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Topic: Optical Buffering
Results
2012 / IEEE
By: Satter, M.M.; Yoder, P.D.; Dupuis, R.D.; Shyh-Chiang Shen; Jae-Hyun Ryou; Lochner, Z.; Hee-Jin Kim;
By: Satter, M.M.; Yoder, P.D.; Dupuis, R.D.; Shyh-Chiang Shen; Jae-Hyun Ryou; Lochner, Z.; Hee-Jin Kim;
2012 / IEEE
By: Andriolli, N.; Pinna, S.; Bontempi, F.; Contestabile, G.; Bolk, J.; Leijtens, X.J.M.; Bogoni, A.;
By: Andriolli, N.; Pinna, S.; Bontempi, F.; Contestabile, G.; Bolk, J.; Leijtens, X.J.M.; Bogoni, A.;
2012 / IEEE
By: Ahn, J.H.; Schreiber, R.; Muralimanohar, N.; McLaren, M.; Jouppi, N.; Davis, A.; Binkert, N.;
By: Ahn, J.H.; Schreiber, R.; Muralimanohar, N.; McLaren, M.; Jouppi, N.; Davis, A.; Binkert, N.;
2012 / IEEE
By: Zhang, F.; Wilkinson, T.D.; Elmirghani, J.M.H.; Crossland, W.A.; Pranggono, B.; Chou, H.-H.;
By: Zhang, F.; Wilkinson, T.D.; Elmirghani, J.M.H.; Crossland, W.A.; Pranggono, B.; Chou, H.-H.;
2012 / IEEE
By: Xiaobin Hong; Jian Wu; Tsuritani, T.; Yawei Yin; Jintong Lin; Hongxiang Guo; Lei Liu; Suzuki, M.;
By: Xiaobin Hong; Jian Wu; Tsuritani, T.; Yawei Yin; Jintong Lin; Hongxiang Guo; Lei Liu; Suzuki, M.;
2012 / IEEE
By: Akella, V.; Nitta, C.; Xiaohui Ye; Runxiang Yu; Yawei Yin; Proietti, R.; Yoo, S.J.B.;
By: Akella, V.; Nitta, C.; Xiaohui Ye; Runxiang Yu; Yawei Yin; Proietti, R.; Yoo, S.J.B.;
2012 / IEEE
By: Gorecki, C.; Galliou, S.; Chutani, R.; Passilly, N.; Giordano, V.; Abbe, P.; Xiaochi Liu; Boudot, R.;
By: Gorecki, C.; Galliou, S.; Chutani, R.; Passilly, N.; Giordano, V.; Abbe, P.; Xiaochi Liu; Boudot, R.;
2011 / IEEE / 978-1-4244-5731-1
By: Segawa, T.; Urata, R.; Nakahara, T.; Takahashi, R.; Suzaki, Y.; Takenouchi, H.;
By: Segawa, T.; Urata, R.; Nakahara, T.; Takahashi, R.; Suzaki, Y.; Takenouchi, H.;
2011 / IEEE / 978-1-4244-8456-0
By: Klinkowski, M.; Perello, J.; Pedroso, P.; Sole-Pareta, J.; Spadaro, S.; Careglio, D.;
By: Klinkowski, M.; Perello, J.; Pedroso, P.; Sole-Pareta, J.; Spadaro, S.; Careglio, D.;
2011 / IEEE / 978-1-61284-878-5
By: Geum-Yoon Oh; Tae-Kyeong Lee; Hong-Seung Kim; Young-Wan Choi; Doo-Gun Kim;
By: Geum-Yoon Oh; Tae-Kyeong Lee; Hong-Seung Kim; Young-Wan Choi; Doo-Gun Kim;
2011 / IEEE / 978-1-4577-0336-2
By: Deleglise, S.; Kippenberg, T.J.; Schliesser, A.; Riviere, R.; Gavartin, E.; Verhagen, E.; Weis, S.;
By: Deleglise, S.; Kippenberg, T.J.; Schliesser, A.; Riviere, R.; Gavartin, E.; Verhagen, E.; Weis, S.;
2011 / IEEE / 978-1-4244-8161-3
By: Zhang Xiaofei; Han Yongwen; Meng Xianwei; Shi Yanxin; Zhang Qing; Hao Wenjie;
By: Zhang Xiaofei; Han Yongwen; Meng Xianwei; Shi Yanxin; Zhang Qing; Hao Wenjie;
2011 / IEEE / 978-1-55752-932-9
By: Yoo, S.J.B.; Akella, V.; Xiaohui Ye; Yawei Yin; Shuang Yin; Runxiang Yu; Proietti, R.;
