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Topic: Lighting
Results
2011 / IEEE
By: Friederich, F.; Roskos, H.G.; Bauer, M.; Fanzhen Meng; Thomson, M.D.; Boppel, S.; Lisauskas, A.; Hils, B.; Krozer, V.; Keil, A.; Loffler, T.; Henneberger, R.; Huhn, A.K.; Spickermann, G.; Bolivar, P.H.; von Spiegel, W.;
By: Friederich, F.; Roskos, H.G.; Bauer, M.; Fanzhen Meng; Thomson, M.D.; Boppel, S.; Lisauskas, A.; Hils, B.; Krozer, V.; Keil, A.; Loffler, T.; Henneberger, R.; Huhn, A.K.; Spickermann, G.; Bolivar, P.H.; von Spiegel, W.;
2011 / IEEE
By: Ja Hoon Koo; Juree Hong; Sangwook Lee; Taeyoon Lee; Seongil Im; Kwanghyun Lee; Seulah Lee;
By: Ja Hoon Koo; Juree Hong; Sangwook Lee; Taeyoon Lee; Seongil Im; Kwanghyun Lee; Seulah Lee;
2011 / IEEE
By: Flores-Garcia, E.; Hernandez-Gonzalez, L.; Juarez, M.A.; Vela-Valdes, L.G.; Ponce-Silva, M.;
By: Flores-Garcia, E.; Hernandez-Gonzalez, L.; Juarez, M.A.; Vela-Valdes, L.G.; Ponce-Silva, M.;
2011 / IEEE
By: Hee Sung Lee; Youn-Gyoung Chang; Dae-Hwan Kim; Tae-Woong Moon; Jae Hoon Kim; Seongil Im; Chang-Dong Kim; Kwon-shik Park;
By: Hee Sung Lee; Youn-Gyoung Chang; Dae-Hwan Kim; Tae-Woong Moon; Jae Hoon Kim; Seongil Im; Chang-Dong Kim; Kwon-shik Park;
Organic Deep Ultraviolet Photodetector With Response Peak Focusing on 270 nm Using the Acceptor BAlq
2011 / IEEEBy: Yong-sheng Wang; Xi-qing Zhang; Zuo-fu Hu; Qian Dai; Lu Zhu;
2011 / IEEE
By: Dongsik Kong; Dae Hwan Kim; Dong Myong Kim; Sungchul Kim; Yong Woo Jeon; Minkyung Bae; Yongsik Kim; Hyun-Kwang Jung;
By: Dongsik Kong; Dae Hwan Kim; Dong Myong Kim; Sungchul Kim; Yong Woo Jeon; Minkyung Bae; Yongsik Kim; Hyun-Kwang Jung;
2012 / IEEE
By: Hollingsworth, K.P.; Flynn, P.J.; Bowyer, K.W.; Woodard, D.L.; Miller, P.E.; Darnell, S.S.;
By: Hollingsworth, K.P.; Flynn, P.J.; Bowyer, K.W.; Woodard, D.L.; Miller, P.E.; Darnell, S.S.;
2012 / IEEE
By: Mutyal, N. N.; Turzhitsky, V.; Rogers, J. D.; Radosevich, A. J.; Backman, V.; Roy, H. K.; Yi, J.;
By: Mutyal, N. N.; Turzhitsky, V.; Rogers, J. D.; Radosevich, A. J.; Backman, V.; Roy, H. K.; Yi, J.;
2012 / IEEE
By: Chang, R.; Tokumasu, F.; Allen, D.W.; Lesoine, J.F.; Litorja, M.; Clarke, M.L.; Ji Youn Lee; Jeeseong Hwang;
By: Chang, R.; Tokumasu, F.; Allen, D.W.; Lesoine, J.F.; Litorja, M.; Clarke, M.L.; Ji Youn Lee; Jeeseong Hwang;
2012 / IEEE
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
By: Jr-Hau He; Miin-Jang Chen; Der-Hsien Lien; Chia-Yang Hsu; Ming-Wei Chen; Cheng-Ying Chen;
2012 / IEEE
By: Byeonghoon Cho; Kyung Sook Jeon; Sang Youn Han; Hyang-Shik Kong; Junho Song; Mi Seon Seo;
By: Byeonghoon Cho; Kyung Sook Jeon; Sang Youn Han; Hyang-Shik Kong; Junho Song; Mi Seon Seo;
2012 / IEEE
By: Bellido-Outeirino, F.J.; Moreno-Munoz, A.; Gil-de-Castro, A.; Domingo-Perez, F.; Flores-Arias, J.M.;
By: Bellido-Outeirino, F.J.; Moreno-Munoz, A.; Gil-de-Castro, A.; Domingo-Perez, F.; Flores-Arias, J.M.;
2012 / IEEE
By: Banterle, F.; Hakke-Patil, A.H.; Bernabei, D.; Scopigno, R.; Pattanaik, S.; Ganovelli, F.; Di Benedetto, M.;
By: Banterle, F.; Hakke-Patil, A.H.; Bernabei, D.; Scopigno, R.; Pattanaik, S.; Ganovelli, F.; Di Benedetto, M.;
2012 / IEEE
By: de Rousiers, Charles; Ramamoorthi, Ravi; Holzschuch, Nicolas; Subr, Kartic; Bousseau, Adrien;
By: de Rousiers, Charles; Ramamoorthi, Ravi; Holzschuch, Nicolas; Subr, Kartic; Bousseau, Adrien;
2012 / IEEE
By: Hyungcheol Shin; Ju-Wan Lee; In-Tak Cho; Jong-Ho Lee; Byung-Gook Park; Jun-Mo Park; Hyuck-In Kwon; Il-Hwan Cho; Joon-Seop Kwak; Chi-Sun Hwang; Woo-Seok Cheong;
By: Hyungcheol Shin; Ju-Wan Lee; In-Tak Cho; Jong-Ho Lee; Byung-Gook Park; Jun-Mo Park; Hyuck-In Kwon; Il-Hwan Cho; Joon-Seop Kwak; Chi-Sun Hwang; Woo-Seok Cheong;
2012 / IEEE
By: Agurto, C.; Barriga, E.S.; Yu, H.; Soliz, P.; Bauman, W.; Pattichis, M.S.; Echegaray, S.;
By: Agurto, C.; Barriga, E.S.; Yu, H.; Soliz, P.; Bauman, W.; Pattichis, M.S.; Echegaray, S.;