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Topic: Ionization
Results
Arrays of Microplasma Jets Generated by Double Parabolic Microcavities in an Hourglass Configuration
2011 / IEEEBy: Park, S.-J.; Kim, M.H.; Cho, J.H.; Eden, J.G.;
2011 / IEEE
By: Sturm, B.; Cherepy, N.J.; Ahle, L.; Sheets, S.; Dazeley, S.; Payne, S.A.; Woon-Seng Choong; Moses, W.W.; Bizarri, G.;
By: Sturm, B.; Cherepy, N.J.; Ahle, L.; Sheets, S.; Dazeley, S.; Payne, S.A.; Woon-Seng Choong; Moses, W.W.; Bizarri, G.;
2011 / IEEE
By: Hee Seo; Pia, M.G.; Saracco, P.; Quintieri, L.; Chan Hyeong Kim; Begalli, M.; Batic, M.;
By: Hee Seo; Pia, M.G.; Saracco, P.; Quintieri, L.; Chan Hyeong Kim; Begalli, M.; Batic, M.;
2012 / IEEE
By: Khalid, A.; Montes, M.; Stephen, A.; Dunn, G.; Li, C.; Kuball, M.; Hopper, R.H.; Oxley, C.H.; Cumming, D.;
By: Khalid, A.; Montes, M.; Stephen, A.; Dunn, G.; Li, C.; Kuball, M.; Hopper, R.H.; Oxley, C.H.; Cumming, D.;
2012 / IEEE
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;
2012 / IEEE
By: Wilson, M.P.; Given, M.J.; MacGregor, S.J.; Timoshkin, I.V.; Mermigkas, A.C.; Tao Wang;
By: Wilson, M.P.; Given, M.J.; MacGregor, S.J.; Timoshkin, I.V.; Mermigkas, A.C.; Tao Wang;
2012 / IEEE
By: Schwank, J. R.; Paccagnella, A.; Bagatin, M.; Gerardin, S.; Blackmore, E. W.; Shaneyfelt, M. R.;
By: Schwank, J. R.; Paccagnella, A.; Bagatin, M.; Gerardin, S.; Blackmore, E. W.; Shaneyfelt, M. R.;
2012 / IEEE
By: Moses, W.W.; Choong, W.; Grim, J.Q.; Li, Q.; Singh, J.; Vasil'ev, A.N.; Payne, S.A.; Williams, R.T.; Bizarri, G.A.;
By: Moses, W.W.; Choong, W.; Grim, J.Q.; Li, Q.; Singh, J.; Vasil'ev, A.N.; Payne, S.A.; Williams, R.T.; Bizarri, G.A.;
2012 / IEEE
By: Dodd, P.E.; Shi-Jie Wen; Ferlet-Cavrois, V.; Shaneyfelt, M.R.; Schwank, J.R.; Swanson, S.E.; Dalton, S.M.; Reed, R.A.; Blackmore, E.W.; Wong, R.; Tam, N.; Gouker, P.M.; LaBel, K.A.; Marshall, P.W.; Heidel, D.F.; Rodbell, K.P.; Pellish, J.A.;
By: Dodd, P.E.; Shi-Jie Wen; Ferlet-Cavrois, V.; Shaneyfelt, M.R.; Schwank, J.R.; Swanson, S.E.; Dalton, S.M.; Reed, R.A.; Blackmore, E.W.; Wong, R.; Tam, N.; Gouker, P.M.; LaBel, K.A.; Marshall, P.W.; Heidel, D.F.; Rodbell, K.P.; Pellish, J.A.;
2012 / IEEE
By: King, M.P.; Hooten, N.C.; Schrimpf, R.D.; Reed, R.A.; Mendenhall, M.H.; Weller, R.A.; Auden, E.C.;
By: King, M.P.; Hooten, N.C.; Schrimpf, R.D.; Reed, R.A.; Mendenhall, M.H.; Weller, R.A.; Auden, E.C.;
2012 / IEEE
By: Given, M.J.; Wilson, M.P.; Maclean, M.; Timoshkin, I.V.; Anderson, J.G.; Tao Wang; MacGregor, S.J.;
