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Topic: Moon
Results
2012 / IEEE
By: Kobayashi, T.; Ono, T.; Yamaji, A.; Yamaguchi, Y.; Oya, H.; Oshigami, S.; Nakagawa, H.; Kumamoto, A.; Seung Ryeol Lee; Jung-Ho Kim;
By: Kobayashi, T.; Ono, T.; Yamaji, A.; Yamaguchi, Y.; Oya, H.; Oshigami, S.; Nakagawa, H.; Kumamoto, A.; Seung Ryeol Lee; Jung-Ho Kim;
2012 / IEEE
By: Ming Chen; Qinghui Liu; Guolong He; Kawano, N.; Matsumoto, K.; Hanada, H.; Iwata, T.;
By: Ming Chen; Qinghui Liu; Guolong He; Kawano, N.; Matsumoto, K.; Hanada, H.; Iwata, T.;
2012 / IEEE
By: Barlow, M.; Dai, F.; Blalock, B.; Garbos, R.; Berger, R.; Mantooth, A.; Reed, R.; Alles, M.; Ramachandran, V.; Cressler, J.D.; Kenyon, E.W.; Diestelhorst, R.M.; England, T.D.; Eckert, C.; Frampton, R.; Peltz, L.; Mojarradi, M.; McCluskey, P.; Webber, C.; Holmes, J.; Ellis, C.; Johnson, W.;
By: Barlow, M.; Dai, F.; Blalock, B.; Garbos, R.; Berger, R.; Mantooth, A.; Reed, R.; Alles, M.; Ramachandran, V.; Cressler, J.D.; Kenyon, E.W.; Diestelhorst, R.M.; England, T.D.; Eckert, C.; Frampton, R.; Peltz, L.; Mojarradi, M.; McCluskey, P.; Webber, C.; Holmes, J.; Ellis, C.; Johnson, W.;
2011 / IEEE / 978-1-61284-385-8
By: Dettmann, A.; Kirchner, F.; Cordes, F.; Wenzel, W.; Zhuowei Wang;
By: Dettmann, A.; Kirchner, F.; Cordes, F.; Wenzel, W.; Zhuowei Wang;
2011 / IEEE / 978-1-61284-385-8
By: Shankar, K.; Whittaker, W.; Moidel, J.; Jones, H.; Peterson, K.;
By: Shankar, K.; Whittaker, W.; Moidel, J.; Jones, H.; Peterson, K.;
2011 / IEEE / 978-1-4577-1005-6
By: Wenny, B.N.; Xiaoxiong Xiong; Salomonson, V.; Barnes, W.; Angal, A.;
By: Wenny, B.N.; Xiaoxiong Xiong; Salomonson, V.; Barnes, W.; Angal, A.;
2011 / IEEE / 978-1-4577-1005-6
By: Li, S.X.; Krebs, D.; Novo-Gradac, A.M.; Shaw, G.B.; Yu, A.W.; Ramos-Izquierdo, L.; Unger, G.; Lukemire, A.; Cavanaugh, J.; Rosanova, A.; Guzek, J.;
By: Li, S.X.; Krebs, D.; Novo-Gradac, A.M.; Shaw, G.B.; Yu, A.W.; Ramos-Izquierdo, L.; Unger, G.; Lukemire, A.; Cavanaugh, J.; Rosanova, A.; Guzek, J.;
2011 / IEEE / 978-1-4577-1005-6
By: Butler, J.; Schwaller, M.; Mclntire, J.; Kwo-Fu Chiang; Xiaoxiong Xiong;
By: Butler, J.; Schwaller, M.; Mclntire, J.; Kwo-Fu Chiang; Xiaoxiong Xiong;
2011 / IEEE / 978-1-4244-6051-9
By: Tsunakawa, H.; Saito, Y.; Nishino, M.N.; Ono, T.; Kojima, H.; Kasahara, Y.; Omura, Y.; Hashimoto, K.; Goto, Y.; Kitaguchi, S.;
By: Tsunakawa, H.; Saito, Y.; Nishino, M.N.; Ono, T.; Kojima, H.; Kasahara, Y.; Omura, Y.; Hashimoto, K.; Goto, Y.; Kitaguchi, S.;
URSI-Istanbul: Precision radio science for planetary gravity, atmospheric and surface investigations
2011 / IEEE / 978-1-4244-6051-9By: Asmar, S.W.;
2011 / IEEE / 978-1-4577-1873-1
By: Solomonidou, A.; Bampasidis, G.; Coustenis, A.; Hirtzig, M.; Preka-Papadema, P.; Moussas, X.; Kyriakopoulos, K.; Bratsolis, E.;
By: Solomonidou, A.; Bampasidis, G.; Coustenis, A.; Hirtzig, M.; Preka-Papadema, P.; Moussas, X.; Kyriakopoulos, K.; Bratsolis, E.;
2011 / IEEE / 978-1-4577-1497-9
By: Ya'acob, N.; Yusof, A.L.; Ali, M.T.; Salleh, M.K.M.; Pasya, I.; Sharihuddin, S.Y.M.;
By: Ya'acob, N.; Yusof, A.L.; Ali, M.T.; Salleh, M.K.M.; Pasya, I.; Sharihuddin, S.Y.M.;
2011 / IEEE / 978-1-4244-9306-7
By: Zou Xiaoduan; Zhang Xiaoxia; Gao Xingye; Wang Fenfei; Lingli Mu; Liu Yuxuan; Weibin Wen; Jianjun Liu; Xin Ren; Jinchao Xia; Li Chunlai;
