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Topic: Information Resources
Results
2011 / IEEE / 978-1-4244-9221-3
By: Bezerra, R.S.; dos Santos, C.R.P.; Anerousis, N.; Cheng, W.; Bertholdo, L.M.; Granville, L.Z.;
By: Bezerra, R.S.; dos Santos, C.R.P.; Anerousis, N.; Cheng, W.; Bertholdo, L.M.; Granville, L.Z.;
2011 / IEEE / 978-1-61284-848-8
By: Nengcheng Chen; Long Guo; Jianli Gu; Haitao Zhang; Jiaying Chen;
By: Nengcheng Chen; Long Guo; Jianli Gu; Haitao Zhang; Jiaying Chen;
2011 / IEEE / 978-1-4577-0531-1
By: Yoshiaki, T.; Hirotsugu, K.; Kazuhiro, S.; Tetsuya, M.; Naoya, K.;
By: Yoshiaki, T.; Hirotsugu, K.; Kazuhiro, S.; Tetsuya, M.; Naoya, K.;
2011 / IEEE / 978-1-61284-758-0
By: Yang Shih-Chun; Yen Chia-Sung; Chao Chih Yang; Sun Yi-Inn; Yeh Tien-Hui;
By: Yang Shih-Chun; Yen Chia-Sung; Chao Chih Yang; Sun Yi-Inn; Yeh Tien-Hui;
2011 / IEEE / 978-1-4577-0966-1
By: Specht, M.; Klerkx, J.; Niemann, K.; Memmel, M.; Wolpers, M.; Duval, E.; Giretti, A.;
By: Specht, M.; Klerkx, J.; Niemann, K.; Memmel, M.; Wolpers, M.; Duval, E.; Giretti, A.;
2011 / IEEE / 978-1-4244-9793-5
By: Wang Tian; Wang Da-quan; Wu Xiao-kai; Zhou Qi-li; Wu Ai-ping; Zhang Lin;
By: Wang Tian; Wang Da-quan; Wu Xiao-kai; Zhou Qi-li; Wu Ai-ping; Zhang Lin;
2011 / IEEE / 978-1-4577-1373-6
By: Matheus, C.J.; Bedini, I.; Boran, A.; Keeney, J.; Patel-Schneider, P.F.;
By: Matheus, C.J.; Bedini, I.; Boran, A.; Keeney, J.; Patel-Schneider, P.F.;
2011 / IEEE / 978-0-933957-39-8
By: Stuebe, D.; Mueller, C.; Farcas, C.; Vernon, F.; Schofield, O.; Orcutt, J.; Manning, M.; Krueger, I.; Meisinger, M.; Graybeal, J.; Farcas, E.; Chave, A.; Arrott, M.; Ampe, T.;
By: Stuebe, D.; Mueller, C.; Farcas, C.; Vernon, F.; Schofield, O.; Orcutt, J.; Manning, M.; Krueger, I.; Meisinger, M.; Graybeal, J.; Farcas, E.; Chave, A.; Arrott, M.; Ampe, T.;
2011 / IEEE / 978-1-4577-1593-8
By: Kato, F.; Ohmukai, I.; Takeda, H.; Kamura, T.; Ueda, H.; Takahashi, T.;
By: Kato, F.; Ohmukai, I.; Takeda, H.; Kamura, T.; Ueda, H.; Takahashi, T.;
2011 / IEEE / 978-1-4577-1613-3
By: Ames, J.; Kesselman, C.; Chervenak, A.L.; van Erp, T.G.M.; Potkin, S.G.; Macciardi, F.; D'Arcy, M.; Hasso, A.; Law, M.; Murry, J.; Dahm, L.; Keator, D.; Sobell, J.;
By: Ames, J.; Kesselman, C.; Chervenak, A.L.; van Erp, T.G.M.; Potkin, S.G.; Macciardi, F.; D'Arcy, M.; Hasso, A.; Law, M.; Murry, J.; Dahm, L.; Keator, D.; Sobell, J.;