Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Photodetector
Results
2011 / IEEE
By: Chapman, E.; Staples, C.J.; Johnson, E.; Chen, X.J.; Whitney, C.M.; Alberghini, G.; Shah, K.; Christian, J.F.; Glodo, J.; Loef, E.V.; Rines, R.;
By: Chapman, E.; Staples, C.J.; Johnson, E.; Chen, X.J.; Whitney, C.M.; Alberghini, G.; Shah, K.; Christian, J.F.; Glodo, J.; Loef, E.V.; Rines, R.;
2012 / IEEE
By: Byeonghoon Cho; Kyung Sook Jeon; Sang Youn Han; Hyang-Shik Kong; Junho Song; Mi Seon Seo;
By: Byeonghoon Cho; Kyung Sook Jeon; Sang Youn Han; Hyang-Shik Kong; Junho Song; Mi Seon Seo;
2012 / IEEE
By: Andrekson, P.A.; Karlsson, M.; Gustavsson, J.S.; Haglund, A.; Agrell, E.; Karout, J.; Westbergh, P.; Szczerba, K.; Larsson, A.;
By: Andrekson, P.A.; Karlsson, M.; Gustavsson, J.S.; Haglund, A.; Agrell, E.; Karout, J.; Westbergh, P.; Szczerba, K.; Larsson, A.;
2012 / IEEE
By: Ouyang, C.; Wu, K.; Lim, P.H.; Wong, V.; Shum, P.P.; Aditya, S.; Lam, H.Q.; Wong, J.H.; Lee, K.E.K.;
By: Ouyang, C.; Wu, K.; Lim, P.H.; Wong, V.; Shum, P.P.; Aditya, S.; Lam, H.Q.; Wong, J.H.; Lee, K.E.K.;
2012 / IEEE
By: Li Xian Wang; Xiao Qiong Qi; Yu Liu; Liang Xie; Jian Guo Liu; Xu Ming Wu; Jiang Wei Man; Ning Hua Zhu;
By: Li Xian Wang; Xiao Qiong Qi; Yu Liu; Liang Xie; Jian Guo Liu; Xu Ming Wu; Jiang Wei Man; Ning Hua Zhu;
2012 / IEEE
By: Morales-Farah, J.E.; Garcia-Guerra, C.E.; Khotiaintsev, S.; Yam-Ontiveros, L.E.; Perez-Garcia, S.;
By: Morales-Farah, J.E.; Garcia-Guerra, C.E.; Khotiaintsev, S.; Yam-Ontiveros, L.E.; Perez-Garcia, S.;
2011 / IEEE / 978-1-61284-329-2
By: Sung Hee Lee; Eun Ha Choi; Han Sup Uhm; Duk In Choi; Young June Hong;
By: Sung Hee Lee; Eun Ha Choi; Han Sup Uhm; Duk In Choi; Young June Hong;
2011 / IEEE / 978-1-61284-795-5
By: Semyagin, B.R.; Putyato, M.A.; Emelyanov, E.A.; Preobrazhenskii, V.V.; Vasev, A.V.; Feklin, D.; Vasilenko, A.;
By: Semyagin, B.R.; Putyato, M.A.; Emelyanov, E.A.; Preobrazhenskii, V.V.; Vasev, A.V.; Feklin, D.; Vasilenko, A.;
2011 / IEEE / 978-1-4577-1764-2
By: Arvani, F.; Hedayati, H.; Fotowat-Ahmady, A.; Mir-Moghtadaei, V.; Noshad, M.;
By: Arvani, F.; Hedayati, H.; Fotowat-Ahmady, A.; Mir-Moghtadaei, V.; Noshad, M.;
2011 / IEEE / 978-1-4577-0336-2
By: Yen Ling Yu; Fukuhara, M.; Nakagawa, K.; Aihara, T.; Yamaguchi, K.; Fukuda, M.;
By: Yen Ling Yu; Fukuhara, M.; Nakagawa, K.; Aihara, T.; Yamaguchi, K.; Fukuda, M.;
2011 / IEEE / 978-3-927535-28-2
By: Capria, A.; Laghezza, F.; Bogoni, A.; Ghelfi, P.; Berizzi, F.; Cacciamano, A.;
By: Capria, A.; Laghezza, F.; Bogoni, A.; Ghelfi, P.; Berizzi, F.; Cacciamano, A.;
2011 / IEEE / 978-1-4577-0321-8
By: Yingfeng Li; Taijun Liu; Tiefeng Xu; Qiuhua Nie; Huafeng Wen; Xiupu Zhang;
By: Yingfeng Li; Taijun Liu; Tiefeng Xu; Qiuhua Nie; Huafeng Wen; Xiupu Zhang;
2011 / IEEE / 978-1-4244-8939-8
By: Sorel, M.; Velha, P.; De La Rue, R.M.; Jessop, P.E.; Logan, D.F.; Knights, A.P.;
