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Topic: Gain 13 Db
Results
2012 / IEEE
By: Faci, S.; Tripon-Canseliet, C.; Chazelas, J.; Decoster, D.; Formont, S.; Magnin, V.; Pagies, A.;
By: Faci, S.; Tripon-Canseliet, C.; Chazelas, J.; Decoster, D.; Formont, S.; Magnin, V.; Pagies, A.;
2011 / IEEE / 978-1-4577-0223-5
By: Entesari, K.; Sanchez-Sinencio, E.; Gamand, P.; Meunier, P.; Varin, G.; Mobarak, M.; Hedayati, H.;
By: Entesari, K.; Sanchez-Sinencio, E.; Gamand, P.; Meunier, P.; Varin, G.; Mobarak, M.; Hedayati, H.;
2007 / IEEE / 1-4244-0687-0
By: Si Moussa, M.; El Kaamouchi, M.; Vanhoenacker-Janvier, D.; Raskin, J.-P.; Bens, A.; Wybo, G.; Delatte, P.;
By: Si Moussa, M.; El Kaamouchi, M.; Vanhoenacker-Janvier, D.; Raskin, J.-P.; Bens, A.; Wybo, G.; Delatte, P.;
2007 / IEEE
By: Delatte, P.; Si Moussa, M.; El Kaamouchi, M.; Vanhoenacker-Janvier, D.; Raskin, J.-P.; Bens, A.; Wybo, G.;
By: Delatte, P.; Si Moussa, M.; El Kaamouchi, M.; Vanhoenacker-Janvier, D.; Raskin, J.-P.; Bens, A.; Wybo, G.;
2007 / IEEE / 978-1-4244-1175-7
By: Bibyk, S.; Roblin, P.; Jongsoo Lee; Young-Gi Kim; Hyo-Dal Park; Chang-Woo Kim;
By: Bibyk, S.; Roblin, P.; Jongsoo Lee; Young-Gi Kim; Hyo-Dal Park; Chang-Woo Kim;
2008 / IEEE / 978-1-4244-1940-1
By: Tutt, M.; Majerus, M.; Hammock, D.; Brown, B.; Kun-Hin To; Jau-Jr Lin; Huang, W.M.;
By: Tutt, M.; Majerus, M.; Hammock, D.; Brown, B.; Kun-Hin To; Jau-Jr Lin; Huang, W.M.;
2008 / IEEE / 978-1-4244-1940-1
By: Ito, M.; Hamada, Y.; Tanomura, M.; Maruhashi, K.; Kishimoto, S.; Orihashi, N.;
By: Ito, M.; Hamada, Y.; Tanomura, M.; Maruhashi, K.; Kishimoto, S.; Orihashi, N.;
2009 / IEEE
By: Shih-En Shih; Siddiqui, M.; Wojtowicz, M.; Heying, B.; Smorchkova, I.P.; Yaochung Chen; Wen-Ben Luo; Sutton, W.E.; Yamauchi, D.M.; Deal, W.R.;
By: Shih-En Shih; Siddiqui, M.; Wojtowicz, M.; Heying, B.; Smorchkova, I.P.; Yaochung Chen; Wen-Ben Luo; Sutton, W.E.; Yamauchi, D.M.; Deal, W.R.;
2010 / IEEE / 978-1-4244-4314-7
By: Heung Mook Kim; Sung Ik Park; Wangrok Oh; Yiyan Wu; Xianbin Wang;
By: Heung Mook Kim; Sung Ik Park; Wangrok Oh; Yiyan Wu; Xianbin Wang;