By: Yoo, S.J.B.; Akella, V.; Xiaohui Ye; Yawei Yin; Shuang Yin; Runxiang Yu; Proietti, R.;
2011 / IEEE / 978-1-55752-932-9
By: Urata, R.; Suzaki, Y.; Nakahara, T.; Takahashi, R.; Ishikawa, H.; Segawa, T.;
By: Urata, R.; Suzaki, Y.; Nakahara, T.; Takahashi, R.; Ishikawa, H.; Segawa, T.;
2011 / IEEE / 978-1-4577-1362-0
By: Kojima, M.; Nogawa, K.; Fukuda, T.; Arai, F.; Homma, M.; Nakajima, M.;
By: Kojima, M.; Nogawa, K.; Fukuda, T.; Arai, F.; Homma, M.; Nakajima, M.;
2011 / IEEE / 978-1-61284-264-6
By: Spirkova, J.; Huttel, I.; Strilek, E.; Prajzler, V.; Jerabek, V.;
By: Spirkova, J.; Huttel, I.; Strilek, E.; Prajzler, V.; Jerabek, V.;
2011 / IEEE / 978-4-8634-8182-4
By: Jizodo, M.; Hamamoto, K.; Matsuo, S.; Chaen, Y.; Hagio, T.; Tsuruda, K.; Haisong Jiang;
By: Jizodo, M.; Hamamoto, K.; Matsuo, S.; Chaen, Y.; Hagio, T.; Tsuruda, K.; Haisong Jiang;
2011 / IEEE / 978-1-4244-8939-8
By: Leon-Garcia, A.; Rusch, L.A.; LaRochelle, S.; Khavari, K.; Rastegarfar, H.;
By: Leon-Garcia, A.; Rusch, L.A.; LaRochelle, S.; Khavari, K.; Rastegarfar, H.;
2011 / IEEE / 978-1-4244-8939-8
By: Xu, Q.; Ghazisaeidi, A.; Ben M'Sallem, Y.; Leon-Garcia, A.; LaRochelle, S.; Rusch, L.A.; Rastegarfar, H.;
By: Xu, Q.; Ghazisaeidi, A.; Ben M'Sallem, Y.; Leon-Garcia, A.; LaRochelle, S.; Rusch, L.A.; Rastegarfar, H.;
2011 / IEEE / 978-1-4244-8939-8
By: Contestabile, G.; Serafino, G.; Berrettini, G.; Scotti, F.; Bogoni, A.;
By: Contestabile, G.; Serafino, G.; Berrettini, G.; Scotti, F.; Bogoni, A.;
2011 / IEEE / 978-1-4244-8939-8
By: Yokoyama, M.; Younghyun Kim; Takagi, S.; Takenaka, M.; Taoka, N.;
By: Yokoyama, M.; Younghyun Kim; Takagi, S.; Takenaka, M.; Taoka, N.;
2011 / IEEE / 978-1-4244-8939-8
By: Garg, A.S.; Wenjia Zhang; Bergman, K.; Jintong Lin; Jian Wu; Lai, C.P.; Wang, H.;
By: Garg, A.S.; Wenjia Zhang; Bergman, K.; Jintong Lin; Jian Wu; Lai, C.P.; Wang, H.;
Functional super Read-Out Driver demonstrator for the Phase II Upgrade of the ATLAS Tile Calorimeter
2011 / IEEE / 978-1-4673-0120-6By: Ferrer, A.; Solans, C.; Castillo, V.; Carrio, F.; Valls, J.; Valero, A.; Fiorini, L.; Sanchis, E.; Moreno, P.; Higon, E.; Hernandez, Y.; Gonzalez, V.;
2011 / IEEE / 978-1-4577-1516-7
By: Nogawa, K.; Kojima, M.; Nakajima, M.; Homma, M.; Arai, F.; Fukuda, T.;
By: Nogawa, K.; Kojima, M.; Nakajima, M.; Homma, M.; Arai, F.; Fukuda, T.;
2011 / IEEE / 978-1-4244-9268-8
By: Ikeda, N.; Terada, K.; Uzawa, H.; Shibata, T.; Urano, M.; Miyazaki, A.;
By: Ikeda, N.; Terada, K.; Uzawa, H.; Shibata, T.; Urano, M.; Miyazaki, A.;
2011 / IEEE / 978-1-4673-0120-6
By: Kiessling, F.; Salomon, A.; Solf, T.; Lerche, C.W.; Goldschmidt, B.; Schulz, V.;
By: Kiessling, F.; Salomon, A.; Solf, T.; Lerche, C.W.; Goldschmidt, B.; Schulz, V.;