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Topic: Protective Relaying
Results
2012 / IEEE
By: Taylor, R.R.; Marinescu, C.; Steinhauser, F.; Ingram, D.M.E.; Campbell, D.A.; Schaub, P.;
By: Taylor, R.R.; Marinescu, C.; Steinhauser, F.; Ingram, D.M.E.; Campbell, D.A.; Schaub, P.;
2012 / IEEE
By: Davarpanah, M.; Sanaye-Pasand, M.; Badrkhani Ajaei, F.; Iravani, R.; Rezaei-Zare, A.;
By: Davarpanah, M.; Sanaye-Pasand, M.; Badrkhani Ajaei, F.; Iravani, R.; Rezaei-Zare, A.;
2011 / IEEE / 978-1-61284-088-8
By: Fu Zhouxing; Chen Haidong; Chen Xuejie; Sun Shangbin; Yu Ran; Lihe; Yun Baoji;
By: Fu Zhouxing; Chen Haidong; Chen Xuejie; Sun Shangbin; Yu Ran; Lihe; Yun Baoji;
2011 / IEEE / 978-1-4244-8418-8
By: Chilard, O.; Caire, R.; Raison, B.; Jecu, C.; Alibert, P.; Deschamps, P.; Grenard, S.;
By: Chilard, O.; Caire, R.; Raison, B.; Jecu, C.; Alibert, P.; Deschamps, P.; Grenard, S.;
2011 / IEEE / 978-1-4577-1002-5
By: Sung-Jun Park; Jin-Hwan Kim; Sang-Tae Kim; Tae-Wan Kim; Myeon-Song Choi; Seung-Jae Lee;
By: Sung-Jun Park; Jin-Hwan Kim; Sang-Tae Kim; Tae-Wan Kim; Myeon-Song Choi; Seung-Jae Lee;
2011 / IEEE / 978-1-4244-7853-8
By: Yu Wei Sun; Ji Bin Cui; Chang Bin Hu; Mei Rong Zi; Hui Hong; Zhi Quan Xiong; Jian Zhong Wang; Ying Xin; Wei Zhi Gong;
By: Yu Wei Sun; Ji Bin Cui; Chang Bin Hu; Mei Rong Zi; Hui Hong; Zhi Quan Xiong; Jian Zhong Wang; Ying Xin; Wei Zhi Gong;
Analysis on using transmission lines traveling wave fault location based on fault information system
2011 / IEEE / 978-1-4244-9621-1By: Tao Ye; Zheng Xinguang;
2011 / IEEE / 978-1-4244-9621-1
By: Utsumi, T.; Beaumont, P.; Kawano, F.; Amoh, H.; Takani, H.; Nakatsuka, T.;
By: Utsumi, T.; Beaumont, P.; Kawano, F.; Amoh, H.; Takani, H.; Nakatsuka, T.;
Observation on bus voltage angles through power flow computation for 2010 summer peak of South Korea
2011 / IEEE / 978-1-4244-9621-1By: Lee SangJoong; Lee Woon-Hee;
2011 / IEEE / 978-1-4244-9621-1
By: Hamour, I.; Mutnuri, S.; Korovin, O.; Zhiying Zhang; Lebo Jiang; Voloh, I.;
By: Hamour, I.; Mutnuri, S.; Korovin, O.; Zhiying Zhang; Lebo Jiang; Voloh, I.;
2011 / IEEE / 978-1-4244-9621-1
By: Huang WeiPing; Lin ChuanWei; Zhang JiFen; Cai XiaoLing; Wang LiWei;
By: Huang WeiPing; Lin ChuanWei; Zhang JiFen; Cai XiaoLing; Wang LiWei;
2011 / IEEE / 978-1-4244-9621-1
By: Chen XiaoGang; Chen ShuiYao; Qiu YuTao; Zhu BingQuan; Pan WuLue;
By: Chen XiaoGang; Chen ShuiYao; Qiu YuTao; Zhu BingQuan; Pan WuLue;
2012 / IEEE / 978-1-4673-0455-9
By: Samantaray, S.R.; Dubey, R.; Ehtesham, M.; Babu, B.C.; Tripathy, A.;
By: Samantaray, S.R.; Dubey, R.; Ehtesham, M.; Babu, B.C.; Tripathy, A.;
2012 / IEEE / 978-1-4577-1829-8
By: Zhang, B.H.; Bo, Z.Q.; Wang, X.L.; Liu, Z.Y.; Hao, Z.G.; Wang, J.; Guo, D.Y.;
By: Zhang, B.H.; Bo, Z.Q.; Wang, X.L.; Liu, Z.Y.; Hao, Z.G.; Wang, J.; Guo, D.Y.;
2012 / IEEE / 978-1-4673-0662-1
By: Shareef, H.; Mohamed, A.; Farhoodnea, M.; Mohammadjafari, M.; Zayandehroodi, H.;
By: Shareef, H.; Mohamed, A.; Farhoodnea, M.; Mohammadjafari, M.; Zayandehroodi, H.;