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Topic: Optical Couplers
Results
2011 / IEEE
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
2012 / IEEE
By: Borisov, A.B.; McCorkindale, J.C.; Poopalasingam, S.; Racz, E.; Khan, S.F.; Rhodes, C.K.; Longworth, J.W.;
By: Borisov, A.B.; McCorkindale, J.C.; Poopalasingam, S.; Racz, E.; Khan, S.F.; Rhodes, C.K.; Longworth, J.W.;
2012 / IEEE
By: Nagdi, A.E.; Evans, G.A.; MacFarlane, D.L.; Sultana, N.; Dabkowski, M.; Ramakrishna, V.; Liu, K.; LaFave, T.P.; Christensen, M.P.; Kirk, J.; Kim, T.W.; Jiyoung Kim; Huntoon, N.; Hunt, L.R.;
By: Nagdi, A.E.; Evans, G.A.; MacFarlane, D.L.; Sultana, N.; Dabkowski, M.; Ramakrishna, V.; Liu, K.; LaFave, T.P.; Christensen, M.P.; Kirk, J.; Kim, T.W.; Jiyoung Kim; Huntoon, N.; Hunt, L.R.;
2012 / IEEE
By: Pang, A.; Le Li; Chao Qiu; Zhiqi Wang; Aimin Wu; Fuwan Gan; Zhen Sheng; Shichang Zou; Xi Wang;
By: Pang, A.; Le Li; Chao Qiu; Zhiqi Wang; Aimin Wu; Fuwan Gan; Zhen Sheng; Shichang Zou; Xi Wang;
2012 / IEEE
By: Chen, Y.M.; Fung, C.K.Y.; Ke Xu; Wong, C.Y.; Xia Chen; Zhenzhou Cheng; Hon Ki Tsang;
By: Chen, Y.M.; Fung, C.K.Y.; Ke Xu; Wong, C.Y.; Xia Chen; Zhenzhou Cheng; Hon Ki Tsang;
2012 / IEEE
By: Seoung Hun Lee; Seung Hwan Kim; Dong Wook Kim; El-Hang Lee; Jong-Moo Lee; Kyong Hon Kim;
By: Seoung Hun Lee; Seung Hwan Kim; Dong Wook Kim; El-Hang Lee; Jong-Moo Lee; Kyong Hon Kim;
2012 / IEEE
By: Voigt, K.; Rahim, A.; Bruns, J.; Schwarz, S.; Kroushkov, D.I.; Petermann, K.; Schaffer, C.G.; Arnous, M.T.;
By: Voigt, K.; Rahim, A.; Bruns, J.; Schwarz, S.; Kroushkov, D.I.; Petermann, K.; Schaffer, C.G.; Arnous, M.T.;
2012 / IEEE
By: Junfeng Song; Shiyi Chen; Jing Zhang; Huijuan Zhang; Guo-Qiang Lo; Mingbin Yu; Kee, J.S.;
By: Junfeng Song; Shiyi Chen; Jing Zhang; Huijuan Zhang; Guo-Qiang Lo; Mingbin Yu; Kee, J.S.;
2012 / IEEE
By: Stark, A.J.; Dabkowski, M.; Kirk, J.B.; Kim, J.; Kim, T.W.; Sultana, N.; Evans, G.A.; LaFave, T.P.; Liu, K.; Christensen, M.P.; MacFarlane, D.L.; Huntoon, N.; Ramakrishna, V.; Hunt, L.R.;
By: Stark, A.J.; Dabkowski, M.; Kirk, J.B.; Kim, J.; Kim, T.W.; Sultana, N.; Evans, G.A.; LaFave, T.P.; Liu, K.; Christensen, M.P.; MacFarlane, D.L.; Huntoon, N.; Ramakrishna, V.; Hunt, L.R.;
2012 / IEEE
