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Topic: Phase Locked Loops
Results
2011 / IEEE
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
By: Su, M.Y.; Shuenn-Yuh Lee; Qiang Fang; Jou-Wei Lin; Hsin-Yi Lai; Chung-Min Yang; Cheng-Han Hsieh; You-Yin Chen; Ming-Chun Liang;
2011 / IEEE
By: Takinami, K.; Hassibi, M.; Wong, T.; Le Grand de Mercey, G.; Liang, P.C.P.; Strandberg, R.;
By: Takinami, K.; Hassibi, M.; Wong, T.; Le Grand de Mercey, G.; Liang, P.C.P.; Strandberg, R.;
2011 / IEEE
By: Okada, K.; Matsuzawa, A.; Matsushita, K.; Bunsen, K.; Murakami, R.; Musa, A.; Sato, T.; Asada, H.; Takayama, N.; Ito, S.; Chaivipas, W.; Minami, R.; Yamaguchi, T.; Takeuchi, Y.; Yamagishi, H.; Noda, M.; Ning Li;
By: Okada, K.; Matsuzawa, A.; Matsushita, K.; Bunsen, K.; Murakami, R.; Musa, A.; Sato, T.; Asada, H.; Takayama, N.; Ito, S.; Chaivipas, W.; Minami, R.; Yamaguchi, T.; Takeuchi, Y.; Yamagishi, H.; Noda, M.; Ning Li;
2011 / IEEE
By: Muto, T.; Yamashita, H.; Ono, G.; Nishimura, S.; Saito, T.; Umai, S.; Kambe, A.; Kono, M.; Toyoda, H.; Watanabe, K.; Yagyu, M.; Yuki, F.; Takemoto, T.; Suzuki, E.; Nemoto, R.; Masuda, N.; Fukuda, K.;
By: Muto, T.; Yamashita, H.; Ono, G.; Nishimura, S.; Saito, T.; Umai, S.; Kambe, A.; Kono, M.; Toyoda, H.; Watanabe, K.; Yagyu, M.; Yuki, F.; Takemoto, T.; Suzuki, E.; Nemoto, R.; Masuda, N.; Fukuda, K.;
2011 / IEEE
By: Phillips, S.D.; Horst, S.J.; LaBel, K.; Wilcox, E.; Benyong Zhang; O'Farrell, P.; Aude, A.; Eddy, R.; Kruckmeyer, K.; Cressler, J.D.;
By: Phillips, S.D.; Horst, S.J.; LaBel, K.; Wilcox, E.; Benyong Zhang; O'Farrell, P.; Aude, A.; Eddy, R.; Kruckmeyer, K.; Cressler, J.D.;
2011 / IEEE
By: Fonseca, E.C.P.; Kastensmidt, F.L.; Azambuja, J.R.; Tarrillo, J.; Goncalez, O.; Galhardo, R.;
By: Fonseca, E.C.P.; Kastensmidt, F.L.; Azambuja, J.R.; Tarrillo, J.; Goncalez, O.; Galhardo, R.;
2012 / IEEE
By: Burgos, R.P.; Kshirsagar, P.; Seung-Ki Sul; Boroyevich, D.; Fei Wang; Lidozzi, A.; Jihoon Jang;
By: Burgos, R.P.; Kshirsagar, P.; Seung-Ki Sul; Boroyevich, D.; Fei Wang; Lidozzi, A.; Jihoon Jang;
2012 / IEEE
By: Amirkhany, A.; Xingchao Yuan; Mishra, N.K.; Jie Shen; Beyene, W.T.; Chen, C.; Chin, T.J.; Dressier, D.; Huang, C.; Gadde, V.P.; Hekmat, M.; Kaviani, K.; Hai Lan; Phuong Le; Mahabaleshwara; Madden, C.; Mukherjee, S.; Raghavan, L.; Saito, K.; Secker, D.; Sendhil, A.; Schmitt, R.; Fazeel, S.; Srinivas, G.S.; Ting Wu; Chanh Tran; Vaidyanath, A.; Vyas, K.; Ling Yang; Jain, M.; Chang, K.-Y.K.; Wei, J.;
By: Amirkhany, A.; Xingchao Yuan; Mishra, N.K.; Jie Shen; Beyene, W.T.; Chen, C.; Chin, T.J.; Dressier, D.; Huang, C.; Gadde, V.P.; Hekmat, M.; Kaviani, K.; Hai Lan; Phuong Le; Mahabaleshwara; Madden, C.; Mukherjee, S.; Raghavan, L.; Saito, K.; Secker, D.; Sendhil, A.; Schmitt, R.; Fazeel, S.; Srinivas, G.S.; Ting Wu; Chanh Tran; Vaidyanath, A.; Vyas, K.; Ling Yang; Jain, M.; Chang, K.-Y.K.; Wei, J.;
