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Topic: Optical Fibre Amplifiers
Results
2012 / IEEE
By: Harun, S.W.; Ahmad, H.; Zarei, A.; Mirnia, S.E.; Fatehi, H.; Zahedi, F.Z.; Zarifi, A.; Emami, S.D.;
By: Harun, S.W.; Ahmad, H.; Zarei, A.; Mirnia, S.E.; Fatehi, H.; Zahedi, F.Z.; Zarifi, A.; Emami, S.D.;
2012 / IEEE
By: Zulkifli, M.Z.; Ahmad, H.; Harun, S.W.; Pal, B.P.; Dimyati, K.; Jemangin, M.H.; Muhammad, F.D.;
By: Zulkifli, M.Z.; Ahmad, H.; Harun, S.W.; Pal, B.P.; Dimyati, K.; Jemangin, M.H.; Muhammad, F.D.;
2012 / IEEE
By: Yue-Kai Huang; Cvijetic, M.; Tajima, T.; Aono, Y.; Ip, E.; Ming-Fang Huang; Wellbrock, G.A.; Xia, T.J.;
By: Yue-Kai Huang; Cvijetic, M.; Tajima, T.; Aono, Y.; Ip, E.; Ming-Fang Huang; Wellbrock, G.A.; Xia, T.J.;
2012 / IEEE
By: Parmigiani, F.; Richardson, D.J.; Kakande, J.; Bogris, A.; Slavik, R.; Gruner-Nielsen, L.; Syvridis, D.; Petropoulos, P.; Vojtech, J.; Phelan, R.;
By: Parmigiani, F.; Richardson, D.J.; Kakande, J.; Bogris, A.; Slavik, R.; Gruner-Nielsen, L.; Syvridis, D.; Petropoulos, P.; Vojtech, J.; Phelan, R.;
2012 / IEEE
By: Mohs, G.; Lucero, A.; Davidson, C.R.; Jin-Xing Cai; Bergano, N.S.; Hongbin Zhang; Pilipetskii, A.N.; Patterson, W.W.; Sinkin, O.V.; Foursa, D.G.;
By: Mohs, G.; Lucero, A.; Davidson, C.R.; Jin-Xing Cai; Bergano, N.S.; Hongbin Zhang; Pilipetskii, A.N.; Patterson, W.W.; Sinkin, O.V.; Foursa, D.G.;
2012 / IEEE
By: Pi Ling Huang; Taga, H.; Yu-Kuan Lu; Jui-Pin Wu; Wei-Lun Wang; De-Ming Kong; Kuang-Yao Huang; Jau-Sheng Wang; Pochi Yeh; Wood-Hi Cheng; Yi-Chung Huang; Yi-Jen Chiu; Sheng-Lung Huang; Szu-Ming Yeh;
By: Pi Ling Huang; Taga, H.; Yu-Kuan Lu; Jui-Pin Wu; Wei-Lun Wang; De-Ming Kong; Kuang-Yao Huang; Jau-Sheng Wang; Pochi Yeh; Wood-Hi Cheng; Yi-Chung Huang; Yi-Jen Chiu; Sheng-Lung Huang; Szu-Ming Yeh;
2012 / IEEE
By: Mergo, P.; Nasilowski, T.; Beres-Pawlik, E.; Napierala, M.; Thienpont, H.; Berghmans, F.;
By: Mergo, P.; Nasilowski, T.; Beres-Pawlik, E.; Napierala, M.; Thienpont, H.; Berghmans, F.;
2012 / IEEE
By: Nasirabad, R.R.; Babazadeh, A.; Roohforouz, A.; Golshan, A.H.; Norouzy, A.; Jafari, N.T.; Amidian, A.; Alavian, A.; Poozesh, R.; Hejaz, K.; Heidariazar, A.;
By: Nasirabad, R.R.; Babazadeh, A.; Roohforouz, A.; Golshan, A.H.; Norouzy, A.; Jafari, N.T.; Amidian, A.; Alavian, A.; Poozesh, R.; Hejaz, K.; Heidariazar, A.;
2012 / IEEE
By: Bohong Shu; Xiaojun Xu; Xinyang Li; Chao Geng; Xiong Wang; Rongtao Su; Pu Zhou; Xiaolin Wang;
By: Bohong Shu; Xiaojun Xu; Xinyang Li; Chao Geng; Xiong Wang; Rongtao Su; Pu Zhou; Xiaolin Wang;
2012 / IEEE
By: Winzer, P.J.; Delbue, R.; Gnauck, A.H.; Schmidt, C.; Randel, S.; Mestre, M.A.; Ryf, R.; Lingle, R.; McCurdy, A.; Peckham, D.W.; Essiambre, R.-J.; Jiang, X.; Sun, Y.; Sureka, A.; Pupalaikis, P.;
By: Winzer, P.J.; Delbue, R.; Gnauck, A.H.; Schmidt, C.; Randel, S.; Mestre, M.A.; Ryf, R.; Lingle, R.; McCurdy, A.; Peckham, D.W.; Essiambre, R.-J.; Jiang, X.; Sun, Y.; Sureka, A.; Pupalaikis, P.;
2012 / IEEE
By: Jau-Sheng Wang; Wei-Lun Wang; Wood-Hi Cheng; Sheng-Lung Huang; Li-Wei Liu; Yi-Chung Huang;
By: Jau-Sheng Wang; Wei-Lun Wang; Wood-Hi Cheng; Sheng-Lung Huang; Li-Wei Liu; Yi-Chung Huang;
2012 / IEEE
By: Plant, J.J.; Delfyett, P.J.; Bagnell, M.; Ozdur, I.T.; Davila-Rodriguez, J.; Juodawlkis, P.W.;
