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Topic: High-speed Optical Techniques
Results
2011 / IEEE
By: Viloan, R.P.B.; Ting, J.A.S.; Rosario, L.M.D.; Ramos, H.J.; Suarez, B.A.T.; Soriano, M.N.; Tumlos, R.B.; Villamayor, M.M.S.;
By: Viloan, R.P.B.; Ting, J.A.S.; Rosario, L.M.D.; Ramos, H.J.; Suarez, B.A.T.; Soriano, M.N.; Tumlos, R.B.; Villamayor, M.M.S.;
2011 / IEEE
By: Ryoukai, T.; Ishiguro, M.; Liu, H.Q.; Hanada, K.; Nishino, N.; Zushi, H.; Tashima, S.; Fujisawa, A.; Hasegawa, M.; Banerjee, S.; Idei, H.; Nakamura, K.;
By: Ryoukai, T.; Ishiguro, M.; Liu, H.Q.; Hanada, K.; Nishino, N.; Zushi, H.; Tashima, S.; Fujisawa, A.; Hasegawa, M.; Banerjee, S.; Idei, H.; Nakamura, K.;
2011 / IEEE
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
By: Geernaert, T.; Baghdasaryan, T.; Thienpont, H.; Berghmans, F.; Mergo, P.; Makara, M.; Bartelt, H.; Schuster, K.; Becker, M.;
2011 / IEEE
By: Hongwei Zhu; Wei Zhang; Xiaosheng Xiao; Xiao Li; Kunlin Wang; Lili Gui; Changxi Yang; Dehai Wu;
By: Hongwei Zhu; Wei Zhang; Xiaosheng Xiao; Xiao Li; Kunlin Wang; Lili Gui; Changxi Yang; Dehai Wu;
2011 / IEEE
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
By: Kintaka, K.; Nagase, M.; Suda, S.; Shoji, Y.; Kawashima, H.; Ishikawa, H.; Hasama, T.; Kuwatsuka, H.; Akimoto, R.;
2012 / IEEE
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
By: Jianzhou Wang; Yi Xu; Yanyan Li; Yansui Huang; Xiaoming Lu; Zhizhan Xu; Ruxin Li; Yuxin Leng;
2012 / IEEE
By: Chunle Xiong; Monat, C.; Collins, M.J.; Tranchant, L.; Petiteau, D.; Clark, A.S.; Eggleton, B.J.; Marshall, G.D.; Steel, M.J.; Juntao Li; O'Faolain, L.; Krauss, T.F.; Grillet, C.;
By: Chunle Xiong; Monat, C.; Collins, M.J.; Tranchant, L.; Petiteau, D.; Clark, A.S.; Eggleton, B.J.; Marshall, G.D.; Steel, M.J.; Juntao Li; O'Faolain, L.; Krauss, T.F.; Grillet, C.;
Wideband Unpredictability-Enhanced Chaotic Semiconductor Lasers With Dual-Chaotic Optical Injections
2012 / IEEEBy: Nianqiang Li; Xi Hua Zou; Lian Shan Yan; Bin Luo; Wei Pan; Shui Ying Xiang; Hong Na Zhu;
2012 / IEEE
By: Hai-Yu Wang; Bing-Rong Gao; Hong-Bo Sun; Qi-Dai Chen; Ya-Wei Hao; Ying Jiang; Lei Wang; Zhi-Yong Yang; Hai Wang;
By: Hai-Yu Wang; Bing-Rong Gao; Hong-Bo Sun; Qi-Dai Chen; Ya-Wei Hao; Ying Jiang; Lei Wang; Zhi-Yong Yang; Hai Wang;
2012 / IEEE
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
By: Jackel, H.; Holzman, J.F.; Beck, M.; Kappeler, R.; Fedoryshyn, Y.; Faist, J.; Ping Ma; Kaspar, P.;
2012 / IEEE
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
By: Shimizu, T.; Nakazato, T.; Cadatal-Raduban, M.; Takeda, K.; Sakai, K.; Sarukura, N.; Wakamiya, A.; Kano, M.; Yamanoi, K.; Fukuda, T.;
2012 / IEEE
By: Culurciello, E.; Platisa, J.; Dickensheets, D.; Joon Hyuk Park; Osman, A.; Pieribone, V.A.;
By: Culurciello, E.; Platisa, J.; Dickensheets, D.; Joon Hyuk Park; Osman, A.; Pieribone, V.A.;
2012 / IEEE
By: Fok, M.P.; Yue Tian; Kravtsov, K.S.; Rafidi, N.S.; Prucnal, P.R.; Tait, A.N.; Nahmias, M.A.;
