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Topic: Formal Verification
Results
2012 / IEEE
By: Kuan, J.J.W.; De Paula, F.M.; Gort, M.; Jin Yang; Wilton, S.J.E.; Hu, A.J.; Aamodt, T.M.;
By: Kuan, J.J.W.; De Paula, F.M.; Gort, M.; Jin Yang; Wilton, S.J.E.; Hu, A.J.; Aamodt, T.M.;
2009 / IEEE / 978-1-4577-0236-5
By: Demente, G.; Bruno, R.; Cabrai, A.; Silva, L.; Barros, E.; Prado, B.;
By: Demente, G.; Bruno, R.; Cabrai, A.; Silva, L.; Barros, E.; Prado, B.;
2010 / IEEE / 978-1-60558-719-6
By: Meyer, J.; Henkler, S.; Nickel, U.; von Detten, M.; Schafer, W.;
By: Meyer, J.; Henkler, S.; Nickel, U.; von Detten, M.; Schafer, W.;
2010 / IEEE / 978-1-60558-719-6
By: Heymans, P.; Classen, A.; Raskin, J.-F.; Legay, A.; Schobbens, P.-Y.;
By: Heymans, P.; Classen, A.; Raskin, J.-F.; Legay, A.; Schobbens, P.-Y.;
2011 / IEEE / 978-1-4577-0681-3
By: Basagiannis, S.; Petridou, S.; Katsaros, P.; Papadimitriou, G.; Alexiou, N.;
By: Basagiannis, S.; Petridou, S.; Katsaros, P.; Papadimitriou, G.; Alexiou, N.;
2011 / IEEE / 978-1-61284-666-8
By: Yichen Fan; Qi Gong; Jianguo Zhang; Yuanzhen Zhu; Cancan Wang; Pidong Wang;
By: Yichen Fan; Qi Gong; Jianguo Zhang; Yuanzhen Zhu; Cancan Wang; Pidong Wang;
2011 / IEEE / 978-1-4503-0636-2
By: Nahir, A.; Landa, S.; Golubev, M.; Adir, A.; Ziv, A.; Sokhin, V.; Shurek, G.;
By: Nahir, A.; Landa, S.; Golubev, M.; Adir, A.; Ziv, A.; Sokhin, V.; Shurek, G.;
2011 / IEEE / 978-1-4244-9457-6
By: Dent, P.; Shrivastava, A.; Biscondi, E.; Lell, A.; Rahman, M.; Mingjian Yan; Moharil, S.; Bui, D.; Anderson, T.; Narnur, S.; Mahmood, H.;
By: Dent, P.; Shrivastava, A.; Biscondi, E.; Lell, A.; Rahman, M.; Mingjian Yan; Moharil, S.; Bui, D.; Anderson, T.; Narnur, S.; Mahmood, H.;
2011 / IEEE / 978-1-61284-974-4
By: Crouzen, P.; Becker, B.; Braitling, B.; Wimmer, R.; Hahn, E.M.; Theel, O.; Dhama, A.; Hermanns, H.;
By: Crouzen, P.; Becker, B.; Braitling, B.; Wimmer, R.; Hahn, E.M.; Theel, O.; Dhama, A.; Hermanns, H.;