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Topic: Observatories
Results
2006 / IEEE / 978-3-9805741-8-1
By: Lemanski, D.; Foks, A.; Nogas, P.; Lewandowski, W.; Nawrocki, J.;
By: Lemanski, D.; Foks, A.; Nogas, P.; Lewandowski, W.; Nawrocki, J.;
2011 / IEEE / 978-1-4577-0917-3
By: Garnica, J.J.; Moreno, V.; Morato, D.; Magana, E.; Gomez-Arribas, F.J.; Izal, M.; Aracil, J.; Gonzalez, I.; Lopez-Buedo, S.;
By: Garnica, J.J.; Moreno, V.; Morato, D.; Magana, E.; Gomez-Arribas, F.J.; Izal, M.; Aracil, J.; Gonzalez, I.; Lopez-Buedo, S.;
2011 / IEEE / 978-1-4577-0088-0
By: Toma, D.M.; del Rio, J.; Edgington, D.; Headley, K.L.; Manuel, A.; Broring, A.H.; O'reilly, T.C.;
By: Toma, D.M.; del Rio, J.; Edgington, D.; Headley, K.L.; Manuel, A.; Broring, A.H.; O'reilly, T.C.;
2011 / IEEE / 978-1-4577-0088-0
By: Edgington, D.; Broring, A.; Manuel, A.; Headley, K.; del Rio, J.; O'Reilly, T.; Toma, D.M.;
By: Edgington, D.; Broring, A.; Manuel, A.; Headley, K.; del Rio, J.; O'Reilly, T.; Toma, D.M.;
2011 / IEEE / 978-1-4244-6051-9
By: Messina, F.; Gaudiomonte, F.; Bolli, P.; Ambrosini, R.; Roma, M.;
By: Messina, F.; Gaudiomonte, F.; Bolli, P.; Ambrosini, R.; Roma, M.;
2011 / IEEE / 978-1-4244-6051-9
By: Rowland, D.E.; Pfaff, R.F.; Seker, I.; Klenzing, J.H.; Mathews, J.D.; Fung, S.F.;
By: Rowland, D.E.; Pfaff, R.F.; Seker, I.; Klenzing, J.H.; Mathews, J.D.; Fung, S.F.;
2011 / IEEE / 978-1-4244-6051-9
By: Wilson, T.L.; Weiler, K.W.; Pospieszalski, M.; Kutz, C.; Durand, S.; Clarke, T.E.; Owen, F.N.; Hicks, B.C.; Kassim, N.E.; Perley, R.A.;
By: Wilson, T.L.; Weiler, K.W.; Pospieszalski, M.; Kutz, C.; Durand, S.; Clarke, T.E.; Owen, F.N.; Hicks, B.C.; Kassim, N.E.; Perley, R.A.;
2011 / IEEE / 978-1-4244-6051-9
By: Ngwira, C.; Ssessanga, N.; Habarulema, J.B.; Athieno, R.; McKinnell, L.;
By: Ngwira, C.; Ssessanga, N.; Habarulema, J.B.; Athieno, R.; McKinnell, L.;
2011 / IEEE / 978-1-4244-6051-9
By: Benson, R.F.; Galkin, I.A.; Xi Shao; Garcia, L.N.; Bilitza, D.; Fung, S.F.;
By: Benson, R.F.; Galkin, I.A.; Xi Shao; Garcia, L.N.; Bilitza, D.; Fung, S.F.;
2011 / IEEE / 978-1-4244-6051-9
By: Rodger, C.J.; Dietrich, S.; Raita, T.; Bortnik, J.; Clilverd, M.A.;
By: Rodger, C.J.; Dietrich, S.; Raita, T.; Bortnik, J.; Clilverd, M.A.;
2011 / IEEE / 978-1-4244-6051-9