By: Fok, M.P.; Yue Tian; Kravtsov, K.S.; Rafidi, N.S.; Prucnal, P.R.; Tait, A.N.; Nahmias, M.A.;
2012 / IEEE
By: Davies, E.; Koutsides, C.; Zhang, L.; Webb, D.J.; Allsop, T.; Komodromos, M.; Kalli, K.;
By: Davies, E.; Koutsides, C.; Zhang, L.; Webb, D.J.; Allsop, T.; Komodromos, M.; Kalli, K.;
2012 / IEEE
By: Porcon, P.; Bouchet, O.; Turnbull, R.; Faulkner, G.; Hoa Le Minh; El Tabach, M.; O'Brien, D.; Jianhui Li; Grobe, L.; Wolf, M.; Gueutier, E.;
By: Porcon, P.; Bouchet, O.; Turnbull, R.; Faulkner, G.; Hoa Le Minh; El Tabach, M.; O'Brien, D.; Jianhui Li; Grobe, L.; Wolf, M.; Gueutier, E.;
2012 / IEEE
By: Frazao, O.; Becker, M.; Fernandes, L.A.; Marques, P.V.S.; Schuster, K.; Santos, J.L.; Bartelt, H.; Rothhardt, M.; Kobelke, J.;
By: Frazao, O.; Becker, M.; Fernandes, L.A.; Marques, P.V.S.; Schuster, K.; Santos, J.L.; Bartelt, H.; Rothhardt, M.; Kobelke, J.;
2012 / IEEE
By: Bogoni, A.; Anlin Yi; Xiaoxia Wu; Willner, A.E.; Lianshan Yan; Jiang, H.-Y.; Chen, Z.-Y.;
By: Bogoni, A.; Anlin Yi; Xiaoxia Wu; Willner, A.E.; Lianshan Yan; Jiang, H.-Y.; Chen, Z.-Y.;
Hybrid Nanomaterial for Stabilizing the Antibiofilm Activity of Eugenia carryophyllata Essential Oil
2012 / IEEEBy: Grumezescu, A.M.; Andronescu, E.; Stanciu, G.A.; Mihaiescu, D.E.; Chifiriuc, M.C.; Hristu, R.; Grumezescu, V.; Saviuc, C.;
2012 / IEEE
By: Ruiz, M.; Tran, M.; Fedorova, K.; Nikitichev, D.; Alhazime, A.; Ying Ding; Rafailov, E.; Krakowski, M.; Cataluna, M.A.; Syvridis, D.; Montrosset, I.; Livshits, D.; Krestnikov, I.; Rossetti, M.; Bardella, P.; Tianhong Xu; Mesaritakis, C.; Simos, H.; Kapsalis, A.; Robert, Y.;
By: Ruiz, M.; Tran, M.; Fedorova, K.; Nikitichev, D.; Alhazime, A.; Ying Ding; Rafailov, E.; Krakowski, M.; Cataluna, M.A.; Syvridis, D.; Montrosset, I.; Livshits, D.; Krestnikov, I.; Rossetti, M.; Bardella, P.; Tianhong Xu; Mesaritakis, C.; Simos, H.; Kapsalis, A.; Robert, Y.;
2012 / IEEE
By: Jinzhong Yu; Xianyao Li; Xi Xiao; Yude Yu; Hao Xu; Tao Chu; Zhiyong Li; Kang Xiong; Yingtao Hu;
By: Jinzhong Yu; Xianyao Li; Xi Xiao; Yude Yu; Hao Xu; Tao Chu; Zhiyong Li; Kang Xiong; Yingtao Hu;
2012 / IEEE
By: Shui Ying Xiang; Penghua Mu; Liyue Zhang; Xi Hua Zou; Lian Shan Yan; Bin Luo; Nian Qiang Li; Wei Pan;
By: Shui Ying Xiang; Penghua Mu; Liyue Zhang; Xi Hua Zou; Lian Shan Yan; Bin Luo; Nian Qiang Li; Wei Pan;
A Robust Fuzzy Autonomous Underwater Vehicle (AUV) Docking Approach for Unknown Current Disturbances
2012 / IEEEBy: An, E.; Ken Teo; Beaujean, P.J.;
1992 / IEEE / 000-0-0000-0000-0
By: Shcheglov, M.A.; Melnikov, P.I.; Lebedev, S.V.; Koidan, V.S.; Filippov, V.V.; Voropaev, S.G.;
By: Shcheglov, M.A.; Melnikov, P.I.; Lebedev, S.V.; Koidan, V.S.; Filippov, V.V.; Voropaev, S.G.;
2004 / IEEE / 978-5-87911-088-3
By: Fukuchi, T.; Fujii, T.; Oishi, Y.; Nayuki, T.; Takizawa, Y.; Platonov, K.Yu.; Andreev, A.A.; Nemoto, K.; Wang, X.;
By: Fukuchi, T.; Fujii, T.; Oishi, Y.; Nayuki, T.; Takizawa, Y.; Platonov, K.Yu.; Andreev, A.A.; Nemoto, K.; Wang, X.;
2011 / IEEE / 978-1-4577-1226-5