By: Given, M.J.; Wilson, M.P.; Maclean, M.; Timoshkin, I.V.; Anderson, J.G.; Tao Wang; MacGregor, S.J.;
2012 / IEEE
By: Boguski, J.; Roecker, C.; Patil, A.; Jalilian, R.; Jovanovic, I.; Lopez, G.; Foxe, M.; Childres, I.; Chen, Y.P.;
By: Boguski, J.; Roecker, C.; Patil, A.; Jalilian, R.; Jovanovic, I.; Lopez, G.; Foxe, M.; Childres, I.; Chen, Y.P.;
2012 / IEEE
By: Kodama, H.; Yasuno, Y.; Tajima, T.; Iguchi, Y.; Kidokoro, K.; Hagiwara, K.; Goto, M.; Suzuki, Y.;
By: Kodama, H.; Yasuno, Y.; Tajima, T.; Iguchi, Y.; Kidokoro, K.; Hagiwara, K.; Goto, M.; Suzuki, Y.;
2012 / IEEE
By: Macgregor, S.J.; Timoshkin, I.V.; Vorob'ev, V.S.; Atrazhev, V.M.; Wang, T.; Wilson, M.P.; Given, M.J.;
By: Macgregor, S.J.; Timoshkin, I.V.; Vorob'ev, V.S.; Atrazhev, V.M.; Wang, T.; Wilson, M.P.; Given, M.J.;
1992 / IEEE / 000-0-0000-0000-0
By: Renk, T.J.; Tisone, G.C.; Adams, R.G.; Gerber, R.A.; Johnson, D.J.;
By: Renk, T.J.; Tisone, G.C.; Adams, R.G.; Gerber, R.A.; Johnson, D.J.;
1992 / IEEE / 000-0-0000-0000-0
By: Sundquist, B.U.R.; Hakansson, P.; Parilis, E.; Waast, B.; Della-Negra, S.; Brunelle, A.; Le Beyec, Y.; Gardes, D.;
By: Sundquist, B.U.R.; Hakansson, P.; Parilis, E.; Waast, B.; Della-Negra, S.; Brunelle, A.; Le Beyec, Y.; Gardes, D.;
1992 / IEEE / 000-0-0000-0000-0
By: Krejci, A.; Renner, O.; Krousky, E.; Platonov, Y.Y.; Golubev, A.V.; Piffl, V.; Raus, J.;
By: Krejci, A.; Renner, O.; Krousky, E.; Platonov, Y.Y.; Golubev, A.V.; Piffl, V.; Raus, J.;
2000 / IEEE
By: Sasaki, Akira; Zhidkov, Alexei; Fukumoto, Ichirou; Tajima, Toshiki; Kondo, Ken-ichi; Yoshida, Masatake; Utsumi, Takayuki;
By: Sasaki, Akira; Zhidkov, Alexei; Fukumoto, Ichirou; Tajima, Toshiki; Kondo, Ken-ichi; Yoshida, Masatake; Utsumi, Takayuki;
2002 / IEEE / 978-0-7354-0107-5
By: Davis, J.; Giuliani, J.L.; LePell, P.O.; Deeney, C.; Coverdale, C.A.; Chong, Y. K.; Apruzese, J.P.; Clark, R.W.; Thornhill, J.W.; Whitney, K.G.; Velikovich, A.;
By: Davis, J.; Giuliani, J.L.; LePell, P.O.; Deeney, C.; Coverdale, C.A.; Chong, Y. K.; Apruzese, J.P.; Clark, R.W.; Thornhill, J.W.; Whitney, K.G.; Velikovich, A.;
2004 / IEEE / 978-5-87911-088-3
By: Penache, D.; Niemann, C.; Neff, S.; Knobloch, R.; Tauschwitz, A.; Yu, S.; Presura, R.;
By: Penache, D.; Niemann, C.; Neff, S.; Knobloch, R.; Tauschwitz, A.; Yu, S.; Presura, R.;
2011 / IEEE / 978-1-61284-244-8
By: Mishra, U.K.; Speck, J.S.; Jing Lu; Singisetti, U.; Man Hoi Wong;
By: Mishra, U.K.; Speck, J.S.; Jing Lu; Singisetti, U.; Man Hoi Wong;
2011 / IEEE / 978-1-61284-329-2
