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Topic: Ieee Standards
Results
2011 / IEEE
By: Murroni, M.; Harada, H.; Moessner, K.; Chen Sun; Prasad, R.V.; Noguet, D.; Bochow, B.; Marques, P.;
By: Murroni, M.; Harada, H.; Moessner, K.; Chen Sun; Prasad, R.V.; Noguet, D.; Bochow, B.; Marques, P.;
Estimating the Uncertainty in the Frequency Domain Characterization of Digitizing Waveform Recorders
2012 / IEEEBy: Balestrieri, E.; Slepicka, D.; Rapuano, S.; De Vito, L.;
2012 / IEEE
By: Yamashita, S.; Kazovsky, L.G.; Yen, S.; Wong, S.; Valcarenghi, L.; Castoldi, P.; Raponi, P.G.; Dung Pham Van; Campelo, D.R.;
By: Yamashita, S.; Kazovsky, L.G.; Yen, S.; Wong, S.; Valcarenghi, L.; Castoldi, P.; Raponi, P.G.; Dung Pham Van; Campelo, D.R.;
2012 / IEEE
By: Hyunduk Kang; Cummings, M.; Kasslin, M.; Baykas, T.; Kwak, J.; Saeed, R.; Shellhammer, S.J.; Reznik, A.; Paine, R.;
By: Hyunduk Kang; Cummings, M.; Kasslin, M.; Baykas, T.; Kwak, J.; Saeed, R.; Shellhammer, S.J.; Reznik, A.; Paine, R.;
2011 / IEEE / 978-1-4244-9312-8
By: Denardin, G.W.; do Prado, R.N.; Dalla Costa, M.A.; Pinto, R.A.; Campos, A.; Barriquello, C.H.;
By: Denardin, G.W.; do Prado, R.N.; Dalla Costa, M.A.; Pinto, R.A.; Campos, A.; Barriquello, C.H.;
2011 / IEEE / 978-1-4244-9457-6
By: Layer, C.; Kroner, M.; Boersma, M.; Schelm, K.; Muller, S.M.; Leber, P.;
By: Layer, C.; Kroner, M.; Boersma, M.; Schelm, K.; Muller, S.M.; Leber, P.;
2011 / IEEE / 978-1-4244-9312-8
By: Sinsukthavorn, W.; Ortjohann, E.; Schmelter, A.; Jaloudi, S.; Morton, D.; Wirasanti, P.;
By: Sinsukthavorn, W.; Ortjohann, E.; Schmelter, A.; Jaloudi, S.; Morton, D.; Wirasanti, P.;