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Topic: Ionisation
Results
2011 / IEEE
By: Rolland, G.; Petit, S.; Girard, S.; Saint-Pe, O.; Bardoux, A.; Goiffon, V.; Virmontois, C.; Magnan, P.;
By: Rolland, G.; Petit, S.; Girard, S.; Saint-Pe, O.; Bardoux, A.; Goiffon, V.; Virmontois, C.; Magnan, P.;
2012 / IEEE
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;
By: Green, J.E.; David, J.P.R.; Sandvik, P.M.; Soloviev, S.I.; Wei Sun Loh; Tozer, R.C.; Ng, B.K.; Marshall, A.R.J.;
2012 / IEEE
By: Wilson, M.P.; Given, M.J.; MacGregor, S.J.; Timoshkin, I.V.; Mermigkas, A.C.; Tao Wang;
By: Wilson, M.P.; Given, M.J.; MacGregor, S.J.; Timoshkin, I.V.; Mermigkas, A.C.; Tao Wang;
2012 / IEEE
By: Moses, W.W.; Choong, W.; Grim, J.Q.; Li, Q.; Singh, J.; Vasil'ev, A.N.; Payne, S.A.; Williams, R.T.; Bizarri, G.A.;
By: Moses, W.W.; Choong, W.; Grim, J.Q.; Li, Q.; Singh, J.; Vasil'ev, A.N.; Payne, S.A.; Williams, R.T.; Bizarri, G.A.;
2012 / IEEE
By: Dodd, P.E.; Shi-Jie Wen; Ferlet-Cavrois, V.; Shaneyfelt, M.R.; Schwank, J.R.; Swanson, S.E.; Dalton, S.M.; Reed, R.A.; Blackmore, E.W.; Wong, R.; Tam, N.; Gouker, P.M.; LaBel, K.A.; Marshall, P.W.; Heidel, D.F.; Rodbell, K.P.; Pellish, J.A.;
By: Dodd, P.E.; Shi-Jie Wen; Ferlet-Cavrois, V.; Shaneyfelt, M.R.; Schwank, J.R.; Swanson, S.E.; Dalton, S.M.; Reed, R.A.; Blackmore, E.W.; Wong, R.; Tam, N.; Gouker, P.M.; LaBel, K.A.; Marshall, P.W.; Heidel, D.F.; Rodbell, K.P.; Pellish, J.A.;
2012 / IEEE
By: Patel, H.; Srinivasan, R.; Chattopadhyay, P.K.; Patel, J.; Dhorajia, P.; Goswami, R.; Bora, D.; Babu, R.; Shukla, B.K.;
By: Patel, H.; Srinivasan, R.; Chattopadhyay, P.K.; Patel, J.; Dhorajia, P.; Goswami, R.; Bora, D.; Babu, R.; Shukla, B.K.;
2012 / IEEE
By: Yin, L.X.; Virostek, S.P.; Cao, Y.; Sun, S.; Wang, L.; Guo, X.L.; Demello, A.; Li, D.R.; Green, M.A.; Pan, H.;
By: Yin, L.X.; Virostek, S.P.; Cao, Y.; Sun, S.; Wang, L.; Guo, X.L.; Demello, A.; Li, D.R.; Green, M.A.; Pan, H.;
2012 / IEEE
By: Thompson, C.V.; Tuller, H.L.; Bin Lu; Di Chen; Keller, S.; Feng Gao; Palacios, T.; Mishra, U.K.;
By: Thompson, C.V.; Tuller, H.L.; Bin Lu; Di Chen; Keller, S.; Feng Gao; Palacios, T.; Mishra, U.K.;
1992 / IEEE / 000-0-0000-0000-0
By: Renk, T.J.; Tisone, G.C.; Adams, R.G.; Gerber, R.A.; Johnson, D.J.;
By: Renk, T.J.; Tisone, G.C.; Adams, R.G.; Gerber, R.A.; Johnson, D.J.;
2004 / IEEE / 978-5-87911-088-3
By: Penache, D.; Niemann, C.; Neff, S.; Knobloch, R.; Tauschwitz, A.; Yu, S.; Presura, R.;
By: Penache, D.; Niemann, C.; Neff, S.; Knobloch, R.; Tauschwitz, A.; Yu, S.; Presura, R.;
2004 / IEEE / 978-5-87911-088-3
By: Gafarov, A.M.; Panikovskaya, V.N.; Vagina, N.M.; Komissarov, A.V.; Safronov, A.A.; Ostashev, V.I.;
By: Gafarov, A.M.; Panikovskaya, V.N.; Vagina, N.M.; Komissarov, A.V.; Safronov, A.A.; Ostashev, V.I.;
2009 / IEEE / 978-1-4577-0493-2
By: Aubry-Fortuna, V.; Bournel, A.; Flament, O.; Sauvestre, J.-E.; Gaillardin, M.; Raine, M.;
By: Aubry-Fortuna, V.; Bournel, A.; Flament, O.; Sauvestre, J.-E.; Gaillardin, M.; Raine, M.;
2011 / IEEE / 978-1-4244-9949-6
By: Huang, H.J.; Wu, K.; Wu, D.J.; Leu, L.; Liu, C.C.; Ranjan, R.; Lee, Y.; Shih, J.R.; Huang, Y.;
