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Topic: Microstructure
Results
2011 / IEEE
By: Ciersiang Chua; Lei Wang; Zhongxiang Shen; Soon Wee Ho; Min Tang; Aditya, S.; Tsai, J.M.;
By: Ciersiang Chua; Lei Wang; Zhongxiang Shen; Soon Wee Ho; Min Tang; Aditya, S.; Tsai, J.M.;
2011 / IEEE
By: Read, P.; McCormick, H.; Collins, M.N.; Osenbach, J.; Coyle, R.; Fleming, D.; Kummerl, S.; Reid, M.; Punch, J.; Popowich, R.;
By: Read, P.; McCormick, H.; Collins, M.N.; Osenbach, J.; Coyle, R.; Fleming, D.; Kummerl, S.; Reid, M.; Punch, J.; Popowich, R.;
2011 / IEEE
By: Jianmin Bai; Zhenghua Li; Fu Zheng; Yuanfu Lou; Fulin Wei; Kaiming Zhang; Hongjia Li; Hailong Xie; Dan Wei;
By: Jianmin Bai; Zhenghua Li; Fu Zheng; Yuanfu Lou; Fulin Wei; Kaiming Zhang; Hongjia Li; Hailong Xie; Dan Wei;
2011 / IEEE
By: Lee, H.Y.; Hsu, J.H.; Lin, H.M.; Yao, Y.D.; Mei, J.K.; Liao, W.M.; Yuan, F.T.; Sun, A.C.;
By: Lee, H.Y.; Hsu, J.H.; Lin, H.M.; Yao, Y.D.; Mei, J.K.; Liao, W.M.; Yuan, F.T.; Sun, A.C.;
2011 / IEEE
By: Jin, X.H.; Ge, H.L.; Jin, D.F.; Hong, B.; Wang, X.Q.; Xu, J.C.; Huang, B.; Chen, M.; Peng, X.L.;
By: Jin, X.H.; Ge, H.L.; Jin, D.F.; Hong, B.; Wang, X.Q.; Xu, J.C.; Huang, B.; Chen, M.; Peng, X.L.;
2011 / IEEE
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
By: Wasa, K.; Kalinin, S.V.; Jesse, S.; Jackson, T.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Dalong Zhao; Jousse, P.; Yaeger, C.; Griggio, F.;
2012 / IEEE
By: de Campos, M.F.; Monlevade, E.F.; Padovese, L.R.; Goldenstein, H.; Capo-Sanchez, J.; Franco, F.A.;
By: de Campos, M.F.; Monlevade, E.F.; Padovese, L.R.; Goldenstein, H.; Capo-Sanchez, J.; Franco, F.A.;
2011 / IEEE
By: Coste, P.; Brault, S.; Lefeuvre, E.; Fabbri, F.; Schelcher, G.; Parrain, F.; Dufour-Gergam, E.;
By: Coste, P.; Brault, S.; Lefeuvre, E.; Fabbri, F.; Schelcher, G.; Parrain, F.; Dufour-Gergam, E.;
2011 / IEEE
By: Schwaiger, A.; Hochstrasser, M.; Kowanda, C.; Grohs, C.; Plankensteiner, A.; Muller, F.E.H.;
By: Schwaiger, A.; Hochstrasser, M.; Kowanda, C.; Grohs, C.; Plankensteiner, A.; Muller, F.E.H.;
2012 / IEEE
By: Zhenghua Li; Hailong Xie; Yi Wang; Hongjia Li; Kaiming Zhang; Ying Wang; Dan Wei; Fulin Wei; Jianmin Bai; Jiangwei Cao;
By: Zhenghua Li; Hailong Xie; Yi Wang; Hongjia Li; Kaiming Zhang; Ying Wang; Dan Wei; Fulin Wei; Jianmin Bai; Jiangwei Cao;
2012 / IEEE
