Your Search Results
Use materials about this topic in your textbook!
AcademicPub holds over eight million pieces of educational content - such as case studies and journal articles - for you to mix-and-match your way.
Experience the freedom of customizing your course pack with AcademicPub!

Topic: Ip Networks
Results
2011 / IEEE
By: Oliveira, R.; Yu Zhang; Lixia Zhang; Hongli Zhang; Jun Bi; Baobao Zhang; Shen Su; Yangyang Wang;
By: Oliveira, R.; Yu Zhang; Lixia Zhang; Hongli Zhang; Jun Bi; Baobao Zhang; Shen Su; Yangyang Wang;
2011 / IEEE
By: Gajendiran, V.; Jee Lean Lim; Yong Cheng Poh; Peng Du; OrGrady, G.; Cheng, L.K.; Pullan, A.J.; Buist, M.L.;
By: Gajendiran, V.; Jee Lean Lim; Yong Cheng Poh; Peng Du; OrGrady, G.; Cheng, L.K.; Pullan, A.J.; Buist, M.L.;
2011 / IEEE
By: Shan, R.U.; Portnoy, A.; Haidine, A.; Treytl, A.; Lund, D.; Honary, B.; Adebisi, B.; Pille, H.;
By: Shan, R.U.; Portnoy, A.; Haidine, A.; Treytl, A.; Lund, D.; Honary, B.; Adebisi, B.; Pille, H.;
2011 / IEEE
By: Casadesus, L.; Aznar, J.I.; Ruiz-Mas, J.; Fernandez-Navajas, J.; Saldana, J.; Viruete, E.;
By: Casadesus, L.; Aznar, J.I.; Ruiz-Mas, J.; Fernandez-Navajas, J.; Saldana, J.; Viruete, E.;
2011 / IEEE
By: Saldana, J.; Casadesus, L.; Viruete, E.; Aznar, J.I.; Ruiz-Mas, J.; Fernandez-Navajas, J.;
By: Saldana, J.; Casadesus, L.; Viruete, E.; Aznar, J.I.; Ruiz-Mas, J.; Fernandez-Navajas, J.;
2011 / IEEE
By: Sasaki, M.; Kitayama, K.-I.; Takada, A.; Nagasako, Y.; Harasawa, K.; Inoue, K.; Tomita, A.; Tsubokawa, M.; Araki, S.;
By: Sasaki, M.; Kitayama, K.-I.; Takada, A.; Nagasako, Y.; Harasawa, K.; Inoue, K.; Tomita, A.; Tsubokawa, M.; Araki, S.;
2011 / IEEE
By: Pettersson, M.; Heikkila, G.; Lindegren, D.; Garcia, M.; List, P.; Gustafsson, J.; Raake, A.; Argyropoulos, S.; Feiten, B.;
By: Pettersson, M.; Heikkila, G.; Lindegren, D.; Garcia, M.; List, P.; Gustafsson, J.; Raake, A.; Argyropoulos, S.; Feiten, B.;
2012 / IEEE
By: Vermeulen, B.; De Cock, J.; Crombecq, K.; Vercammen, N.; Van de Walle, R.; Van Wallendael, G.; Staelens, N.; Demeester, P.; Dhaene, T.;
By: Vermeulen, B.; De Cock, J.; Crombecq, K.; Vercammen, N.; Van de Walle, R.; Van Wallendael, G.; Staelens, N.; Demeester, P.; Dhaene, T.;
2012 / IEEE
By: Yang Lu; Lamb, L.D.; Takizawa, M.; Tadokoro, M.; Kusano, T.; Subramaniam, R.; Qian Liu;
By: Yang Lu; Lamb, L.D.; Takizawa, M.; Tadokoro, M.; Kusano, T.; Subramaniam, R.; Qian Liu;
2012 / IEEE
By: Tovar, A.; Contreras, L.M.; De Dios, O.G.; Lopez, V.; Munoz, F.; Folgueira, J.; Fernandez-Palacios, J.P.; Azanon, A.;
By: Tovar, A.; Contreras, L.M.; De Dios, O.G.; Lopez, V.; Munoz, F.; Folgueira, J.; Fernandez-Palacios, J.P.; Azanon, A.;
2012 / IEEE
By: Magill, P.; Simmons, J.M.; Kwon, T.; Klincewicz, J.; Kim, G.; Li, G.; Jackel, J.; Gannett, J.W.; Feuer, M.; Doverspike, R.; Clapp, G.; Choudhury, G.; Chiu, A.L.; Dahai Xu; Woodward, S.; Wilson, B.J.; Lehmen, A.; Strand, J.; Skoog, R.A.;
By: Magill, P.; Simmons, J.M.; Kwon, T.; Klincewicz, J.; Kim, G.; Li, G.; Jackel, J.; Gannett, J.W.; Feuer, M.; Doverspike, R.; Clapp, G.; Choudhury, G.; Chiu, A.L.; Dahai Xu; Woodward, S.; Wilson, B.J.; Lehmen, A.; Strand, J.; Skoog, R.A.;
2012 / IEEE
By: Plass, M.F.; Solis, I.; Briggs, N.H.; Barber, S.; Mosko, M.; Mahadevan, P.; Diebert, T.; Braynard, R.L.; Jacobson, V.; Thornton, J.D.; Smetters, D.K.; Dojun Byun; Myeong-Wuk Jang; Byoung-Joon Lee; Uzun, E.;
By: Plass, M.F.; Solis, I.; Briggs, N.H.; Barber, S.; Mosko, M.; Mahadevan, P.; Diebert, T.; Braynard, R.L.; Jacobson, V.; Thornton, J.D.; Smetters, D.K.; Dojun Byun; Myeong-Wuk Jang; Byoung-Joon Lee; Uzun, E.;