;
2011 / IEEE / 978-1-61284-943-0
By: Di Nunzio, L.; D'Alessio, M.; Cardarilli, G.C.; Re, M.; Murgia, D.; Fazzolari, R.;
By: Di Nunzio, L.; D'Alessio, M.; Cardarilli, G.C.; Re, M.; Murgia, D.; Fazzolari, R.;
2011 / IEEE / 978-1-4244-9949-6
By: Yang, S.; Ying Chen; Deshmukh, P.; Yandong Gao; Ping Liu; Wang, J.; Yeap, G.; Sani, M.; Han, M.; Sei Seung Yoon; Garg, M.; Abu-Rahma, M.; Terzioglu, E.; Lixin Ge; Wing Sy;
By: Yang, S.; Ying Chen; Deshmukh, P.; Yandong Gao; Ping Liu; Wang, J.; Yeap, G.; Sani, M.; Han, M.; Sei Seung Yoon; Garg, M.; Abu-Rahma, M.; Terzioglu, E.; Lixin Ge; Wing Sy;
2011 / IEEE / 978-1-4577-0223-5
By: Okamoto, K.; Ishikawa, J.; Nii, K.; Umemoto, Y.; Yanagisawa, K.; Mori, K.;
By: Okamoto, K.; Ishikawa, J.; Nii, K.; Umemoto, Y.; Yanagisawa, K.; Mori, K.;
2011 / IEEE / 978-1-4577-1589-1
By: Xin Guo; Chung Yong Yang; Liang Wang; Tao Xu; Yupeng Ren; Li-Qun Zhang; Harvey, R.L.;
By: Xin Guo; Chung Yong Yang; Liang Wang; Tao Xu; Yupeng Ren; Li-Qun Zhang; Harvey, R.L.;
2011 / IEEE / 978-1-4577-1589-1
By: Shorter, Kenneth A.; Hsiao-Wecksler, Elizabeth T.; Kogler, Geza F.; Morris, Emily A.; Li, Yifan;
By: Shorter, Kenneth A.; Hsiao-Wecksler, Elizabeth T.; Kogler, Geza F.; Morris, Emily A.; Li, Yifan;
2011 / IEEE / 978-1-4577-1589-1
By: Squeri, Valentina; Morasso, Pietro; Taverna, Laura; Masia, Lorenzo;
By: Squeri, Valentina; Morasso, Pietro; Taverna, Laura; Masia, Lorenzo;
2011 / IEEE / 978-1-4577-1589-1
By: Dae-Sung Park; Kyung Kim; Won-Kyung Song; Jongbae Kim; Seung-Nam Yang; Jeongsu Lee; Byung-Woo Ko;
By: Dae-Sung Park; Kyung Kim; Won-Kyung Song; Jongbae Kim; Seung-Nam Yang; Jeongsu Lee; Byung-Woo Ko;
2011 / IEEE / 978-1-4577-1589-1
By: Kawamura, K.; Ando, T.; Fujie, M.G.; Fujimoto, M.; Koike, T.; Fujitani, J.;
By: Kawamura, K.; Ando, T.; Fujie, M.G.; Fujimoto, M.; Koike, T.; Fujitani, J.;