By: Plant, J.J.; Delfyett, P.J.; Bagnell, M.; Ozdur, I.T.; Davila-Rodriguez, J.; Juodawlkis, P.W.;
2012 / IEEE
By: Inoue, T.; Yaman, F.; Mateo, E.; Qian, D.; Inada, Y.; Zhang, S.; Huang, M.; Wang, T.;
By: Inoue, T.; Yaman, F.; Mateo, E.; Qian, D.; Inada, Y.; Zhang, S.; Huang, M.; Wang, T.;
2012 / IEEE
By: Gilfert, C.; Krakowski, M.; Michel, N.; Traub, M.; Westphalen, T.; Reithmaier, J.P.; Pavelescu, E.-M.;
By: Gilfert, C.; Krakowski, M.; Michel, N.; Traub, M.; Westphalen, T.; Reithmaier, J.P.; Pavelescu, E.-M.;
2011 / IEEE / 978-1-4244-5731-1
By: Lingle, R.; Tibuleac, S.; Filer, M.; Detwiler, T.; Chang, G.; Stark, A.; Hsueh, Y.; Ralph, S.E.;
By: Lingle, R.; Tibuleac, S.; Filer, M.; Detwiler, T.; Chang, G.; Stark, A.; Hsueh, Y.; Ralph, S.E.;
2011 / IEEE / 978-1-4577-0752-0
By: Andriyanto, D.; Najib A, M.; Manaf, Z.; Zamzuri, M.; Ahmad, A.; Tarsono, D.;
By: Andriyanto, D.; Najib A, M.; Manaf, Z.; Zamzuri, M.; Ahmad, A.; Tarsono, D.;
2011 / IEEE / 978-986-02-8974-9
By: Ip, E.; Yue-Kai Huang; Wellbrock, G.A.; Xia, T.J.; Ting Wang; Ming-Fang Huang;
By: Ip, E.; Yue-Kai Huang; Wellbrock, G.A.; Xia, T.J.; Ting Wang; Ming-Fang Huang;
2011 / IEEE / 978-986-02-8974-9
By: Chieh Hu; Yao-Wun Jhang; Chien-Ming Huang; Hsin-Chia Su; Shih-Ting Lin; Chih-Lin Wang; Tzong-Yow Tsai; Hong-Xi Tsao;
By: Chieh Hu; Yao-Wun Jhang; Chien-Ming Huang; Hsin-Chia Su; Shih-Ting Lin; Chih-Lin Wang; Tzong-Yow Tsai; Hong-Xi Tsao;
2011 / IEEE / 978-986-02-8974-9
By: Mou-Tion Lee; Dejiang Zhang; Shengqian Zhong; Zhiqiang Chen; Jian Deng; Xiaodong Zhou; Huijian Zhang; Xiaoli Huo; Junjie Li; Chengliang Zhang; Shaofeng Qi;
By: Mou-Tion Lee; Dejiang Zhang; Shengqian Zhong; Zhiqiang Chen; Jian Deng; Xiaodong Zhou; Huijian Zhang; Xiaoli Huo; Junjie Li; Chengliang Zhang; Shaofeng Qi;
2011 / IEEE / 978-986-02-8974-9
By: Thi Thanh Thuy Nguyen; Katsuyama, Y.; Yamada, M.; Koyama, O.; Nooruzzaman, M.;
By: Thi Thanh Thuy Nguyen; Katsuyama, Y.; Yamada, M.; Koyama, O.; Nooruzzaman, M.;
2011 / IEEE / 978-986-02-8974-9
By: Xu, K.; Cong Xu; Lin, J.T.; Wu, J.; Dai, Y.T.; Zuo, Y.; Guo, H.X.; Li, W.;
By: Xu, K.; Cong Xu; Lin, J.T.; Wu, J.; Dai, Y.T.; Zuo, Y.; Guo, H.X.; Li, W.;
2011 / IEEE / 978-1-61284-878-5
By: Seddon, A.; Furniss, D.; Jaworski, P.; Gora, W.; Benson, T.M.; Beres-Pawlik, E.; Sojka, L.; Sujecki, S.; Mergo, P.;
By: Seddon, A.; Furniss, D.; Jaworski, P.; Gora, W.; Benson, T.M.; Beres-Pawlik, E.; Sojka, L.; Sujecki, S.; Mergo, P.;
2011 / IEEE / 978-1-4577-1207-4
By: Dang Van Liet; Le Nguyen Binh; Nguyen Huu Phuong; Nguyen Anh Vinh;
By: Dang Van Liet; Le Nguyen Binh; Nguyen Huu Phuong; Nguyen Anh Vinh;
2011 / IEEE / 978-1-4244-6252-0
By: Yinghai Zhang; Namihira, Y.; Jingjing Liu; Zhe Kang; Nianyu Zou; Dong Wang;
By: Yinghai Zhang; Namihira, Y.; Jingjing Liu; Zhe Kang; Nianyu Zou; Dong Wang;
2011 / IEEE / 978-1-55752-932-9
By: Nesset, D.; Rafel, A.; Wright, P.; Morsman, T.; Farrow, K.; Cooper, I.;
By: Nesset, D.; Rafel, A.; Wright, P.; Morsman, T.; Farrow, K.; Cooper, I.;
2011 / IEEE / 978-1-55752-932-9
By: Dhar, A.; Richardson, D.J.; Li, Z.; Alam, S.; Yung, Y.; Giles, D.; Poletti, F.; Gruner-Nielsen, L.; Sahu, J.; Giles, I.;
By: Dhar, A.; Richardson, D.J.; Li, Z.; Alam, S.; Yung, Y.; Giles, D.; Poletti, F.; Gruner-Nielsen, L.; Sahu, J.; Giles, I.;