By: Sorel, M.; Velha, P.; De La Rue, R.M.; Jessop, P.E.; Logan, D.F.; Knights, A.P.;
2011 / IEEE / 978-1-4673-0120-6
By: Jarron, P.; Hillemanns, H.; Frisch, B.; Gundacker, S.; Ghezzi, A.; Geraci, F.; Meyer, T.; Auffray, E.; Lecoq, P.; Pizzichemi, M.; Pauwels, K.; Paganoni, M.;
By: Jarron, P.; Hillemanns, H.; Frisch, B.; Gundacker, S.; Ghezzi, A.; Geraci, F.; Meyer, T.; Auffray, E.; Lecoq, P.; Pizzichemi, M.; Pauwels, K.; Paganoni, M.;
2011 / IEEE / 978-1-4577-0167-2
By: Saidi Reddy, P.; Sai Shankar, M.; Sengupta, D.; Kishore, P.; Narayana, K.S.; SaiPrasad, R.L.N.;
By: Saidi Reddy, P.; Sai Shankar, M.; Sengupta, D.; Kishore, P.; Narayana, K.S.; SaiPrasad, R.L.N.;
2011 / IEEE / 978-1-4673-0120-6
By: Davidson, Z.S.; Karp, J.S.; VanBerg, R.; Newcomer, F.M.; Wiener, R.I.;
By: Davidson, Z.S.; Karp, J.S.; VanBerg, R.; Newcomer, F.M.; Wiener, R.I.;
2011 / IEEE / 978-1-4577-0031-6
By: Lee, K.E.K.; Lam, H.Q.; Shum, P.P.; Peng Huei Lim; Aditya, S.; Jia Haur Wong; Wong, V.;
By: Lee, K.E.K.; Lam, H.Q.; Shum, P.P.; Peng Huei Lim; Aditya, S.; Jia Haur Wong; Wong, V.;
2011 / IEEE / 978-0-8194-8961-6
By: Liu, Fengqi; Huang, Wenchao; Li, Tianxin; Li, Zhifeng; Xia, Hui; li, Lu; Wei, Peng; Deng, Honghai; Wang, Shaowei;
By: Liu, Fengqi; Huang, Wenchao; Li, Tianxin; Li, Zhifeng; Xia, Hui; li, Lu; Wei, Peng; Deng, Honghai; Wang, Shaowei;
2012 / IEEE / 978-617-607-138-9
By: Yaremyk, R.; Bilyj, O.; Kushnir, I.; Kotsyumbas, I.; Grechukh, T.; Getman, V.; Ferensovich, Y.;
By: Yaremyk, R.; Bilyj, O.; Kushnir, I.; Kotsyumbas, I.; Grechukh, T.; Getman, V.; Ferensovich, Y.;
2012 / IEEE / 978-1-4673-2185-3
By: Xiaojun Luo; Hao Lin; Yan Ye; Taijun Liu; Tiefeng Xu; Gang Cao; Liang Li;
By: Xiaojun Luo; Hao Lin; Yan Ye; Taijun Liu; Tiefeng Xu; Gang Cao; Liang Li;
2012 / IEEE / 978-1-4673-2025-2
By: Ueamanapong, S.; Srithanachai, I.; Niemchaoren, S.; Nararug, B.;
By: Ueamanapong, S.; Srithanachai, I.; Niemchaoren, S.; Nararug, B.;
2012 / IEEE / 978-953-233-068-7
By: Zivanov, M.B.; Slankamenac, M.P.; Stupar, D.Z.; Dakic, B.; Bajic, J.S.;
By: Zivanov, M.B.; Slankamenac, M.P.; Stupar, D.Z.; Dakic, B.; Bajic, J.S.;
2012 / IEEE / 978-1-4673-0442-9
By: Hale, P.D.; Bieler, M.; Fuser, H.; Harper, M.; Humphreys, D.; Jargon, J.; Wang, J.; Dienstfrey, A.; Williams, D.F.;
By: Hale, P.D.; Bieler, M.; Fuser, H.; Harper, M.; Humphreys, D.; Jargon, J.; Wang, J.; Dienstfrey, A.; Williams, D.F.;
2012 / IEEE
By: Bhattacharyya, A.; Dhar, J.C.; Chinnamuthu, P.; Singh, N.K.; Mondal, A.; Choudhury, S.;
By: Bhattacharyya, A.; Dhar, J.C.; Chinnamuthu, P.; Singh, N.K.; Mondal, A.; Choudhury, S.;
2014 / IEEE
By: Li, L.-J.; Yu, Y.-C.; Ke, J.-J.; Chen, K.-M.; He, J.-H.; Tsai, M.-L.; Lien, D.-H.; Tsai, D.-S.; Su, S.-H.;
By: Li, L.-J.; Yu, Y.-C.; Ke, J.-J.; Chen, K.-M.; He, J.-H.; Tsai, M.-L.; Lien, D.-H.; Tsai, D.-S.; Su, S.-H.;
2013 / IEEE
