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Topic: Output Buffers
Results
2012 / IEEE
By: Paschen, U.; Weyers, S.; Durini, D.; Tisa, S.; Zappa, F.; Brockherde, W.; Tosi, A.; Bronzi, D.; Bellisai, S.; Markovic, B.; Villa, F.;
By: Paschen, U.; Weyers, S.; Durini, D.; Tisa, S.; Zappa, F.; Brockherde, W.; Tosi, A.; Bronzi, D.; Bellisai, S.; Markovic, B.; Villa, F.;
1991 / IEEE
By: Deblis, D.; Eng, J.; Yee, C.M.L.; Kim, S.J.; Davisson, P.S.; Jeong, J.; Vella-Coleiro, G.P.; Bylsma, R.B.; Seabury, C.W.; Jhee, Y.K.;
By: Deblis, D.; Eng, J.; Yee, C.M.L.; Kim, S.J.; Davisson, P.S.; Jeong, J.; Vella-Coleiro, G.P.; Bylsma, R.B.; Seabury, C.W.; Jhee, Y.K.;
1996 / IEEE / 0-8186-7376-1
By: Jungwan Cho; Seungryul Maeng; Hyunsoo Yoon; Boseob Kwon; Byungho Kim;
By: Jungwan Cho; Seungryul Maeng; Hyunsoo Yoon; Boseob Kwon; Byungho Kim;
1994 / IEEE / 0-7803-1975-3
By: Keh-Chung Wang; Pierson, R.; Nubling, R.; Beccue, S.; Nary, K.R.; Jayaraman, A.; Zampardi, P.;
By: Keh-Chung Wang; Pierson, R.; Nubling, R.; Beccue, S.; Nary, K.R.; Jayaraman, A.; Zampardi, P.;
2004 / IEEE / 0-7803-8267-6
By: Horinaka, M.; Yamamoto, T.; Onodera, H.; Hashimoto, K.; Nomura, H.; Yamazaki, D.;
By: Horinaka, M.; Yamamoto, T.; Onodera, H.; Hashimoto, K.; Nomura, H.; Yamazaki, D.;
2004 / IEEE / 0-7803-8331-1
By: Jackel, H.; Buren, G.; Morf, T.; Ellinger, F.; Kromer, C.; Schmatz, M.; Rodoni, L.; Sialm, G.;
By: Jackel, H.; Buren, G.; Morf, T.; Ellinger, F.; Kromer, C.; Schmatz, M.; Rodoni, L.; Sialm, G.;
2004 / IEEE / 0-7803-8692-2
By: Kish, L.; Sonkusale, S.R.; Agarwal, A.; Kim, Y.; Marlow, W.; Cheng, M.;
By: Kish, L.; Sonkusale, S.R.; Agarwal, A.; Kim, Y.; Marlow, W.; Cheng, M.;
Full-rate injection-locked 10.3Gb/s clock and data recovery circuit in a 45GHz-f/sub T/ SiGe process
2005 / IEEE / 0-7803-9023-7By: Duster, J.S.; Zhan, J.-H.C.; Kornegay, K.T.;
2008 / IEEE / 978-1-4244-1945-6
By: Kwasniewski, T.; Bangli Liang; Dezhong Cheng; Bo Wang; Dianyong Chen;
By: Kwasniewski, T.; Bangli Liang; Dezhong Cheng; Bo Wang; Dianyong Chen;
2011 / IEEE
By: Teixeira, H.M.; Pedro, J.C.; Canavero, F.G.; Cunha, T.R.; Girardi, A.; Rigazio, L.; Stievano, I.S.; Vitale, F.; Izzi, R.;
By: Teixeira, H.M.; Pedro, J.C.; Canavero, F.G.; Cunha, T.R.; Girardi, A.; Rigazio, L.; Stievano, I.S.; Vitale, F.; Izzi, R.;