By: Huang, H.J.; Wu, K.; Wu, D.J.; Leu, L.; Liu, C.C.; Ranjan, R.; Lee, Y.; Shih, J.R.; Huang, Y.;
2011 / IEEE / 978-1-61284-244-8
By: Mishra, U.K.; Speck, J.S.; Jing Lu; Singisetti, U.; Man Hoi Wong;
By: Mishra, U.K.; Speck, J.S.; Jing Lu; Singisetti, U.; Man Hoi Wong;
2011 / IEEE / 978-1-61284-329-2
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
2011 / IEEE / 978-1-4577-1589-1
By: Agar, N.Y.R.; Gholami, B.; Huang, J.; Tannenbaum, A.R.; Haddad, W.M.; Norton, I.;
By: Agar, N.Y.R.; Gholami, B.; Huang, J.; Tannenbaum, A.R.; Haddad, W.M.; Norton, I.;
2011 / IEEE / 978-2-87487-023-1
By: Gloria, D.; Lacave, T.; Pottrain, A.; Gaquiere, C.; Derrier, N.; Pourchon, F.; Chevalier, P.;
By: Gloria, D.; Lacave, T.; Pottrain, A.; Gaquiere, C.; Derrier, N.; Pourchon, F.; Chevalier, P.;
2011 / IEEE / 978-1-4577-0586-1
By: Santin, G.; Cueto, J.; Allison, J.; Urban, L.; Grichine, V.; Maire, M.; Ivanchenko, V.; Ibarmia, S.; Howard, A.;
By: Santin, G.; Cueto, J.; Allison, J.; Urban, L.; Grichine, V.; Maire, M.; Ivanchenko, V.; Ibarmia, S.; Howard, A.;
2011 / IEEE / 978-1-4577-0586-1
By: Coutinho, S.; Pimenta, M.; Zadeh, A.; Goncalves, P.; Keating, A.; Daly, E.; Brogueira, P.;
By: Coutinho, S.; Pimenta, M.; Zadeh, A.; Goncalves, P.; Keating, A.; Daly, E.; Brogueira, P.;
2011 / IEEE / 978-1-4577-0586-1
By: Bengqi Tang; Zujun Wang; Shaoyan Huang; Yong Zhang; Minbo Liu; Zhigang Xiao;
By: Bengqi Tang; Zujun Wang; Shaoyan Huang; Yong Zhang; Minbo Liu; Zhigang Xiao;
2011 / IEEE / 978-1-4673-0120-6
By: Chee Hing Tan; Gomes, R.B.; Jo Shien Ng; David, J.P.R.; Lees, J.E.;
By: Chee Hing Tan; Gomes, R.B.; Jo Shien Ng; David, J.P.R.; Lees, J.E.;
2011 / IEEE / 978-1-4673-0120-6
By: Iijima, K.; Saito, K.; Sanami, T.; Sasaki, S.; Murakami, T.; Tawara, H.;
By: Iijima, K.; Saito, K.; Sanami, T.; Sasaki, S.; Murakami, T.; Tawara, H.;
2011 / IEEE / 978-1-4577-0631-8
By: Xinhong Hao; Jin Luo; Zhao Wang; Xiaopeng Yan; Jianzheng Yang; Jiantao Wang;
By: Xinhong Hao; Jin Luo; Zhao Wang; Xiaopeng Yan; Jianzheng Yang; Jiantao Wang;
2011 / IEEE / 978-0-9775657-8-8
By: Wallace, W.C.; Pullen, M.G.; Kielpinski, D.; Sang, R.T.; Litvinyuk, I.V.; Quiney, H.M.; Kheifets, A.; Ivanov, I.; Weflen, D.; Bartschat, K.; Abeln, B.; Grum-Grzhimailo, A.N.; Hanne, G.F.; Palmer, A.J.; Laban, D.E.;
By: Wallace, W.C.; Pullen, M.G.; Kielpinski, D.; Sang, R.T.; Litvinyuk, I.V.; Quiney, H.M.; Kheifets, A.; Ivanov, I.; Weflen, D.; Bartschat, K.; Abeln, B.; Grum-Grzhimailo, A.N.; Hanne, G.F.; Palmer, A.J.; Laban, D.E.;
2012 / IEEE / 978-1-4673-2185-3
By: Cheng Liao; Lijuan Tang; Wenbin Lin; Ju Feng; Yanliang Wu; Pengcheng Zhao;
By: Cheng Liao; Lijuan Tang; Wenbin Lin; Ju Feng; Yanliang Wu; Pengcheng Zhao;
2011 / American Institute of Physics
By: Yuri Alexandre Aoto; Fernando R. Ornellas; Klaus Franzreb; Antonio Gustavo S. de Oliveira-Filho;
By: Yuri Alexandre Aoto; Fernando R. Ornellas; Klaus Franzreb; Antonio Gustavo S. de Oliveira-Filho;
2012 / American Institute of Physics
By: A. Nishida; N. Yugami; T. Higashiguchi; T. Otsuka; F. Suzuki; M. Nakata; Y. Sentoku; R. Kodama;
By: A. Nishida; N. Yugami; T. Higashiguchi; T. Otsuka; F. Suzuki; M. Nakata; Y. Sentoku; R. Kodama;
