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Topic: Psychology
Results
1985 / IEEE
By: Winkler, R.L.; Huber, G.; Cohen, M.D.; Zadeh, L.; von Winterfeldt, D.; Keeney, R.L.; Whinston, A.B.; Sen, S.; Sage, A.P.; Lopes, L.L.; Levis, A.H.;
By: Winkler, R.L.; Huber, G.; Cohen, M.D.; Zadeh, L.; von Winterfeldt, D.; Keeney, R.L.; Whinston, A.B.; Sen, S.; Sage, A.P.; Lopes, L.L.; Levis, A.H.;
2011 / IEEE
By: Jiebo Luo; Jia Li; Wang, J.Z.; Quang-Tuan Luong; Fedorovskaya, E.; Datta, R.; Joshi, D.;
By: Jiebo Luo; Jia Li; Wang, J.Z.; Quang-Tuan Luong; Fedorovskaya, E.; Datta, R.; Joshi, D.;
2012 / IEEE
By: Russell, J.; Hien Nguyen; Santos, E.; Clark, B.; Fei Yu; Olson, A.; Wilkinson, J.T.; Deqing Li; Keum Joo Kim;
By: Russell, J.; Hien Nguyen; Santos, E.; Clark, B.; Fei Yu; Olson, A.; Wilkinson, J.T.; Deqing Li; Keum Joo Kim;
Multitasking and the Illusion of Safety: The Potential Impact in Certain Electrical Hazard Scenarios
2012 / IEEEBy: Floyd, A.H.L.;
2012 / IEEE
By: Lallee, S.; Pattacini, U.; Warneken, F.; Pipe, T.; Warnier, M.; Alami, R.; Guitton, J.; Metta, G.; Dominey, P.F.; Sisbot, E.A.; Steinwender, J.; Hamann, K.; Skachek, S.; Natale, L.; Melhuish, C.; Lenz, A.; Lemaignan, S.;
By: Lallee, S.; Pattacini, U.; Warneken, F.; Pipe, T.; Warnier, M.; Alami, R.; Guitton, J.; Metta, G.; Dominey, P.F.; Sisbot, E.A.; Steinwender, J.; Hamann, K.; Skachek, S.; Natale, L.; Melhuish, C.; Lenz, A.; Lemaignan, S.;
2012 / IEEE
By: Galloway, T.; Tan, V.; Vila, B.; Stevens, R.; Johnson, R.R.; Behneman, A.; Berka, C.; Raphael, G.;
By: Galloway, T.; Tan, V.; Vila, B.; Stevens, R.; Johnson, R.R.; Behneman, A.; Berka, C.; Raphael, G.;
2012 / IEEE
By: Chetouani, M.; Delaherche, E.; Cohen, D.; Viaux, S.; Saint-Georges, C.; Mahdhaoui, A.;
By: Chetouani, M.; Delaherche, E.; Cohen, D.; Viaux, S.; Saint-Georges, C.; Mahdhaoui, A.;
2012 / IEEE
By: Kalimeri, Kyriaki; Subramanian, Ramanathan; Lepri, Bruno; Sebe, Nicu; Pianesi, Fabio; Staiano, Jacopo;
By: Kalimeri, Kyriaki; Subramanian, Ramanathan; Lepri, Bruno; Sebe, Nicu; Pianesi, Fabio; Staiano, Jacopo;
2010 / IEEE / 978-1-4244-9168-1
By: Jia-Ling Lin; Mezghanni, M.; Vahabzadeh, M.; Preston, K.L.; Epstein, D.H.;
By: Jia-Ling Lin; Mezghanni, M.; Vahabzadeh, M.; Preston, K.L.; Epstein, D.H.;
2011 / IEEE / 978-1-4577-0274-7
By: Loukas, C.; Lahanas, V.; Georgiou, E.; Dimitroulis, D.; Nikiteas, N.;
By: Loukas, C.; Lahanas, V.; Georgiou, E.; Dimitroulis, D.; Nikiteas, N.;
2011 / IEEE / 978-1-61284-385-8
By: Kamide, H.; Arai, T.; Ohara, K.; Takubo, T.; Mae, Y.; Yasumoto, M.;
By: Kamide, H.; Arai, T.; Ohara, K.; Takubo, T.; Mae, Y.; Yasumoto, M.;