By: Zou Xiaoduan; Zhang Xiaoxia; Gao Xingye; Wang Fenfei; Lingli Mu; Liu Yuxuan; Weibin Wen; Jianjun Liu; Xin Ren; Jinchao Xia; Li Chunlai;
An intuitive software framework for visualizing the solar wind ion data from Chang'E-1 lunar orbiter
2011 / IEEE / 978-1-4244-9306-7By: Reme, H.; Xinyue Wang; Un-Hong Wong; Hon-Cheng Wong; Jixin Xiong;
2011 / IEEE / 978-1-4577-2163-2
By: Chen Zhong; Zheng Weimin; An Tao; Chen Xiao; Wang Weihua; Shu Fengchun; Wang Guangli;
By: Chen Zhong; Zheng Weimin; An Tao; Chen Xiao; Wang Weihua; Shu Fengchun; Wang Guangli;
2011 / IEEE / 978-1-4577-2141-0
By: Ning Lu; Floresca, H.C.; Kim, J.; Cha, D.K.; Park, S.Y.; Kim, M.J.; Wang, J.G.;
By: Ning Lu; Floresca, H.C.; Kim, J.; Cha, D.K.; Park, S.Y.; Kim, M.J.; Wang, J.G.;
2011 / IEEE / 978-1-4577-0586-1
By: Beck, P.; Hofstatter, C.; Reitz, G.; Berger, T.; Hajek, M.; Wind, M.; Latocha, M.; Zechner, A.; Rollet, S.;
By: Beck, P.; Hofstatter, C.; Reitz, G.; Berger, T.; Hajek, M.; Wind, M.; Latocha, M.; Zechner, A.; Rollet, S.;
2012 / IEEE / 978-1-4577-2120-5
By: Zhu Zhiyong; Li Xue; Yang Yikang; Lu Yi; Dong Guangliang; Li Haitao;
By: Zhu Zhiyong; Li Xue; Yang Yikang; Lu Yi; Dong Guangliang; Li Haitao;
2012 / IEEE / 978-1-4673-0884-7
By: Funaoi, H.; Hirashima, T.; Mizuta, Y.; Osada, T.; Nino, Y.; Ishida, K.; Moriyama, R.; Moriyama, S.; Sugihara, K.;
By: Funaoi, H.; Hirashima, T.; Mizuta, Y.; Osada, T.; Nino, Y.; Ishida, K.; Moriyama, R.; Moriyama, S.; Sugihara, K.;
2012 / IEEE / 978-1-4577-0557-1
By: Paulsen, G.; Zacny, K.; Pollard, W.; Marinova, M.; Mellerowicz, B.; Davila, A.; Glass, B.; McKay, C.; Craft, J.;
By: Paulsen, G.; Zacny, K.; Pollard, W.; Marinova, M.; Mellerowicz, B.; Davila, A.; Glass, B.; McKay, C.; Craft, J.;
2012 / IEEE / 978-1-4577-0557-1
By: Trebi-Ollennu, A.; Ali, K.S.; Alkalai, L.; Sirota, A.R.; Bonitz, R.G.; Hartman, F.; Jeng Yen; Wright, J.R.; Wolf, M.; Mojarradi, M.; Manohara, H.; Toda, R.; Alexander, D.A.; Deen, R.G.; Matthews, J.B.; Assad, C.; Tso, K.S.; Rankin, A.L.;
By: Trebi-Ollennu, A.; Ali, K.S.; Alkalai, L.; Sirota, A.R.; Bonitz, R.G.; Hartman, F.; Jeng Yen; Wright, J.R.; Wolf, M.; Mojarradi, M.; Manohara, H.; Toda, R.; Alexander, D.A.; Deen, R.G.; Matthews, J.B.; Assad, C.; Tso, K.S.; Rankin, A.L.;
2012 / IEEE / 978-1-4577-0557-1
By: Glavin, D.P.; Malespin, C.; Rice, J.W.; Bleacher, J.E.; Swindle, T.D.; Dworkin, J.P.; Kotecki, C.A.; Feng, S.H.; Mahaffy, P.R.; Southard, A.E.; Dobson, N.; Noreiga, M.; Franz, H.B.; Mumm, E.; Holmes, V.E.; Getty, S.A.; ten Kate, I.L.;
By: Glavin, D.P.; Malespin, C.; Rice, J.W.; Bleacher, J.E.; Swindle, T.D.; Dworkin, J.P.; Kotecki, C.A.; Feng, S.H.; Mahaffy, P.R.; Southard, A.E.; Dobson, N.; Noreiga, M.; Franz, H.B.; Mumm, E.; Holmes, V.E.; Getty, S.A.; ten Kate, I.L.;
2012 / IEEE / 978-1-4577-1318-7
By: Gaskill, D.K.; Antcliffe, M.; Moon, J.S.; Asbeck, P.; Lee, K.-M.; Campbell, P.M.; Seo, H.C.; Wong, D.; McCalla, K.; Milosavljevic, I.; Schmitz, A.; Lin, S.C.;
By: Gaskill, D.K.; Antcliffe, M.; Moon, J.S.; Asbeck, P.; Lee, K.-M.; Campbell, P.M.; Seo, H.C.; Wong, D.; McCalla, K.; Milosavljevic, I.; Schmitz, A.; Lin, S.C.;
2012 / IEEE / 978-1-4577-0557-1
By: Sarrazin, P.; Vaniman, D.; Taylor, J.; Bish, D.; Blake, D.; Chipera, S.;
By: Sarrazin, P.; Vaniman, D.; Taylor, J.; Bish, D.; Blake, D.; Chipera, S.;