By: Yang Wang; Song Liang; Hong-Liang Zhu; Guang-Zhao Ran; Guo-Gang Qin; Jiao-Qing Pan; Wei-Xi Chen; Yan-Ping Li; Tao Hong; Wei Wang;
By: Yang Wang; Song Liang; Hong-Liang Zhu; Guang-Zhao Ran; Guo-Gang Qin; Jiao-Qing Pan; Wei-Xi Chen; Yan-Ping Li; Tao Hong; Wei Wang;
2012 / IEEE
By: Jae Hong Chang; Jeong Hwan Song; Guo Qiang Lo; Chao Li; Mi Kyoung Park; Huijuan Zhang; Jing Zhang;
By: Jae Hong Chang; Jeong Hwan Song; Guo Qiang Lo; Chao Li; Mi Kyoung Park; Huijuan Zhang; Jing Zhang;
2012 / IEEE
By: Lamponi, M.; Duan, G.H.; Fedeli, J.-M.; Messaoudene, S.; Van Thourhout, D.; Roelkens, G.; de Valicourt, G.; Lelarge, F.; Poingt, F.; Jany, C.; Keyvaninia, S.;
By: Lamponi, M.; Duan, G.H.; Fedeli, J.-M.; Messaoudene, S.; Van Thourhout, D.; Roelkens, G.; de Valicourt, G.; Lelarge, F.; Poingt, F.; Jany, C.; Keyvaninia, S.;
2012 / IEEE
By: Zongqiang Chen; Qian Sun; Jingjun Xu; Zhiqiang Hao; Wenqiang Lu; Deng Pan; Yudong Li; Jing Chen;
By: Zongqiang Chen; Qian Sun; Jingjun Xu; Zhiqiang Hao; Wenqiang Lu; Deng Pan; Yudong Li; Jing Chen;
2012 / IEEE
By: Selvaraja, S.; Subramanian, A.Z.; Baets, R.; Komorowska, K.; Dhakal, A.; Verheyen, P.;
By: Selvaraja, S.; Subramanian, A.Z.; Baets, R.; Komorowska, K.; Dhakal, A.; Verheyen, P.;
2009 / IEEE / 978-1-4577-0493-2
By: Poivey, C.; Sorensen, R.H.; Beaumel, M.; Beutier, T.; Montay, G.; Binois, C.; Salvaterra, G.; Mangeret, R.; Weller, R.A.; Mendenhall, M.H.; Peyre, D.;
By: Poivey, C.; Sorensen, R.H.; Beaumel, M.; Beutier, T.; Montay, G.; Binois, C.; Salvaterra, G.; Mangeret, R.; Weller, R.A.; Mendenhall, M.H.; Peyre, D.;
2011 / IEEE / 978-1-4577-0378-2
By: Wang, C.-J.; Shih, M.H.; Hsu, T.M.; Chen, W.-Y.; Chyi, J.-I.; Tseng, Y.C.;
By: Wang, C.-J.; Shih, M.H.; Hsu, T.M.; Chen, W.-Y.; Chyi, J.-I.; Tseng, Y.C.;
2011 / IEEE / 978-1-4577-0536-6
By: Xuesong Suo; Meng Zhang; Jiejing Li; Zhenjiang Cai; Delong Zhang; Dening Zhang;
By: Xuesong Suo; Meng Zhang; Jiejing Li; Zhenjiang Cai; Delong Zhang; Dening Zhang;
2011 / IEEE / 978-1-4577-0811-4
By: Egea, F.J.; Blasco, J.M.; Barrientos, D.; Sanchis, E.; Gonzalez, V.; Carrio, F.;
By: Egea, F.J.; Blasco, J.M.; Barrientos, D.; Sanchis, E.; Gonzalez, V.; Carrio, F.;
2011 / IEEE / 978-1-4244-8340-2
By: De Koninck, Y.; Vermeulen, D.; Roelkens, G.; Baets, R.; Bogaerts, W.; Lambert, E.; Li, Y.;
