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Topic: Patterns
Results
2011 / IEEE / 978-1-4577-0836-7
By: Fan Jing Meng; Nianjun Zhou; Yi-Min Chee; Peide Zhong; Bagheri, S.;
By: Fan Jing Meng; Nianjun Zhou; Yi-Min Chee; Peide Zhong; Bagheri, S.;
2011 / IEEE / 978-1-4673-0107-7
By: Prokhorova, Y.; Romanovsky, A.; Iliasov, A.; Lopatkin, I.; Troubitsyna, E.;
By: Prokhorova, Y.; Romanovsky, A.; Iliasov, A.; Lopatkin, I.; Troubitsyna, E.;
2012 / IEEE / 978-1-4673-1067-3
By: Devos, N.; Anckaerts, G.; Moriau, B.; Bauvin, R.; Deprez, J.; Ponsard, C.;
By: Devos, N.; Anckaerts, G.; Moriau, B.; Bauvin, R.; Deprez, J.; Ponsard, C.;
2012 / IEEE / 978-1-4673-2892-0
By: Fehling, C.; Schumm, D.; Rutschlin, J.; Pauly, M.; Leymann, F.; Ewald, T.;
By: Fehling, C.; Schumm, D.; Rutschlin, J.; Pauly, M.; Leymann, F.; Ewald, T.;
2013 / IEEE
By: Pugliese, Rosario; Tiezzi, Francesco; Puviani, Mariachiara; Hennicker, Rolf; Klarl, Annabelle; Mayer, Philip; Bure, Toma; Keznikl, Jaroslav;
By: Pugliese, Rosario; Tiezzi, Francesco; Puviani, Mariachiara; Hennicker, Rolf; Klarl, Annabelle; Mayer, Philip; Bure, Toma; Keznikl, Jaroslav;
2006 / RSC Publishing
By: Luciana Maresca; Francesco P. Fanizzi; Michele Benedetti; Giovanni Natile;
By: Luciana Maresca; Francesco P. Fanizzi; Michele Benedetti; Giovanni Natile;
2006 / RSC Publishing
By: Alois Fuumlrstner; Christian W. Lehmann; Vincent Ceacutesar; Manuel Alcarazo;
By: Alois Fuumlrstner; Christian W. Lehmann; Vincent Ceacutesar; Manuel Alcarazo;
2008 / RSC Publishing
By: Wilhelm T. S. Huck; SeungMan Yang; SeGyu Jang; JongRyul Jeong; Nan Cheng; Sarah Kim;
By: Wilhelm T. S. Huck; SeungMan Yang; SeGyu Jang; JongRyul Jeong; Nan Cheng; Sarah Kim;
2009 / RSC Publishing
By: Yi Lu; Miaoxin Lin; Jianhui Zhu; Zijian Guo; Damin Fan; Junfeng Zhang; Yuncong Chen; Ziyi Wu;
By: Yi Lu; Miaoxin Lin; Jianhui Zhu; Zijian Guo; Damin Fan; Junfeng Zhang; Yuncong Chen; Ziyi Wu;
2010 / RSC Publishing
By: Adina Nicoleta Lazar; Ilaria Tonazzini; Arian Shehu; Pierpaolo Greco; Beatrice Chelli; Pasquale DAngelo; Michele Bianchi; Chiara Dionigi; Fabio Biscarini;
By: Adina Nicoleta Lazar; Ilaria Tonazzini; Arian Shehu; Pierpaolo Greco; Beatrice Chelli; Pasquale DAngelo; Michele Bianchi; Chiara Dionigi; Fabio Biscarini;
2010 / RSC Publishing
By: E. Casero; L. Vaacutezquez; E. Lorenzo; F. Pariente; M. J. Gismera; A. M. ParraAlfambra; M. D. PetitDomiacutenguez;
By: E. Casero; L. Vaacutezquez; E. Lorenzo; F. Pariente; M. J. Gismera; A. M. ParraAlfambra; M. D. PetitDomiacutenguez;
2010 / RSC Publishing
By: Tatyana B. Anisimova; Vadim Yu. Kukushkin; Matti Haukka; Konstantin V. Luzyanin; Nadezhda A. Bokach;
By: Tatyana B. Anisimova; Vadim Yu. Kukushkin; Matti Haukka; Konstantin V. Luzyanin; Nadezhda A. Bokach;
2015 / Lippincott Williams & Wilkins Journals
By: Trevor K. Stephens; Gregory A. Von Forell; Anton E. Bowden; Dino Samartzis;
By: Trevor K. Stephens; Gregory A. Von Forell; Anton E. Bowden; Dino Samartzis;
2014 / Lippincott Williams & Wilkins Journals
By: Muhammad T. Idrees; Robert H. Young; Thomas M. Ulbright; Chia-Sui Kao;
By: Muhammad T. Idrees; Robert H. Young; Thomas M. Ulbright; Chia-Sui Kao;
1991 / IEEE / 0-7803-0213-3
By: Okazaki, S.; Nagae, Y.; Hayama, H.; Asada, H.; Saito, T.; Akimoto, Y.;
By: Okazaki, S.; Nagae, Y.; Hayama, H.; Asada, H.; Saito, T.; Akimoto, Y.;
1994 / IEEE / 0-7803-1476-X
By: Wacker, T.; Frankowsky, G.; Scholz, F.; Ottenwalder, D.; Hangleiter, A.;
By: Wacker, T.; Frankowsky, G.; Scholz, F.; Ottenwalder, D.; Hangleiter, A.;