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Topic: Java
Results
2011 / IEEE
By: Shimizu, T.; Weber, B.; Yannakakis, G.N.; Togelius, J.; Shaker, N.; Baumgarten, R.; Hashiyama, T.; Takahashi, G.; Smith, G.; Mawhorter, P.; Pasquier, P.; Sorenson, N.;
By: Shimizu, T.; Weber, B.; Yannakakis, G.N.; Togelius, J.; Shaker, N.; Baumgarten, R.; Hashiyama, T.; Takahashi, G.; Smith, G.; Mawhorter, P.; Pasquier, P.; Sorenson, N.;
2012 / IEEE
By: Reinauer, V.; Rucker, W.M.; Jaindl, M.; Albert, J.; Banucu, R.; Stermecki, A.; Scheiblich, C.; Magele, C.;
By: Reinauer, V.; Rucker, W.M.; Jaindl, M.; Albert, J.; Banucu, R.; Stermecki, A.; Scheiblich, C.; Magele, C.;
First Operational Experience With a High-Energy Physics Run Control System Based on Web Technologies
2012 / IEEEBy: Bauer, G.; Beccati, B.; Yoon, A. S.; Sumorok, K.; Simon, M.; Shpakov, D.; Schwick, C.; Schieferdecker, P.; Sani, M.; Sakulin, H.; Raginel, O.; Racz, A.; Pieri, M.; Petrucci, A.; Paus, C.; Behrens, U.; Biery, K.; Branson, J.; Bukowiec, S.; Cano, E.; Cheung, H.; Ciganek, M.; Cittolin, S.; Perez, J. A. C.; Deldicque, C.; Erhan, S.; Gigi, D.; Glege, F.; Gomez-Reino, R.; Gulmini, M.; Hatton, D.; Hwong, Y. L.; Loizides, C.; Ma, F.; Masetti, L.; Meijers, F.; Meschi, E.; Meyer, A.; Mommsen, R. K.; Moser, R.; O'Dell, V.; Oh, A.; Orsini, L.;
2012 / IEEE
By: Nierstrasz, O.; Villazon, A.; Ansaloni, D.; Moret, P.; Binder, W.; Harry, M.; Rothlisberger, D.;
By: Nierstrasz, O.; Villazon, A.; Ansaloni, D.; Moret, P.; Binder, W.; Harry, M.; Rothlisberger, D.;
2010 / IEEE / 978-1-4244-9954-0
By: Shaobin Huang; Changming Zhu; Kun Dai; Yongqing Ma; Linshan Shen; Jun Ni;
By: Shaobin Huang; Changming Zhu; Kun Dai; Yongqing Ma; Linshan Shen; Jun Ni;
2010 / IEEE / 978-1-60558-719-6
By: Qing Xie; Chen Fu; Grechanik, M.; Cumby, C.; Poshyvanyk, D.; McMillan, C.;
By: Qing Xie; Chen Fu; Grechanik, M.; Cumby, C.; Poshyvanyk, D.; McMillan, C.;
2010 / IEEE / 978-1-60558-719-6
By: Shengqian Yang; Yuting Chen; Jianjun Zhao; Dacong Yan; Cheng Zhang;
By: Shengqian Yang; Yuting Chen; Jianjun Zhao; Dacong Yan; Cheng Zhang;
2010 / IEEE / 978-1-60558-719-6
By: Marinov, D.; Kuncak, V.; Khurshid, S.; Jagannath, V.; Gvero, T.; Gligoric, M.;
By: Marinov, D.; Kuncak, V.; Khurshid, S.; Jagannath, V.; Gvero, T.; Gligoric, M.;
2010 / IEEE / 978-1-60558-719-6
By: Cheung, W.; Karumuri, S.; Zeleznik, R.; Reiss, S.P.; Kaplan, J.; LaViola, J.J.; Bragdon, A.; Adeputra, F.; Coleman, C.;
By: Cheung, W.; Karumuri, S.; Zeleznik, R.; Reiss, S.P.; Kaplan, J.; LaViola, J.J.; Bragdon, A.; Adeputra, F.; Coleman, C.;
2010 / IEEE / 978-1-60558-719-6
By: Coleman, C.; Kaplan, J.; Cheung, W.; Karumuri, S.; Adeputra, F.; Reiss, S.P.; Bragdon, A.; Zeleznik, R.; LaViola, J.J.;
By: Coleman, C.; Kaplan, J.; Cheung, W.; Karumuri, S.; Adeputra, F.; Reiss, S.P.; Bragdon, A.; Zeleznik, R.; LaViola, J.J.;
2010 / IEEE / 978-1-60558-719-6
By: Cumby, C.; Poshyvanyk, D.; McMillan, C.; Qing Xie; Chen Fu; Grechanik, M.;
By: Cumby, C.; Poshyvanyk, D.; McMillan, C.; Qing Xie; Chen Fu; Grechanik, M.;
2010 / IEEE / 978-1-60558-719-6
By: Sinha, S.; Gupta, M.; Nanda, M.G.; Balachandran, P.; Schmidt, D.; Chandra, S.;
By: Sinha, S.; Gupta, M.; Nanda, M.G.; Balachandran, P.; Schmidt, D.; Chandra, S.;
2010 / IEEE / 978-1-60558-719-6
By: Cacho, N.; Lopes, F.; Figueiredo, E.; Garcia, A.; Lemos, O.; Burrows, R.; Ferrari, F.; Maldonado, J.; Batista, T.; Masiero, P.; Rashid, A.; Soares, S.; Silva, L.; Temudo, N.;
By: Cacho, N.; Lopes, F.; Figueiredo, E.; Garcia, A.; Lemos, O.; Burrows, R.; Ferrari, F.; Maldonado, J.; Batista, T.; Masiero, P.; Rashid, A.; Soares, S.; Silva, L.; Temudo, N.;
2011 / IEEE / 978-1-4577-0134-4
By: Teixeira, F.C.; Estrella, J.C.; Bruschi, S.M.; Santana, R.H.C.; Santana, M.J.;
By: Teixeira, F.C.; Estrella, J.C.; Bruschi, S.M.; Santana, R.H.C.; Santana, M.J.;
2011 / IEEE / 978-1-4577-0134-4
By: Teixeira, F.C.; Estrella, J.C.; Bruschi, S.M.; Santana, R.H.C.; Santana, M.J.;
By: Teixeira, F.C.; Estrella, J.C.; Bruschi, S.M.; Santana, R.H.C.; Santana, M.J.;
2011 / IEEE / 978-1-61284-209-7
By: Diem Pham Thi Ngoc; Py, D.; Iksal, S.; Choquet, C.; Jacoboni, P.; Despres, C.; Lekira, A.;
By: Diem Pham Thi Ngoc; Py, D.; Iksal, S.; Choquet, C.; Jacoboni, P.; Despres, C.; Lekira, A.;