By: Katayama, H.; Murooka, J.; Kawamura, Y.; Iguchi, Y.; Kanno, S.; Inada, H.; Kimata, M.; Takekawa, T.; Miura, K.;
By: Katayama, H.; Murooka, J.; Kawamura, Y.; Iguchi, Y.; Kanno, S.; Inada, H.; Kimata, M.; Takekawa, T.; Miura, K.;
2014 / IEEE
By: Neo, Yoichiro; Masuzawa, Tomoaki; Yamada, Takatoshi; Okano, Ken; Saito, Ichitaro; Mimura, Hidenori; Tsukimura, Reina; Ohata, Akinori; Ebisudani, Taishi; Onishi, Masanori; Chua, Daniel H.C.; Ochiai, Jun;
By: Neo, Yoichiro; Masuzawa, Tomoaki; Yamada, Takatoshi; Okano, Ken; Saito, Ichitaro; Mimura, Hidenori; Tsukimura, Reina; Ohata, Akinori; Ebisudani, Taishi; Onishi, Masanori; Chua, Daniel H.C.; Ochiai, Jun;
2014 / IEEE
By: Tian, He; Yuan, Li; Zhang, Zhao-Hua; Ren, Tian-Ling; Yang, Yi; Zhang, Yan-Hang; Wu, Can;
By: Tian, He; Yuan, Li; Zhang, Zhao-Hua; Ren, Tian-Ling; Yang, Yi; Zhang, Yan-Hang; Wu, Can;
2014 / IEEE
By: Sassi, U.; Rendina, I.; Iodice, M.; Coppola, G.; Lombardo, A.; Sirleto, L.; Ferrari, A. C.; Sundaram, R. S.; Milana, S.; Casalino, Maurizio;
By: Sassi, U.; Rendina, I.; Iodice, M.; Coppola, G.; Lombardo, A.; Sirleto, L.; Ferrari, A. C.; Sundaram, R. S.; Milana, S.; Casalino, Maurizio;
2014 / IEEE
By: Umezawa, Toshimasa; Yamamoto, Naokatsu; Kawanishi, Tetsuya; Dat, Pham Tien; Kanno, Atsushi; Akahane, Kouichi;
By: Umezawa, Toshimasa; Yamamoto, Naokatsu; Kawanishi, Tetsuya; Dat, Pham Tien; Kanno, Atsushi; Akahane, Kouichi;
2014 / IEEE
By: Coppola, G.; Casalino, M.; Ferrari, A.C.; Sundaram, R.S.; Milana, S.; Sirleto, L.; Sassi, U.; Rendina, I.; Gioffre, M.; Iodice, M.; Lombardo, A.;
By: Coppola, G.; Casalino, M.; Ferrari, A.C.; Sundaram, R.S.; Milana, S.; Sirleto, L.; Sassi, U.; Rendina, I.; Gioffre, M.; Iodice, M.; Lombardo, A.;
2014 / IEEE
By: Mosleh, Aboozar; Conley, Benjamin R.; Margetis, Joe; Tolle, John; Ghetmiri, Seyed A.; Soref, Richard A.; Yu, Shui-Qing; Naseem, Hameed; Du, Wei; Sun, Greg;
By: Mosleh, Aboozar; Conley, Benjamin R.; Margetis, Joe; Tolle, John; Ghetmiri, Seyed A.; Soref, Richard A.; Yu, Shui-Qing; Naseem, Hameed; Du, Wei; Sun, Greg;
2014 / IEEE
By: Wang, B.-C.; Chang, S.-J.; Hsiao, C.-H.; Liu, Y.-H.; Young, S.-J.; Wu, S.-L.; Tsai, K.-S.; Kao, T.-H.;
By: Wang, B.-C.; Chang, S.-J.; Hsiao, C.-H.; Liu, Y.-H.; Young, S.-J.; Wu, S.-L.; Tsai, K.-S.; Kao, T.-H.;
2014 / IEEE
By: Ferri, A.; Acerbi, F.; Piemonte, C.; Zorzi, N.; Pavesi, L.; Cazzanelli, M.; Gola, A.;
By: Ferri, A.; Acerbi, F.; Piemonte, C.; Zorzi, N.; Pavesi, L.; Cazzanelli, M.; Gola, A.;
2014 / IEEE
By: Stoppa, David; Xu, Hesong; Campos Braga, Leo Huf; Dalla Betta, Gian-Franco; Pancheri, Lucio;
By: Stoppa, David; Xu, Hesong; Campos Braga, Leo Huf; Dalla Betta, Gian-Franco; Pancheri, Lucio;
2014 / IEEE
By: Lo, K.-Y.; Hsiao, C.-H.; Chang, S.-J.; Liu, C.-W.; Kao, T.-H.; Tsai, K.-S.; Young, S.-J.; Wang, B.-C.; Wu, S.-L.;
By: Lo, K.-Y.; Hsiao, C.-H.; Chang, S.-J.; Liu, C.-W.; Kao, T.-H.; Tsai, K.-S.; Young, S.-J.; Wang, B.-C.; Wu, S.-L.;