2012 / American Institute of Physics
By: Hai-Wei Du; Min Chen; Zheng-Ming Sheng; Jie Zhang; Hui-Chun Wu; Wei-Min Wang;
By: Hai-Wei Du; Min Chen; Zheng-Ming Sheng; Jie Zhang; Hui-Chun Wu; Wei-Min Wang;
2007 / American Institute of Physics
By: Takeshi Higashiguchi; Masanori Kaku; Masahito Katto; Shoichi Kubodera;
By: Takeshi Higashiguchi; Masanori Kaku; Masahito Katto; Shoichi Kubodera;
2008 / American Institute of Physics
By: N. L. Kugland; C. G. Constantin; P. Neumayer; H.-K. Chung; A. Collette; E. L. Dewald; D. H. Froula; S. H. Glenzer; A. Kemp; A. L. Kritcher; J. S. Ross; C. Niemann;
By: N. L. Kugland; C. G. Constantin; P. Neumayer; H.-K. Chung; A. Collette; E. L. Dewald; D. H. Froula; S. H. Glenzer; A. Kemp; A. L. Kritcher; J. S. Ross; C. Niemann;
2008 / American Institute of Physics
By: Yasuo Nakayama; Shinichi Machida; Takeo Minari; Kazuhito Tsukagishi; Yutaka Noguchi; Hisao Ishii;
By: Yasuo Nakayama; Shinichi Machida; Takeo Minari; Kazuhito Tsukagishi; Yutaka Noguchi; Hisao Ishii;
2010 / American Institute of Physics
By: Michel Busquet; Frédéric Thais; Matthias González; Edouard Audit;
By: Michel Busquet; Frédéric Thais; Matthias González; Edouard Audit;
2007 / American Institute of Physics
By: T. Gans; D. Vender; D. OConnell; R. Boswell; U. Czarnetzki;
By: T. Gans; D. Vender; D. OConnell; R. Boswell; U. Czarnetzki;
2008 / American Institute of Physics
By: A. Fruchtman; G. Makrinich; J.-L. Raimbault; L. Liard; J.-M. Rax; P. Chabert;
By: A. Fruchtman; G. Makrinich; J.-L. Raimbault; L. Liard; J.-M. Rax; P. Chabert;
2009 / American Institute of Physics
By: D. Nishijima; R. P. Doerner; M. J. Baldwin; A. Pospieszczyk; A. Kreter;
By: D. Nishijima; R. P. Doerner; M. J. Baldwin; A. Pospieszczyk; A. Kreter;
2009 / American Institute of Physics
By: R. A. Filatov; A. E. Hramov; Y. P. Bliokh; A. A. Koronovskii; J. Felsteiner;
By: R. A. Filatov; A. E. Hramov; Y. P. Bliokh; A. A. Koronovskii; J. Felsteiner;
2010 / American Institute of Physics
By: B. J. Ding; M. H. Li; Y. L. Qin; W. K. Li; L. Z. Zhang; J. F. Shan; F. K. Liu; M. Wang; L. G. Meng; H. D. Xu; D. X. Wang; Y. X. Jie; Y. W. Sun; B. Shen; W. Zhang; X. M. Wang; J. H. Wu; X. Gao; X. D. Zhang; Y. P. Zhao;
By: B. J. Ding; M. H. Li; Y. L. Qin; W. K. Li; L. Z. Zhang; J. F. Shan; F. K. Liu; M. Wang; L. G. Meng; H. D. Xu; D. X. Wang; Y. X. Jie; Y. W. Sun; B. Shen; W. Zhang; X. M. Wang; J. H. Wu; X. Gao; X. D. Zhang; Y. P. Zhao;
2011 / American Institute of Physics
By: H. Nishimura; R. Mishra; S. Ohshima; H. Nakamura; M. Tanabe; T. Fujiwara; N. Yamamoto; S. Fujioka; D. Batani; M. Veltcheva; T. Desai; R. Jafer; T. Kawamura; Y. Sentoku; R. Mancini; P. Hakel; F. Koike; K. Mima;
By: H. Nishimura; R. Mishra; S. Ohshima; H. Nakamura; M. Tanabe; T. Fujiwara; N. Yamamoto; S. Fujioka; D. Batani; M. Veltcheva; T. Desai; R. Jafer; T. Kawamura; Y. Sentoku; R. Mancini; P. Hakel; F. Koike; K. Mima;
2012 / American Institute of Physics
By: N. R. Pereira; B. V. Weber; D. G. Phipps; J. W. Schumer; J. F. Seely; J. J. Carroll; J. R. Vanhoy; K. Słabkowska; M. Polasik;
By: N. R. Pereira; B. V. Weber; D. G. Phipps; J. W. Schumer; J. F. Seely; J. J. Carroll; J. R. Vanhoy; K. Słabkowska; M. Polasik;