By: Weijun Tong; Guobin Ren; Xia Yu; Yong, D.; Huiyu Zhang; Huifeng Wei; Chi Chiu Chan; Ying Zhang;
By: Weijun Tong; Guobin Ren; Xia Yu; Yong, D.; Huiyu Zhang; Huifeng Wei; Chi Chiu Chan; Ying Zhang;
2012 / IEEE
By: Wank, M.A.; Smets, A.H.M.; van de Sanden, R.M.C.M.; Wronski, C.R.; Fischer, M.; Bobela, D.C.; Zeman, M.; van Swaaij, R.A.C.M.M.; Vet, B.;
By: Wank, M.A.; Smets, A.H.M.; van de Sanden, R.M.C.M.; Wronski, C.R.; Fischer, M.; Bobela, D.C.; Zeman, M.; van Swaaij, R.A.C.M.M.; Vet, B.;
2012 / IEEE
By: Grassi, A.; Parrino, L.; Rosso, V.; Bianchi, A.M.; Terzano, M.G.; Mendez, M.O.; Chouvarda, I.; Maglaveras, N.; Cerutti, S.;
By: Grassi, A.; Parrino, L.; Rosso, V.; Bianchi, A.M.; Terzano, M.G.; Mendez, M.O.; Chouvarda, I.; Maglaveras, N.; Cerutti, S.;
2012 / IEEE
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
By: Wasa, K.; Kotera, H.; Kanno, I.; Matsushima, T.; Yamamoto, T.; Nishida, K.; Adachi, H.;
2012 / IEEE
By: Chaofeng Lu; Sangid, M.D.; Yuhang Li; Rui Li; Yonggang Huang; Saeidpourazar, R.; Ferreira, P.M.; Rogers, J.A.;
By: Chaofeng Lu; Sangid, M.D.; Yuhang Li; Rui Li; Yonggang Huang; Saeidpourazar, R.; Ferreira, P.M.; Rogers, J.A.;
2010 / IEEE / 978-1-4244-5261-3
By: Ghane-golmohamadi, F.; Ghane-Motlagh, B.; Maleki-Jirsaraei, N.; Rouhani, S.; Ghane-Motlagh, R.;
By: Ghane-golmohamadi, F.; Ghane-Motlagh, B.; Maleki-Jirsaraei, N.; Rouhani, S.; Ghane-Motlagh, R.;
2011 / IEEE / 978-1-4244-7317-5
By: Qian Zhang; Norris, I.; Beamish, K.; Panoutsos, G.; Mahfouf, M.;
By: Qian Zhang; Norris, I.; Beamish, K.; Panoutsos, G.; Mahfouf, M.;
2011 / IEEE / 978-1-61284-795-5
By: Preobrazhenskii, V.V.; Semyagin, B.R.; Zaichenko, A.A.; Bert, N.A.; Chaldyshev, V.V.; Nevedomskii, V.N.; Putyato, M.A.;
By: Preobrazhenskii, V.V.; Semyagin, B.R.; Zaichenko, A.A.; Bert, N.A.; Chaldyshev, V.V.; Nevedomskii, V.N.; Putyato, M.A.;
2011 / IEEE / 978-1-4244-9439-2
By: Wu, T.; Yang, B.; Li, Z.G.; Chen, Y.M.; Zhang, G.D.; Yin, K.X.; Wang, R.; Wang, X.Y.; Tian, C.X.;
By: Wu, T.; Yang, B.; Li, Z.G.; Chen, Y.M.; Zhang, G.D.; Yin, K.X.; Wang, R.; Wang, X.Y.; Tian, C.X.;
On-chip fabrication and manipulation of hybrid-microstructure for improving manipulation performance
2011 / IEEE / 978-1-61284-385-8By: Nakajima, M.; Ito, M.; Fukuda, T.; Kojima, M.;
Geometric error analysis on OLED units' three-dimensional microstructure in ink-jet printing process
2011 / IEEE / 978-1-61284-486-2By: Liping Zhao; Yiyong Yao;