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Topic: Gate Oxide Thickness
Results
2011 / IEEE / 978-1-4577-0115-3
By: Kang, Y.H.; Jung, T.S.; Kim, H.S.; Ryu, Y.K.; Kim, H.U.; Lee, C.W.;
By: Kang, Y.H.; Jung, T.S.; Kim, H.S.; Ryu, Y.K.; Kim, H.U.; Lee, C.W.;
2012 / IEEE / 978-1-4673-0238-8
By: Young-sik Choi; Sung-hoon You; Sun-hyun Kim; Sang-bae Yi; Yong-han Roh;
By: Young-sik Choi; Sung-hoon You; Sun-hyun Kim; Sang-bae Yi; Yong-han Roh;
2014 / IEEE
By: Mominuzzaman, Sharif Mohammad; Hasan, Mahmudul; Khan, Sabbir Ahmed; Hassan, Rusafa Binte; Deep, Ashfaqul Haq; Rouf, Nirjhor Tahmidur;
By: Mominuzzaman, Sharif Mohammad; Hasan, Mahmudul; Khan, Sabbir Ahmed; Hassan, Rusafa Binte; Deep, Ashfaqul Haq; Rouf, Nirjhor Tahmidur;
1992 / IEEE
By: Mansfield, W.M.; Watts, R.K.; Early, K.; Morris, M.D.; Chin, G.M.; Westerwick, E.H.; Mulgrew, P.; Tennant, D.M.; Rafferty, C.S.; Pinto, M.R.; Park, B.G.; Kim, Y.O.; Jeon, D.Y.; Lee, K.F.; Yan, R.-H.; Ourmazd, A.; Swartz, R.G.; Bokor, J.; Voshchenkov, A.M.;
By: Mansfield, W.M.; Watts, R.K.; Early, K.; Morris, M.D.; Chin, G.M.; Westerwick, E.H.; Mulgrew, P.; Tennant, D.M.; Rafferty, C.S.; Pinto, M.R.; Park, B.G.; Kim, Y.O.; Jeon, D.Y.; Lee, K.F.; Yan, R.-H.; Ourmazd, A.; Swartz, R.G.; Bokor, J.; Voshchenkov, A.M.;
1991 / IEEE / 0-7803-0184-6
By: Inoue, Y.; Sugahara, K.; Wouters, D.J.; Ipposhi, T.; Akasaka, Y.; Nishimura, T.;
By: Inoue, Y.; Sugahara, K.; Wouters, D.J.; Ipposhi, T.; Akasaka, Y.; Nishimura, T.;
1991 / IEEE / 0-7803-0243-5
By: Shibata, H.; Matsuno, T.; Matsunaga, T.; Shinagawa, H.; Kasai, K.; Toyoshima, Y.; Hayashida, H.; Yoshinari, H.; Norishima, M.; Eguchi, T.; Hashimoto, K.;
By: Shibata, H.; Matsuno, T.; Matsunaga, T.; Shinagawa, H.; Kasai, K.; Toyoshima, Y.; Hayashida, H.; Yoshinari, H.; Norishima, M.; Eguchi, T.; Hashimoto, K.;
1990 / IEEE
By: Kirisawa, R.; Shirota, R.; Aritome, S.; Masuoka, F.; Sakui, K.; Nakayama, R.; Endoh, T.;
By: Kirisawa, R.; Shirota, R.; Aritome, S.; Masuoka, F.; Sakui, K.; Nakayama, R.; Endoh, T.;
1992 / IEEE / 0-7803-0817-4
By: Pomp, H.; Manders, W.; Lifka, H.; Juffermans, C.A.H.; Paulzen, G.; Woltjer, R.; Woerlee, P.H.; Walker, A.J.;
By: Pomp, H.; Manders, W.; Lifka, H.; Juffermans, C.A.H.; Paulzen, G.; Woltjer, R.; Woerlee, P.H.; Walker, A.J.;
1994 / IEEE / 0-7803-2111-1
By: Momose, H.S.; Iwai, H.; Saito, M.; Nakamura, S.; Ohguro, T.; Yoshitomi, T.; Ono, M.;
By: Momose, H.S.; Iwai, H.; Saito, M.; Nakamura, S.; Ohguro, T.; Yoshitomi, T.; Ono, M.;
1994 / IEEE / 0-7803-2111-1
By: Green, M.L.; Baumann, F.H.; Manchanda, L.; Krisch, K.S.; Ourmazd, A.; Feldman, L.C.; Brasen, D.;
By: Green, M.L.; Baumann, F.H.; Manchanda, L.; Krisch, K.S.; Ourmazd, A.; Feldman, L.C.; Brasen, D.;
1995 / IEEE
By: Allenspach, M.; Mouret, I.; Burton, D.I.; Wheatley, C.F.; Brews, J.; Pease, R.L.; Titus, J.L.; Galloway, K.; Schrimpf, R.;
By: Allenspach, M.; Mouret, I.; Burton, D.I.; Wheatley, C.F.; Brews, J.; Pease, R.L.; Titus, J.L.; Galloway, K.; Schrimpf, R.;
1996 / IEEE / 0-7803-3342-X