By: de Aldana, J.R.V.; Romero, C.; Climent, V.; Lancis, J.; Mendoza-Yero, O.; Camino, A.; Roso, L.; Andres, P.; Minguez-Vega, G.; Borrego-Varillas, R.; Hernandez-Toro, J.;
By: de Aldana, J.R.V.; Romero, C.; Climent, V.; Lancis, J.; Mendoza-Yero, O.; Camino, A.; Roso, L.; Andres, P.; Minguez-Vega, G.; Borrego-Varillas, R.; Hernandez-Toro, J.;
2011 / IEEE / 978-1-4577-1226-5
By: Minguez-Vega, G.; Andres, P.; Lancis, J.; Fernandez-Alonso, M.; Mendoza-Yero, O.;
By: Minguez-Vega, G.; Andres, P.; Lancis, J.; Fernandez-Alonso, M.; Mendoza-Yero, O.;
2011 / IEEE / 978-1-4577-1226-5
By: Alonso, B.; Minguez-Vega, G.; Climent, V.; Lancis, J.; Sola, I.J.; Mendoza-Yero, O.; Roso, L.; Varela, O.;
By: Alonso, B.; Minguez-Vega, G.; Climent, V.; Lancis, J.; Sola, I.J.; Mendoza-Yero, O.; Roso, L.; Varela, O.;
2011 / IEEE / 978-1-4577-1226-5
By: Cormier, E.; Petit, S.; Hazera, C.; Lhermite, J.; Mansuryan, T.; Barthelemy, A.; Louradour, F.; Kalashyan, M.; Martinez-Leon, L.;
By: Cormier, E.; Petit, S.; Hazera, C.; Lhermite, J.; Mansuryan, T.; Barthelemy, A.; Louradour, F.; Kalashyan, M.; Martinez-Leon, L.;
2011 / IEEE / 978-1-61284-329-2
By: Peters, S.; Schafer, J.; Weltmann, K.-D.; Gerling, T.; Hoder, T.; Foest, R.;
By: Peters, S.; Schafer, J.; Weltmann, K.-D.; Gerling, T.; Hoder, T.; Foest, R.;
2011 / IEEE / 978-1-61284-329-2
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
By: Hornstein, M.; Jones, T.G.; Helle, M.H.; Gordon, D.F.; Ting, A.;
2011 / IEEE / 978-3-8007-3356-9
By: Okumura, S.; Uetake, A.; Matsuda, M.; Tanaka, S.; Ekawa, M.; Yamamoto, T.; Simoyama, T.; Morito, K.;
By: Okumura, S.; Uetake, A.; Matsuda, M.; Tanaka, S.; Ekawa, M.; Yamamoto, T.; Simoyama, T.; Morito, K.;
2011 / IEEE / 978-986-02-8974-9
By: Ta-Nung Chen; Ja-Hon Lin; Kuei-Chu Hsu; Bo-Yan Chen; Shing-Rung Su; Siao-Tsung Wang; Snhing-hong Liu;
By: Ta-Nung Chen; Ja-Hon Lin; Kuei-Chu Hsu; Bo-Yan Chen; Shing-Rung Su; Siao-Tsung Wang; Snhing-hong Liu;
2011 / IEEE / 978-986-02-8974-9
By: Richter, T.; Ludwig, R.; Schubert, C.; Elschner, R.; Palushani, E.; Noelle, M.; Fischer, J.K.; Molle, L.; Schmidt-Langhorst, C.;
By: Richter, T.; Ludwig, R.; Schubert, C.; Elschner, R.; Palushani, E.; Noelle, M.; Fischer, J.K.; Molle, L.; Schmidt-Langhorst, C.;
2011 / IEEE / 978-986-02-8974-9
By: Shau-Ching Lin; Wood-Hi Cheng; Jiang-Jen Lin; Chao-Yung Yeh; Shr-Hau Huang; Bi-Zen Hsieh; Pi-Ling Huang;
By: Shau-Ching Lin; Wood-Hi Cheng; Jiang-Jen Lin; Chao-Yung Yeh; Shr-Hau Huang; Bi-Zen Hsieh; Pi-Ling Huang;
2011 / IEEE / 978-1-61284-878-5
By: Krestnikov, I.; Elsaser, W.; Grozman, G.; Drzewietzki, L.; Montrosset, I.; Rossetti, M.; Gioannini, M.;
By: Krestnikov, I.; Elsaser, W.; Grozman, G.; Drzewietzki, L.; Montrosset, I.; Rossetti, M.; Gioannini, M.;
2011 / IEEE / 978-1-4244-6051-9
By: Bhuyan, M.K.; Dudley, J.M.; Furfaro, L.; Salut, R.; Froehly, L.; Lacourt, P.-A.; Jacquot, M.; Courvoisier, F.;
By: Bhuyan, M.K.; Dudley, J.M.; Furfaro, L.; Salut, R.; Froehly, L.; Lacourt, P.-A.; Jacquot, M.; Courvoisier, F.;