Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Organisms
Results
2011 / IEEE / 978-1-61284-774-0
By: Siheng Sun; Guozhong Huang; Xianglan Cui; Aiji Chen; Limin Zhang;
By: Siheng Sun; Guozhong Huang; Xianglan Cui; Aiji Chen; Limin Zhang;
2011 / IEEE / 978-4-907764-39-5
By: Matsui, T.; Moriyama, T.; Toda, M.; Adamatzky, A.; Nishiyama, Y.; Iizuka, K.; Niizato, T.; Murakami, H.; Gunji, Y.; Enomoto, K.;
By: Matsui, T.; Moriyama, T.; Toda, M.; Adamatzky, A.; Nishiyama, Y.; Iizuka, K.; Niizato, T.; Murakami, H.; Gunji, Y.; Enomoto, K.;
2011 / IEEE / 978-966-335-357-9
By: Peregudov, S.N.; Golovchanska, O.D.; Yanenko, O.P.; Kutsenko, V.P.;
By: Peregudov, S.N.; Golovchanska, O.D.; Yanenko, O.P.; Kutsenko, V.P.;
2011 / IEEE / 978-83-60810-39-2
By: Sansores, C.E.; CalderAln-Aguilera, L.E.; Pavon, J.; Gomez, H.F.; Reyes, F.;
By: Sansores, C.E.; CalderAln-Aguilera, L.E.; Pavon, J.; Gomez, H.F.; Reyes, F.;
2011 / IEEE / 978-1-4244-9352-4
By: Liu Qi-jun; Dong Yun-yuan; Wang Zheng-hua; Wang Yong-xian; Yang Jun;
By: Liu Qi-jun; Dong Yun-yuan; Wang Zheng-hua; Wang Yong-xian; Yang Jun;
2011 / IEEE / 978-0-933957-39-8
By: Ryan, J.P.; Zhang, Y.; Godin, M.A.; Bellingham, J.G.; Hoover, T.T.;
By: Ryan, J.P.; Zhang, Y.; Godin, M.A.; Bellingham, J.G.; Hoover, T.T.;
2011 / IEEE / 978-0-933957-39-8
By: Pradillon, F.; Watanabe, H.; Mullineaux, L.; Mills, S.; Beaulieu, S.E.; Kojima, S.;
By: Pradillon, F.; Watanabe, H.; Mullineaux, L.; Mills, S.; Beaulieu, S.E.; Kojima, S.;
2011 / IEEE / 978-1-4244-9306-7
By: Marcal, A.R.S.; Caridade, C.M.R.; Sousa, J.P.; Natal-da-Luz, T.; Mendonca, T.;
By: Marcal, A.R.S.; Caridade, C.M.R.; Sousa, J.P.; Natal-da-Luz, T.; Mendonca, T.;
2011 / IEEE / 978-1-4673-0014-8
By: Hamacherk, K.; Weil, P.; Schreck, T.; Hess, M.; von Landesberger, T.; Bremm, S.;
By: Hamacherk, K.; Weil, P.; Schreck, T.; Hess, M.; von Landesberger, T.; Bremm, S.;
2011 / IEEE / 978-606-544-078-4
By: Vasiliev, N.; Deac, A.; Minciuna, V.; Sontea, V.; Saulea, A.; Zemtsovsky, E.; Scripnic, V.;
By: Vasiliev, N.; Deac, A.; Minciuna, V.; Sontea, V.; Saulea, A.; Zemtsovsky, E.; Scripnic, V.;
2011 / IEEE / 978-1-4577-1799-4
By: Mihelcic, J.R.; Ye Jin; Zhengzhang Chen; Kuangyu Wang; Samatova, N.F.; Rocha, A.M.; Wilson, K.; Padmanabhan, K.;
By: Mihelcic, J.R.; Ye Jin; Zhengzhang Chen; Kuangyu Wang; Samatova, N.F.; Rocha, A.M.; Wilson, K.; Padmanabhan, K.;
2012 / IEEE / 978-1-4577-1200-5
By: Caligiore, Daniele; Tommasino, Paolo; Baldassarre, Gianluca; Sperati, Valerio;
By: Caligiore, Daniele; Tommasino, Paolo; Baldassarre, Gianluca; Sperati, Valerio;
2014 / IEEE
By: Jeong, Hyundoo; Arshad, Osama A.; Ghaffari, Noushin; Johnson, Charles D.; Datta, Aniruddha; Yoon, Byung-Jun; Criscitiello, Michael F.; Thiltges, John;
By: Jeong, Hyundoo; Arshad, Osama A.; Ghaffari, Noushin; Johnson, Charles D.; Datta, Aniruddha; Yoon, Byung-Jun; Criscitiello, Michael F.; Thiltges, John;
2014 / IEEE
By: Sun, Huiyan; Chen, Liang; Pang, Wei; Wang, Yan; Jiang, Yuexu; Blanzieri, Enrico; Liang, Yanchun;
By: Sun, Huiyan; Chen, Liang; Pang, Wei; Wang, Yan; Jiang, Yuexu; Blanzieri, Enrico; Liang, Yanchun;
2014 / IEEE
By: Heinerman, Jacqueline; Crosato, Emanuele; Weel, Berend; Eiben, A.E.; Haasdijk, Evert;
By: Heinerman, Jacqueline; Crosato, Emanuele; Weel, Berend; Eiben, A.E.; Haasdijk, Evert;