By: Roshi, D.A.; Bloss, M.; Whitehead, M.; Werthimer, D.; Watts, G.; Wagner, M.; Siemion, A.; Shelton, A.; Scott, S.; Ray, J.; O'Neil, K.; Molera, G.; McCullough, R.; Masters, J.; Mallard, B.; Jones, G.; Gowda, S.; Garwood, R.; Frayer, D.; Ford, J.; Fisher, R.J.; Brandt, P.; Bussa, S.; Hong Chen; Demorest, P.; Desvignes, G.; Filiba, T.;
By: Roshi, D.A.; Bloss, M.; Whitehead, M.; Werthimer, D.; Watts, G.; Wagner, M.; Siemion, A.; Shelton, A.; Scott, S.; Ray, J.; O'Neil, K.; Molera, G.; McCullough, R.; Masters, J.; Mallard, B.; Jones, G.; Gowda, S.; Garwood, R.; Frayer, D.; Ford, J.; Fisher, R.J.; Brandt, P.; Bussa, S.; Hong Chen; Demorest, P.; Desvignes, G.; Filiba, T.;
2011 / IEEE / 978-1-4244-6051-9
By: Zinchenko, I.I.; Shanin, G.I.; Kardashev, N.S.; Artemenko, Yu.N.;
By: Zinchenko, I.I.; Shanin, G.I.; Kardashev, N.S.; Artemenko, Yu.N.;
2011 / IEEE / 978-1-4244-6051-9
By: Kuno, N.; Takano, S.; Yonezu, T.; Takahashi, S.; Saito, Y.; Onodera, S.; Ogawa, H.; Muraoka, K.; Miyazawa, K.; Miyazawa, C.; Mikoshiba, H.; Maekawa, J.; Kohno, K.; Kimura, K.; Kawabe, R.; Kawaguchi, N.; Kaneko, H.; Ishikawa, S.; Iono, D.; Nakajima, T.; Iwashita, H.; Handa, K.; Hatsukade, B.; Higuchi, A.; Hirota, A.;
By: Kuno, N.; Takano, S.; Yonezu, T.; Takahashi, S.; Saito, Y.; Onodera, S.; Ogawa, H.; Muraoka, K.; Miyazawa, K.; Miyazawa, C.; Mikoshiba, H.; Maekawa, J.; Kohno, K.; Kimura, K.; Kawabe, R.; Kawaguchi, N.; Kaneko, H.; Ishikawa, S.; Iono, D.; Nakajima, T.; Iwashita, H.; Handa, K.; Hatsukade, B.; Higuchi, A.; Hirota, A.;
2011 / IEEE / 978-966-335-357-9
By: Berezhnoi, A.A.; Volvach, A.E.; Volvach, L.N.; Volvach, E.A.; Strepka, I.D.;
By: Berezhnoi, A.A.; Volvach, A.E.; Volvach, L.N.; Volvach, E.A.; Strepka, I.D.;
2011 / IEEE / 978-0-933957-39-8
By: Jiguang Yue; Xiaotong Peng; Huaiyang Zhou; Feng Lu; Bangchun Wu; Bin He;
By: Jiguang Yue; Xiaotong Peng; Huaiyang Zhou; Feng Lu; Bangchun Wu; Bin He;
2011 / IEEE / 978-0-933957-39-8
By: Lowings, M.; Bornhold, B.D.; Fissel, D.; McLean, S.; Taylor, S.M.;
By: Lowings, M.; Bornhold, B.D.; Fissel, D.; McLean, S.; Taylor, S.M.;
2011 / IEEE / 978-0-933957-39-8
By: Stuebe, D.; Mueller, C.; Farcas, C.; Vernon, F.; Schofield, O.; Orcutt, J.; Manning, M.; Krueger, I.; Meisinger, M.; Graybeal, J.; Farcas, E.; Chave, A.; Arrott, M.; Ampe, T.;
By: Stuebe, D.; Mueller, C.; Farcas, C.; Vernon, F.; Schofield, O.; Orcutt, J.; Manning, M.; Krueger, I.; Meisinger, M.; Graybeal, J.; Farcas, E.; Chave, A.; Arrott, M.; Ampe, T.;
2011 / IEEE / 978-0-933957-39-8
By: Rufu Qin; Changwei Xu; Huiping Xu; Yanwei Zhang; Shangqin Luo; Yang Yu;