By: De Koninck, Y.; Vermeulen, D.; Roelkens, G.; Baets, R.; Bogaerts, W.; Lambert, E.; Li, Y.;
2011 / IEEE / 978-1-4244-8340-2
By: Poulios, K.; Peruzzo, A.; Politi, A.; Laing, A.; Matthews, J.C.F.; Meinecke, J.; O'Brien, J.L.; Thompson, M.G.; Rudolph, T.; Lobino, M.; Fry, D.;
By: Poulios, K.; Peruzzo, A.; Politi, A.; Laing, A.; Matthews, J.C.F.; Meinecke, J.; O'Brien, J.L.; Thompson, M.G.; Rudolph, T.; Lobino, M.; Fry, D.;
2011 / IEEE / 978-1-55752-932-9
By: Tillack, B.; Tian, H.; Winzer, G.; Zimmermann, L.; Voigt, K.; Petermann, K.;
By: Tillack, B.; Tian, H.; Winzer, G.; Zimmermann, L.; Voigt, K.; Petermann, K.;
2011 / IEEE / 978-1-4244-8340-2
By: Tekin, T.; Galan, J.V.; Sanchis, P.; Llopis, M.; Brimont, A.; Preve, G.B.;
By: Tekin, T.; Galan, J.V.; Sanchis, P.; Llopis, M.; Brimont, A.; Preve, G.B.;
2011 / IEEE / 978-1-4244-8340-2
By: Thacker, H.; Shubin, I.; Guoliang Li; Xuezhe Zheng; Ying Luo; Krishnamoorthy, A.V.; Jin Yao; Cunningham, J.E.; Raj, K.;
By: Thacker, H.; Shubin, I.; Guoliang Li; Xuezhe Zheng; Ying Luo; Krishnamoorthy, A.V.; Jin Yao; Cunningham, J.E.; Raj, K.;
2011 / IEEE / 978-1-4244-8939-8
By: Zhang, M.; Lipson, M.; McEuen, P.; Barnard, A.W.; Manipatruni, S.; Wiederhecker, G.S.;
By: Zhang, M.; Lipson, M.; McEuen, P.; Barnard, A.W.; Manipatruni, S.; Wiederhecker, G.S.;
2011 / IEEE / 978-4-8634-8182-4
By: Inoue, J.; Ura, S.; Awatsuji, Y.; Nishio, K.; Kintaka, K.; Ogura, T.;
By: Inoue, J.; Ura, S.; Awatsuji, Y.; Nishio, K.; Kintaka, K.; Ogura, T.;
2011 / IEEE / 978-4-8634-8182-4
By: Sugimoto, Y.; Ikeda, N.; Hayashi, T.; Wakayama, Y.; Takamasu, T.; Mitsui, T.; Onodera, T.; Oikawa, H.;
By: Sugimoto, Y.; Ikeda, N.; Hayashi, T.; Wakayama, Y.; Takamasu, T.; Mitsui, T.; Onodera, T.; Oikawa, H.;
2011 / IEEE / 978-4-8634-8182-4
By: Inoue, J.; Majima, T.; Ura, S.; Awatsuji, Y.; Nishio, K.; Kintaka, K.; Hatanaka, K.;
By: Inoue, J.; Majima, T.; Ura, S.; Awatsuji, Y.; Nishio, K.; Kintaka, K.; Hatanaka, K.;
2011 / IEEE / 978-1-4244-8939-8
By: Gopal, A.V.; Vengurlekar, A.S.; Purandare, R.G.; Garde, C.S.; Patil, R.; Patil, A.; Modak, S.;
By: Gopal, A.V.; Vengurlekar, A.S.; Purandare, R.G.; Garde, C.S.; Patil, R.; Patil, A.; Modak, S.;
2011 / IEEE / 978-1-4244-8939-8
