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Topic: Marine Vehicles
Results
2012 / IEEE
By: Giwoo Jeung; Sang Sik Jung; Chang-Seob Yang; Hyun-Ju Chung; Dong-Hun Kim; Nak-Sun Choi;
By: Giwoo Jeung; Sang Sik Jung; Chang-Seob Yang; Hyun-Ju Chung; Dong-Hun Kim; Nak-Sun Choi;
2012 / IEEE
By: Yoshida, K.; Kuwahara, T.; Okubo, M.; Yamamoto, T.; Kuroki, T.; Sato, K.; Hanamoto, K.;
By: Yoshida, K.; Kuwahara, T.; Okubo, M.; Yamamoto, T.; Kuroki, T.; Sato, K.; Hanamoto, K.;
2010 / IEEE / 978-1-61284-986-7
By: Wilson, W.; Gorski, J.; Kandasamy, M.; Takai, T.; Wei He; Stern, F.; Tahara, Y.;
By: Wilson, W.; Gorski, J.; Kandasamy, M.; Takai, T.; Wei He; Stern, F.; Tahara, Y.;
2010 / IEEE / 978-1-4244-8598-7
By: Yang Songlin; Wu Wei; Cui Jian; Chen Peng; Yuan Jingpin; Wang Pengyu;
By: Yang Songlin; Wu Wei; Cui Jian; Chen Peng; Yuan Jingpin; Wang Pengyu;
2011 / IEEE / 978-1-4577-0088-0
By: Teixido, M.; Siegentahler, C.; Tresanchez, M.; Font, D.; Palacin, J.; Pradalier, C.; Palleja, T.;
By: Teixido, M.; Siegentahler, C.; Tresanchez, M.; Font, D.; Palacin, J.; Pradalier, C.; Palleja, T.;
2011 / IEEE / 978-1-4577-0279-2
By: Srivastava, S.; Edrington, C.; Graber, L.; Nyanteh, Y.; Cartes, D.;
By: Srivastava, S.; Edrington, C.; Graber, L.; Nyanteh, Y.; Cartes, D.;
A multilevel approach to change detection for port surveillance with very high resolution SAR images
2011 / IEEE / 978-1-4577-1203-6By: Bruzzone, L.; Marin, C.; Bovolo, F.;
2011 / IEEE / 978-1-4577-0125-2
By: Bibuli, M.; Caccia, M.; Grati, A.; Fioravanti, S.; Djapic, V.; Bruzzone, G.;
By: Bibuli, M.; Caccia, M.; Grati, A.; Fioravanti, S.; Djapic, V.; Bruzzone, G.;
2011 / IEEE / 978-1-61284-943-0
By: Brousseau, C.; Zaharia, G.; Kdouh, H.; Grunfelder, G.; El Zein, G.;
By: Brousseau, C.; Zaharia, G.; Kdouh, H.; Grunfelder, G.; El Zein, G.;
2011 / IEEE / 978-1-4577-0088-0
By: Ryu, S.; Shiotani, S.; Shimada, Y.; Wakabayashi, N.; Makino, H.;
By: Ryu, S.; Shiotani, S.; Shimada, Y.; Wakabayashi, N.; Makino, H.;
2011 / IEEE / 978-1-4244-8115-6
By: Chen Cuihe; Bian Xinqian; Zhao Dongyan; Cai Lianbo; Xie Wenbo; Fu Mingyu;
By: Chen Cuihe; Bian Xinqian; Zhao Dongyan; Cai Lianbo; Xie Wenbo; Fu Mingyu;
2011 / IEEE / 978-1-4577-0088-0
By: Lawrence-Slavas, N.; Tagawa, D.; Stalin, S.; Meinig, C.; Hibbins, R.; Graham, D.; Lawson, R.A.; Ingham, B.;
By: Lawrence-Slavas, N.; Tagawa, D.; Stalin, S.; Meinig, C.; Hibbins, R.; Graham, D.; Lawson, R.A.; Ingham, B.;
2011 / IEEE / 978-1-4577-0088-0
By: Lopez, A.I.; Grana, M.A.; Blanco, F.; Ortega, A.; Gutierrez, M.A.;
By: Lopez, A.I.; Grana, M.A.; Blanco, F.; Ortega, A.; Gutierrez, M.A.;