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
Diagnosing copper wire array implosions on refurbished Z with detailed radiation-hydrodynamic models
2011 / IEEE / 978-1-61284-329-2By: Dasgupta, A.; Clark, R.W.; Hansen, S.B.; Coverdale, C.A.; Ampleford, D.J.; Jones, B.; Giuliani, J.L.;
2011 / IEEE / 978-1-4577-0399-7
By: Shuming Lv; Zhong-lin Zhang; Shihua Zhu; Dianchun Zheng; Dawei Zhao;
By: Shuming Lv; Zhong-lin Zhang; Shihua Zhu; Dianchun Zheng; Dawei Zhao;
2011 / IEEE / 978-1-4577-0564-9
By: Ahmad, A.; Khan, P.A.; Tripathi, S.C.; Gwalt, A.K.; Purohit, P.K.; Bhawre, P.;
By: Ahmad, A.; Khan, P.A.; Tripathi, S.C.; Gwalt, A.K.; Purohit, P.K.; Bhawre, P.;
2011 / IEEE / 978-1-4244-7355-7
By: Atrazhev, V.M.; Denat, A.; Bonifaci, N.; Eloranta, J.; von Haeften, K.; Shakhatov, V.A.;
By: Atrazhev, V.M.; Denat, A.; Bonifaci, N.; Eloranta, J.; von Haeften, K.; Shakhatov, V.A.;
2011 / IEEE / 978-1-4577-1589-1
By: Agar, N.Y.R.; Gholami, B.; Huang, J.; Tannenbaum, A.R.; Haddad, W.M.; Norton, I.;
By: Agar, N.Y.R.; Gholami, B.; Huang, J.; Tannenbaum, A.R.; Haddad, W.M.; Norton, I.;
2011 / IEEE / 978-966-335-357-9
By: Luchinin, A.G.; Glyavin, M.Yu.; Nusinovich, G.S.; Sedov, A.S.; Morozkin, M.V.;
By: Luchinin, A.G.; Glyavin, M.Yu.; Nusinovich, G.S.; Sedov, A.S.; Morozkin, M.V.;
2011 / IEEE / 978-1-4577-0509-0
By: Nishida, A.; Kodama, R.; Sentoku, Y.; Yugami, N.; Otsuka, T.; Higashiguchi, T.; Suzuki, F.; Oba, T.; Nakata, M.;
By: Nishida, A.; Kodama, R.; Sentoku, Y.; Yugami, N.; Otsuka, T.; Higashiguchi, T.; Suzuki, F.; Oba, T.; Nakata, M.;
2011 / IEEE / 978-1-4577-0509-0
By: Frolov, A.A.; Kuricyn, I.I.; Shkurinov, A.P.; Esaulkov, M.N.; Borodin, A.B.;
By: Frolov, A.A.; Kuricyn, I.I.; Shkurinov, A.P.; Esaulkov, M.N.; Borodin, A.B.;
2011 / IEEE / 978-1-4577-0479-6
By: Berge, L.; Kohler, C.; Babushkin, I.; Kuehn, W.; Reimann, K.; Skupin, S.; Elsaesser, T.; Herrmann, J.; Woerner, M.;
By: Berge, L.; Kohler, C.; Babushkin, I.; Kuehn, W.; Reimann, K.; Skupin, S.; Elsaesser, T.; Herrmann, J.; Woerner, M.;
2011 / IEEE / 978-2-87487-023-1
By: Gloria, D.; Lacave, T.; Pottrain, A.; Gaquiere, C.; Derrier, N.; Pourchon, F.; Chevalier, P.;
By: Gloria, D.; Lacave, T.; Pottrain, A.; Gaquiere, C.; Derrier, N.; Pourchon, F.; Chevalier, P.;
2011 / IEEE / 978-1-4577-0586-1
By: Blackmore, E.W.; Shaneyfelt, M.R.; Schwank, J.R.; Paccagnella, A.; Bagatin, M.; Gerardin, S.;
By: Blackmore, E.W.; Shaneyfelt, M.R.; Schwank, J.R.; Paccagnella, A.; Bagatin, M.; Gerardin, S.;