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Topic: Program Verification
Results
2010 / IEEE / 978-1-60558-719-6
By: Heymans, P.; Classen, A.; Raskin, J.-F.; Legay, A.; Schobbens, P.-Y.;
By: Heymans, P.; Classen, A.; Raskin, J.-F.; Legay, A.; Schobbens, P.-Y.;
2011 / IEEE / 978-1-4503-0445-0
By: Kivett, R.; Li, P.L.; Ko, A.J.; Murphy, B.; Nagappan, N.; Sung-eok Jeon; Zhiyuan Zhan;
By: Kivett, R.; Li, P.L.; Ko, A.J.; Murphy, B.; Nagappan, N.; Sung-eok Jeon; Zhiyuan Zhan;
2011 / IEEE / 978-1-4503-0445-0
By: Androutsopoulos, K.; Zheng Li; Lano, K.; Harman, M.; Gold, N.; Clark, D.; Binkley, D.;
By: Androutsopoulos, K.; Zheng Li; Lano, K.; Harman, M.; Gold, N.; Clark, D.; Binkley, D.;
2011 / IEEE / 978-1-4577-1487-0
By: Zongyan Qiu; Munro, M.; Wei Xiong; Chawdhary, A.; Shengchao Qin; Huibiao Zhu;
By: Zongyan Qiu; Munro, M.; Wei Xiong; Chawdhary, A.; Shengchao Qin; Huibiao Zhu;
2011 / IEEE / 978-1-4577-0018-7
By: de Queiroz, M.H.; Farines, J.; Cregut, X.; Vernadat, F.; Carpes, A.M.M.; da Rocha, V.G.;
By: de Queiroz, M.H.; Farines, J.; Cregut, X.; Vernadat, F.; Carpes, A.M.M.; da Rocha, V.G.;
2011 / IEEE / 978-1-4503-0714-7
By: Insup Lee; Sokolsky, O.; Ayoub, A.; BaekGyu Kim; Jetley, R.; Yi Zhang; Jones, P.;
By: Insup Lee; Sokolsky, O.; Ayoub, A.; BaekGyu Kim; Jetley, R.; Yi Zhang; Jones, P.;
2011 / IEEE / 978-1-4577-1373-6
By: Grau, B.; Grappy, A.; Vilnat, A.; Robba, I.; Ligozat, A.-L.; Falco, M.-H.;
By: Grau, B.; Grappy, A.; Vilnat, A.; Robba, I.; Ligozat, A.-L.; Falco, M.-H.;
2011 / IEEE / 978-1-4503-0714-7
By: Ramesh, S.; Chakraborty, S.; Broy, M.; Pree, W.; Resmerita, S.; Satpathy, M.;
By: Ramesh, S.; Chakraborty, S.; Broy, M.; Pree, W.; Resmerita, S.; Satpathy, M.;
2011 / IEEE / 978-1-4577-1839-7
By: Pesola, J.-P.; Bendas, D.; Parviainen, P.; Eskeli, J.; Tanner, H.;
By: Pesola, J.-P.; Bendas, D.; Parviainen, P.; Eskeli, J.; Tanner, H.;
2011 / IEEE / 978-1-4577-1027-8
By: Zamorano, J.; Asensio, E.; Gutierrez, J.J.; Perez, H.; de la Puente, J.A.;
By: Zamorano, J.; Asensio, E.; Gutierrez, J.J.; Perez, H.; de la Puente, J.A.;
2011 / IEEE / 978-1-4577-1827-4
By: Cox, S.J.; Djidjeli, K.; Hart, E.E.; Johnston, S.J.; O'Brien, N.S.;
By: Cox, S.J.; Djidjeli, K.; Hart, E.E.; Johnston, S.J.; O'Brien, N.S.;