By: Pinto, M.R.; Shih, W.K.; Bude, J.; Jallepalli, S.; Tasch, A.F., Jr; Maziar, C.M.;
By: Pinto, M.R.; Shih, W.K.; Bude, J.; Jallepalli, S.; Tasch, A.F., Jr; Maziar, C.M.;
1996 / IEEE / 0-7803-3106-0
By: Yilmaz, H.; Darwish, M.; Grabowski, W.; Williams, R.K.; Owyang, K.; Chang, M.;
By: Yilmaz, H.; Darwish, M.; Grabowski, W.; Williams, R.K.; Owyang, K.; Chang, M.;
1994 / IEEE / 0-7803-2406-4
By: Woo, J.; Foerstner, J.; Racanelli, M.; Bor-Yuan Hwang; Huang, W.M.; Wang, J.;
By: Woo, J.; Foerstner, J.; Racanelli, M.; Bor-Yuan Hwang; Huang, W.M.; Wang, J.;
1997 / IEEE
By: Yuhua Cheng; Chenming Hu; Ping Keung Ko; Kai Chen; Min-Chie Jeng; Jianhui Huang; Zhihong Liu; Mansun Chan;
By: Yuhua Cheng; Chenming Hu; Ping Keung Ko; Kai Chen; Min-Chie Jeng; Jianhui Huang; Zhihong Liu; Mansun Chan;
1998 / IEEE / 0-7803-4770-6
By: Tanimoto, H.; Katsumata, Y.; Morimoto, T.; Nakamura, S.; Kimijima, H.; Yoshitomi, T.; Iwai, H.; Morifuji, E.; Otaka, S.; Fujimoto, R.; Momose, H.S.; Ohguro, T.;
By: Tanimoto, H.; Katsumata, Y.; Morimoto, T.; Nakamura, S.; Kimijima, H.; Yoshitomi, T.; Iwai, H.; Morifuji, E.; Otaka, S.; Fujimoto, R.; Momose, H.S.; Ohguro, T.;
1998 / IEEE / 0-7803-4500-2
By: Sato, N.; Yonehara, T.; Nakayama, J.; Ito, M.; Matsumura, S.; Ishii, S.;
By: Sato, N.; Yonehara, T.; Nakayama, J.; Ito, M.; Matsumura, S.; Ishii, S.;
1998 / IEEE / 0-9651577-2-5
By: Melaku, Y.; Kennard, M.; Park, D.; Hu, C.; King, T.-J.; Benjamin, N.;
By: Melaku, Y.; Kennard, M.; Park, D.; Hu, C.; King, T.-J.; Benjamin, N.;
1998 / IEEE / 0-7803-4995-4
By: Bowen, C.; Chang, M.-C.; Erdogan, M.U.; Shichijo, H.; Seitchik, J.; Chatterjee, A.;
By: Bowen, C.; Chang, M.-C.; Erdogan, M.U.; Shichijo, H.; Seitchik, J.; Chatterjee, A.;
1998 / IEEE / 0-7803-4774-9
By: Stephenson, R.; Wolf, P.D.; Vandervorst, W.; De Meyer, K.; Badenes, G.; Jansen, Ph.; Biesemans, S.;
By: Stephenson, R.; Wolf, P.D.; Vandervorst, W.; De Meyer, K.; Badenes, G.; Jansen, Ph.; Biesemans, S.;
1999 / IEEE / 0-9651577-3-3
By: Siu, S.; Patrick, R.; Colombo, P.; Alba, S.; Valentini, G.; Vahedi, V.;
By: Siu, S.; Patrick, R.; Colombo, P.; Alba, S.; Valentini, G.; Vahedi, V.;
1999 / IEEE / 0-9651577-3-3
By: Yin Jin; Shoumian Chen; Perera, C.; Sudijono, J.; Susilo, F.; Jianqing Wen; Kumar, A.V.; Xu Zeng;
By: Yin Jin; Shoumian Chen; Perera, C.; Sudijono, J.; Susilo, F.; Jianqing Wen; Kumar, A.V.; Xu Zeng;
1999 / IEEE / 4-930813-93-X
By: Pangon, N.; Degraeve, R.; Naem, A.; Groeseneken, G.; Nigam, T.; Kaczer, B.;
By: Pangon, N.; Degraeve, R.; Naem, A.; Groeseneken, G.; Nigam, T.; Kaczer, B.;
1999 / IEEE / 4-930813-93-X
By: Dutton, R.W.; Jung-Suk Goo; Zhiping Yu; Tae-Young Oh; Bayoumi, A.; Chang-Hoon Choi; Vook, D.; Voorde, P.V.; Min Cao;
By: Dutton, R.W.; Jung-Suk Goo; Zhiping Yu; Tae-Young Oh; Bayoumi, A.; Chang-Hoon Choi; Vook, D.; Voorde, P.V.; Min Cao;
1999 / IEEE / 0-7803-4538-X
By: Mason, P.; Santiesteban, R.; Mack, M.E.; Sawyer, W.; Erokhin, Y.; Treible, R.; Persson, E.;
By: Mason, P.; Santiesteban, R.; Mack, M.E.; Sawyer, W.; Erokhin, Y.; Treible, R.; Persson, E.;