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Topic: Frequency Dependence
Results
2012 / IEEE
By: Twomey, B.; O'Neill, F.T.; Dowling, D.P.; Anghel, S.D.; Kong, M.G.; Milosavljevic, V.; Law, V.J.;
By: Twomey, B.; O'Neill, F.T.; Dowling, D.P.; Anghel, S.D.; Kong, M.G.; Milosavljevic, V.; Law, V.J.;
2012 / IEEE
By: Jagannathan, S.; Loveless, T.D.; Bhuva, B.L.; Gaspard, N.J.; Massengill, L.W.; Assis, T.; Wen, S.-J.; Wong, R.; Mahatme, N.;
By: Jagannathan, S.; Loveless, T.D.; Bhuva, B.L.; Gaspard, N.J.; Massengill, L.W.; Assis, T.; Wen, S.-J.; Wong, R.; Mahatme, N.;
2012 / IEEE
By: Weiwei Li; Ohki, Y.; Benhong Ouyang; Jiankang Zhao; Shengtao Li; Guilai Yin; Jianying Li;
By: Weiwei Li; Ohki, Y.; Benhong Ouyang; Jiankang Zhao; Shengtao Li; Guilai Yin; Jianying Li;
2011 / IEEE / 978-1-4244-6051-9
By: Yoruk, Y.E.; Celik, S.; Ozen, S.; Helhel, S.; Basyigit, B.; Kurnaz, O.; Bitirgan, M.;
By: Yoruk, Y.E.; Celik, S.; Ozen, S.; Helhel, S.; Basyigit, B.; Kurnaz, O.; Bitirgan, M.;
2011 / IEEE / 978-966-335-357-9
By: Andronov, E.V.; Schurov, V.V.; Fateyev, A.V.; Semibratov, V.P.; Goshin, G.G.;
By: Andronov, E.V.; Schurov, V.V.; Fateyev, A.V.; Semibratov, V.P.; Goshin, G.G.;
2011 / IEEE / 978-1-4577-0653-0
By: Watanabe, K.; Norieda, S.; Murata, K.; Mitsuhashi, H.; Takahashi, K.;
By: Watanabe, K.; Norieda, S.; Murata, K.; Mitsuhashi, H.; Takahashi, K.;
2011 / IEEE / 978-1-4673-2290-4
By: Sasaki, Hayato; Kaneko, Toshiyuki; Tomishima, Atsushi; Sudo, Toshio; Kanazawa, Masato;
By: Sasaki, Hayato; Kaneko, Toshiyuki; Tomishima, Atsushi; Sudo, Toshio; Kanazawa, Masato;
2011 / IEEE / 978-1-4673-2290-4
By: Osaka, Hideki; Sezaki, Naohiro; Ogihara, Masao; Uematsu, Yutaka; Yagyu, Masayoshi; Shinkai, Go; Muraoka, Satoshi;
By: Osaka, Hideki; Sezaki, Naohiro; Ogihara, Masao; Uematsu, Yutaka; Yagyu, Masayoshi; Shinkai, Go; Muraoka, Satoshi;
2011 / IEEE / 978-1-4673-2290-4
By: Slepyan, G. Ya.; Maksimenko, S. A.; Lakhtakia, A.; Shuba, M. V.;
By: Slepyan, G. Ya.; Maksimenko, S. A.; Lakhtakia, A.; Shuba, M. V.;
2012 / IEEE / 978-1-4577-2084-0
By: Changze Liu; Xiaoqing Xu; Jibin Zou; Runsheng Wang; Jinhua Liu; Ru Huang; Yangyuan Wang; Hanming Wu;
By: Changze Liu; Xiaoqing Xu; Jibin Zou; Runsheng Wang; Jinhua Liu; Ru Huang; Yangyuan Wang; Hanming Wu;
2012 / IEEE / 978-1-4673-0238-8
By: Toledano-Luque, M.; Wagner, P.-J.; Reisinger, H.; Kaczer, B.; Grasser, T.;
By: Toledano-Luque, M.; Wagner, P.-J.; Reisinger, H.; Kaczer, B.; Grasser, T.;
2012 / IEEE / 978-1-4673-0442-9
By: Ozkan, T.; Gulmez, G.; Gulmez, Y.; Turhan, E.; Berna Te Neli, N.;
By: Ozkan, T.; Gulmez, G.; Gulmez, Y.; Turhan, E.; Berna Te Neli, N.;
2012 / IEEE / 978-1-4673-0847-2
By: Shaofeng Yu; Pengpeng Ren; Jinhua Liu; Jianping Wang; Changze Liu; Jingang Wu; Jiaojiao Ou; Xiaoqing Xu; Ru Huang; Nanbo Gong; Runsheng Wang; Jibin Zou; Yangyuan Wang; Shiuh-Wuu Lee; Hanming Wu;
By: Shaofeng Yu; Pengpeng Ren; Jinhua Liu; Jianping Wang; Changze Liu; Jingang Wu; Jiaojiao Ou; Xiaoqing Xu; Ru Huang; Nanbo Gong; Runsheng Wang; Jibin Zou; Yangyuan Wang; Shiuh-Wuu Lee; Hanming Wu;
2012 / IEEE / 978-1-4673-1164-9
By: Wagner, S.; Verma, N.; Rieutort-Louis, W.; Sanz-Robinson, J.; Sturm, J.C.;
By: Wagner, S.; Verma, N.; Rieutort-Louis, W.; Sanz-Robinson, J.; Sturm, J.C.;
2015 / IEEE
By: Tanoue, H.; Tanimoto, Y.; Oodate, Y.; Miura-Mattausch, M.; Mattausch, H.J.; Kikuchihara, H.;
By: Tanoue, H.; Tanimoto, Y.; Oodate, Y.; Miura-Mattausch, M.; Mattausch, H.J.; Kikuchihara, H.;
2014 / IEEE
By: Rautenberg, Jens; Schroder, Andreas; Bause, Fabian; Gravenkamp, Hauke; Henning, Bernd;
By: Rautenberg, Jens; Schroder, Andreas; Bause, Fabian; Gravenkamp, Hauke; Henning, Bernd;
2014 / IEEE
By: Abe, Takayuki; Zama, Matsuo; Kumagai, Masaya; Domae, Atsushi; Kaneko, Nobu-Hisa; Oe, Takehiko;
By: Abe, Takayuki; Zama, Matsuo; Kumagai, Masaya; Domae, Atsushi; Kaneko, Nobu-Hisa; Oe, Takehiko;