By: Rufu Qin; Changwei Xu; Huiping Xu; Yanwei Zhang; Shangqin Luo; Yang Yu;
2011 / IEEE / 978-1-4577-1498-6
By: Sijakov, D.; Andelkovic, A.; Andelic, T.; Davidovic, M.; Zivkov, D.;
By: Sijakov, D.; Andelkovic, A.; Andelic, T.; Davidovic, M.; Zivkov, D.;
2011 / IEEE / 978-1-4577-2163-2
By: Le Blanc, A.; Fellows, D.; Csillaghy, A.; Brooke, J.; Messerotti, M.; Soldati, M.; Bentley, R.; Pierantoni, G.; Perez-Suarez, D.;
By: Le Blanc, A.; Fellows, D.; Csillaghy, A.; Brooke, J.; Messerotti, M.; Soldati, M.; Bentley, R.; Pierantoni, G.; Perez-Suarez, D.;
2012 / IEEE / 978-1-4577-2091-8
By: Chen, Ying; Song, Hong; Qu, Fengzhong; Xie, Yingjun; Lan, Ruihong; Yue, Yeqing;
By: Chen, Ying; Song, Hong; Qu, Fengzhong; Xie, Yingjun; Lan, Ruihong; Yue, Yeqing;
2012 / IEEE / 978-1-4577-2091-8
By: Chan, Hsiang-Chih; Chang, Ray-I; Chen, Chi-Fang; Lin, Tzu-Wei; Hsiao, Nai-Chi; Lu, Pei-Ling; Kuo, Kai-Wen; Shin, Tzay-Chyn; Chou, Lien-Siang; Yang, Yiing-Jang; Wei, Ruey-Chang; Wang, Chau-Chang; Jan, Sen; Tang, Tswen-Yung;
By: Chan, Hsiang-Chih; Chang, Ray-I; Chen, Chi-Fang; Lin, Tzu-Wei; Hsiao, Nai-Chi; Lu, Pei-Ling; Kuo, Kai-Wen; Shin, Tzay-Chyn; Chou, Lien-Siang; Yang, Yiing-Jang; Wei, Ruey-Chang; Wang, Chau-Chang; Jan, Sen; Tang, Tswen-Yung;
2012 / IEEE / 978-1-4577-2091-8
By: Kaneda, Yoshiyuki; Kawaguchi, Katsuyoshi; Takahashi, Narumi; Baba, Eiichiro Araki Toshitaka;
By: Kaneda, Yoshiyuki; Kawaguchi, Katsuyoshi; Takahashi, Narumi; Baba, Eiichiro Araki Toshitaka;
2014 / IEEE
By: Craig, Bruce; Ramnath, Rajiv; Venkatachalm, Ramiya; Xu, Zhe; Ramanathan, Jayashree; Paider, Tara;
By: Craig, Bruce; Ramnath, Rajiv; Venkatachalm, Ramiya; Xu, Zhe; Ramanathan, Jayashree; Paider, Tara;
2014 / IEEE
By: Sato, Makoto; Kondo, Hayato; Matsumoto, Yohei; Osakabe, Masahiro; Withamana, Acta; Hotta, Takeo;
By: Sato, Makoto; Kondo, Hayato; Matsumoto, Yohei; Osakabe, Masahiro; Withamana, Acta; Hotta, Takeo;
2014 / IEEE
By: Dana, D. R.; Broring, A.; O'Reilly, T. C.; Toma, D. M.; Bache, F.; Edgington, D. R.; Manuel-Lazaro, A.; Headley, K. L.; del Rio, J.;
By: Dana, D. R.; Broring, A.; O'Reilly, T. C.; Toma, D. M.; Bache, F.; Edgington, D. R.; Manuel-Lazaro, A.; Headley, K. L.; del Rio, J.;
2014 / IEEE
By: Gomez, Carlos A.; Cifuentes, Juan; Hughes, John A.; Thibaudeau, Brian; Alfonzo, Agustin J.; Wasiak, Francis;
By: Gomez, Carlos A.; Cifuentes, Juan; Hughes, John A.; Thibaudeau, Brian; Alfonzo, Agustin J.; Wasiak, Francis;