By: Liow, T.; Lim, A.E.; Novack, A.; Li He; Harris, N.C.; Streshinsky, M.; Teo, S.H.; Jing Li; Pinguet, T.; Baehr-Jones, T.; Ran Ding; Hochberg, M.; Guo-Qiang Lo;
By: Liow, T.; Lim, A.E.; Novack, A.; Li He; Harris, N.C.; Streshinsky, M.; Teo, S.H.; Jing Li; Pinguet, T.; Baehr-Jones, T.; Ran Ding; Hochberg, M.; Guo-Qiang Lo;
2011 / IEEE / 978-1-4577-2037-6
By: Patil, R.; Patil, A.; Modak, S.; Purandare, R.G.; Gopal, A.V.; Vengurlekar, A.S.; Garde, C.S.;
By: Patil, R.; Patil, A.; Modak, S.; Purandare, R.G.; Gopal, A.V.; Vengurlekar, A.S.; Garde, C.S.;
Low loss coupling to sub-micron thin film deposited rib and nanowire waveguides by vertical tapering
2011 / IEEE / 978-0-9775657-8-8By: Debbarma, S.; Jin, Z.; Madden, S.; Luther-Davies, B.; Bulla, D.;
2012 / IEEE / 978-1-55752-935-1
By: Miyoshi, Y.; Guoxiu Huang; Kitayama, K.; Maruta, A.; Yoshida, Y.;
By: Miyoshi, Y.; Guoxiu Huang; Kitayama, K.; Maruta, A.; Yoshida, Y.;
2011 / IEEE / 978-0-9775657-8-8
By: Huntoon, N.; Jiyoung Kim; Hunt, L.R.; Evans, G.A.; Nagdi, A.E.; Christensen, M.P.; MacFarlane, D.L.; Sultana, N.; Dabkowski, M.; Ramakrishna, V.; Ke Liu; LaFave, T.P.; Kirk, J.; Kim, T.W.;
By: Huntoon, N.; Jiyoung Kim; Hunt, L.R.; Evans, G.A.; Nagdi, A.E.; Christensen, M.P.; MacFarlane, D.L.; Sultana, N.; Dabkowski, M.; Ramakrishna, V.; Ke Liu; LaFave, T.P.; Kirk, J.; Kim, T.W.;
2011 / IEEE / 978-0-9775657-8-8
By: Marshall, G.D.; Jovanovic, N.; Qiang Liu; Meany, T.; Withford, M.J.; Steel, M.J.;
By: Marshall, G.D.; Jovanovic, N.; Qiang Liu; Meany, T.; Withford, M.J.; Steel, M.J.;
2012 / IEEE / 978-1-4577-1619-5
By: Chen, R.T.; Tutuc, E.; Fallahazad, B.; Kwong, D.N.; Jaehyun Ahn; Hosseini, A.; Yang Zhang;
By: Chen, R.T.; Tutuc, E.; Fallahazad, B.; Kwong, D.N.; Jaehyun Ahn; Hosseini, A.; Yang Zhang;
2012 / IEEE / 978-1-4577-1619-5
By: Atsumi, Y.; Nishikawa, Y.; JoonHyun Kang; Arai, S.; Nishiyama, N.; Amemiya, T.; Oda, M.;
By: Atsumi, Y.; Nishikawa, Y.; JoonHyun Kang; Arai, S.; Nishiyama, N.; Amemiya, T.; Oda, M.;
2012 / IEEE / 978-1-4577-1619-5
By: Ying Luo; Thacker, H.; Xuezhe Zheng; Guoliang Li; Shubin, I.; Jin-Hyoung Lee; Jin Yao; Krishnamoorthy, A.V.; Cunningham, J.E.; Raj, K.;
By: Ying Luo; Thacker, H.; Xuezhe Zheng; Guoliang Li; Shubin, I.; Jin-Hyoung Lee; Jin Yao; Krishnamoorthy, A.V.; Cunningham, J.E.; Raj, K.;