2012 / IEEE
By: Ito, T.; Ban, K.; Kobayashi, Y.; Sai, A.; Tachibana, R.; Tsubouchi, Y.; Wang, T.; Hosoya, M.; Hoshino, H.; Tsutsumi, Y.; Mitomo, T.; Tomizawa, T.; Kurose, D.; Tandai, T.;
By: Ito, T.; Ban, K.; Kobayashi, Y.; Sai, A.; Tachibana, R.; Tsubouchi, Y.; Wang, T.; Hosoya, M.; Hoshino, H.; Tsutsumi, Y.; Mitomo, T.; Tomizawa, T.; Kurose, D.; Tandai, T.;
2012 / IEEE
By: Kaviani, K.; Xingchao Yuan; Wei, J.; Amirkhany, A.; Jie Shen; Chin, T.J.; Thakkar, C.; Beyene, W.T.; Chan, N.; Chen, C.; Bing Ren Chuang; Dressler, D.; Gadde, V.P.; Hekmat, M.; Ho, E.; Huang, C.; Phuong Le; Mahabaleshwara; Madden, C.; Mishra, N.K.; Raghavan, L.; Saito, K.; Schmitt, R.; Secker, D.; Xudong Shi; Fazeel, S.; Srinivas, G.S.; Zhang, S.; Tran, C.; Vaidyanath, A.; Vyas, K.; Jain, M.; Kun-Yung Ken Chang; Ting Wu;
By: Kaviani, K.; Xingchao Yuan; Wei, J.; Amirkhany, A.; Jie Shen; Chin, T.J.; Thakkar, C.; Beyene, W.T.; Chan, N.; Chen, C.; Bing Ren Chuang; Dressler, D.; Gadde, V.P.; Hekmat, M.; Ho, E.; Huang, C.; Phuong Le; Mahabaleshwara; Madden, C.; Mishra, N.K.; Raghavan, L.; Saito, K.; Schmitt, R.; Secker, D.; Xudong Shi; Fazeel, S.; Srinivas, G.S.; Zhang, S.; Tran, C.; Vaidyanath, A.; Vyas, K.; Jain, M.; Kun-Yung Ken Chang; Ting Wu;
2012 / IEEE
By: Chao-Cheng Lee; Ying-Hsi Lin; Ke-Horng Chen; Shen-Yu Peng; Chen-Chih Huang; Yu-Huei Lee; Chao-Chang Chiu; Tsung-Yen Tsai;
By: Chao-Cheng Lee; Ying-Hsi Lin; Ke-Horng Chen; Shen-Yu Peng; Chen-Chih Huang; Yu-Huei Lee; Chao-Chang Chiu; Tsung-Yen Tsai;
2012 / IEEE
By: Loke, A.L.S.; Doyle, B.A.; Maheshwari, S.K.; Fang, E.S.; Wang, C.L.; Tin Tin Wee; Fischette, D.M.;
By: Loke, A.L.S.; Doyle, B.A.; Maheshwari, S.K.; Fang, E.S.; Wang, C.L.; Tin Tin Wee; Fischette, D.M.;
2012 / IEEE
By: Byong-Tae Chung; Young-Jung Choi; Chulwoo Kim; Kwan-Weon Kim; Hyun-Woo Lee; Ju-Hwan Sohn; Young-Kyoung Choi; Ki-Han Kim; Nak-Kyu Park;
By: Byong-Tae Chung; Young-Jung Choi; Chulwoo Kim; Kwan-Weon Kim; Hyun-Woo Lee; Ju-Hwan Sohn; Young-Kyoung Choi; Ki-Han Kim; Nak-Kyu Park;
2012 / IEEE
By: Thacker, T.; Dong Dong; Skutt, G.; Wang, F.F.; Boroyevich, D.; Burgos, R.; Cvetkovic, I.;
By: Thacker, T.; Dong Dong; Skutt, G.; Wang, F.F.; Boroyevich, D.; Burgos, R.; Cvetkovic, I.;
2012 / IEEE
By: Schmitz-Peiffer, A.; Eissfeller, B.; Jong Hoon Won; Colzi, E.; Zanier, F.; Floch, J.-J.;
By: Schmitz-Peiffer, A.; Eissfeller, B.; Jong Hoon Won; Colzi, E.; Zanier, F.; Floch, J.-J.;
2012 / IEEE
By: Poves, E.; Perez-Jimenez, R.; Rufo, J.; Gonzalez, O.; Martin-Gonzalez, J.A.; Lopez-Hernandez, F.J.; Del Campo, G.;
By: Poves, E.; Perez-Jimenez, R.; Rufo, J.; Gonzalez, O.; Martin-Gonzalez, J.A.; Lopez-Hernandez, F.J.; Del Campo, G.;
2012 / IEEE
By: Wei Zhang; Jinghui Liu; Rui He; Jian Qiao; Hang Lv; Zhihua Wang; Bo Zhou; Yongming Li; Woogeun Rhee;
By: Wei Zhang; Jinghui Liu; Rui He; Jian Qiao; Hang Lv; Zhihua Wang; Bo Zhou; Yongming Li; Woogeun Rhee;