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Topic: Force Sensors
Results
2012 / IEEE
By: Wen-June Wang; Hsin-Yu Liu; I-Ping Chang; Pei-Jui Wang; Cheng-Wei Tung; Rong-Jyue Wang;
By: Wen-June Wang; Hsin-Yu Liu; I-Ping Chang; Pei-Jui Wang; Cheng-Wei Tung; Rong-Jyue Wang;
2012 / IEEE
By: Dankelman, J.; Jansen, F.W.; Rodrigues, S.P.; Horeman, T.; van den Dobbelsteen, J.J.;
By: Dankelman, J.; Jansen, F.W.; Rodrigues, S.P.; Horeman, T.; van den Dobbelsteen, J.J.;
2011 / IEEE / 978-1-4244-8115-6
By: Kitaaki, Y.; Matsuno, T.; Kaneko, S.; Fukuda, T.; Shiratsuchi, K.; Haraguchi, R.; Noda, A.; Okuda, H.; Domae, Y.; Sumi, K.;
By: Kitaaki, Y.; Matsuno, T.; Kaneko, S.; Fukuda, T.; Shiratsuchi, K.; Haraguchi, R.; Noda, A.; Okuda, H.; Domae, Y.; Sumi, K.;
2011 / IEEE / 978-1-4244-8115-6
By: Dehghani-Sanij, A.A.; Al Khaburi, J.; Hutchinson, J.; Nelson, E.A.;
By: Dehghani-Sanij, A.A.; Al Khaburi, J.; Hutchinson, J.; Nelson, E.A.;
2011 / IEEE / 978-1-4244-8115-6
By: Longfang Yi; Jianhong Zhu; HaiRong Zhu; WeiGuo Ma; Cong Ma; Feng Chen;
By: Longfang Yi; Jianhong Zhu; HaiRong Zhu; WeiGuo Ma; Cong Ma; Feng Chen;
2011 / IEEE / 978-1-4244-8115-6
By: Songmin Jia; Jinhui Fan; Jun Yan; Liwen Gao; Jinbo Sheng; Wei Lu; Xiuzhi Li;
By: Songmin Jia; Jinhui Fan; Jun Yan; Liwen Gao; Jinbo Sheng; Wei Lu; Xiuzhi Li;
2011 / IEEE / 978-1-4577-1190-9
By: Lueth, T.C.; Mehrkens, J.H.; Fietzek, U.M.; Kalaras, A.; Tonn, K.; Niazmand, K.;
By: Lueth, T.C.; Mehrkens, J.H.; Fietzek, U.M.; Kalaras, A.; Tonn, K.; Niazmand, K.;
2011 / IEEE / 978-1-4244-8115-6
By: Xiao, N.; Guo, S.; Jian Guo; Kawanishi, M.; Tamiya, T.; Yoshida, S.; Ma, X.;
By: Xiao, N.; Guo, S.; Jian Guo; Kawanishi, M.; Tamiya, T.; Yoshida, S.; Ma, X.;
2011 / IEEE / 978-1-61284-385-8
By: McLurkin, J.; O'Malley, M.K.; Lynch, A.J.; Hered, W.; Kong, Z.C.; Campbell, E.;
By: McLurkin, J.; O'Malley, M.K.; Lynch, A.J.; Hered, W.; Kong, Z.C.; Campbell, E.;
2011 / IEEE / 978-1-4244-7317-5
By: Kuroda, R.; Matsushita, T.; Kubo, S.; Matsumoto, T.; Kurosaka, M.; Nagamune, K.; Kawaguchi, S.; Araki, D.;
By: Kuroda, R.; Matsushita, T.; Kubo, S.; Matsumoto, T.; Kurosaka, M.; Nagamune, K.; Kawaguchi, S.; Araki, D.;
2011 / IEEE / 978-1-61284-385-8
By: Kawahara, T.; Miyawaki, A.; Shihira-Ishikawa, I.; Kawano, H.; Sugita, M.; Arai, F.; Yamanishi, Y.; Hagiwara, M.;
By: Kawahara, T.; Miyawaki, A.; Shihira-Ishikawa, I.; Kawano, H.; Sugita, M.; Arai, F.; Yamanishi, Y.; Hagiwara, M.;
2011 / IEEE / 978-1-61284-385-8
By: Arcese, L.; Nelson, B.J.; Ferreira, A.; Beyeler, F.; Fruchard, M.;
By: Arcese, L.; Nelson, B.J.; Ferreira, A.; Beyeler, F.; Fruchard, M.;
2011 / IEEE / 978-1-4244-9312-8
By: Furusawa, R.; Urushihara, S.; Takatsu, M.; Kageyama, K.; Ohishi, K.;
By: Furusawa, R.; Urushihara, S.; Takatsu, M.; Kageyama, K.; Ohishi, K.;
2011 / IEEE / 978-1-4244-8115-6
By: Fukuda, T.; Oshima, T.; Koyanagi, K.; Motoyoshi, T.; Shima, Y.; Matsuno, T.;
By: Fukuda, T.; Oshima, T.; Koyanagi, K.; Motoyoshi, T.; Shima, Y.; Matsuno, T.;
2011 / IEEE / 978-1-4244-7317-5
By: Creelman, J.; Urfer, A.; Naidu, D.S.; Bosworth, K.; Chiu, S.; Yi Tang; Jensen, A.; Yihun, Y.; Fassih, A.; Potluri, C.; Anugolu, M.; Sebastian, A.; Chen, C.H.; Kumar, P.; Schoen, M.P.;
By: Creelman, J.; Urfer, A.; Naidu, D.S.; Bosworth, K.; Chiu, S.; Yi Tang; Jensen, A.; Yihun, Y.; Fassih, A.; Potluri, C.; Anugolu, M.; Sebastian, A.; Chen, C.H.; Kumar, P.; Schoen, M.P.;
2011 / IEEE / 978-1-61284-456-5
By: Bolopion, A.; Fatikow, S.; Regnier, S.; Haliyo, S.; Tunnell, R.; Stolle, C.;
By: Bolopion, A.; Fatikow, S.; Regnier, S.; Haliyo, S.; Tunnell, R.; Stolle, C.;
Nanoforce estimation with Kalman filtering applied to a force sensor based on diamagnetic levitation
2011 / IEEE / 978-1-61284-456-5By: Abadie, J.; Piat, E.; Oster, S.;
2011 / IEEE / 978-1-61284-456-5
By: Koseki, Yoshihiko; Okamura, Allison M.; Chinzei, Kiyoyuki; De Lorenzo, Danilo;
By: Koseki, Yoshihiko; Okamura, Allison M.; Chinzei, Kiyoyuki; De Lorenzo, Danilo;
2011 / IEEE / 978-1-4577-2112-0
By: Weilguni, M.; Goebl, W.; Nicolics, J.; Smetana, W.; Gschohsmann, W.; Atassi, I.;
By: Weilguni, M.; Goebl, W.; Nicolics, J.; Smetana, W.; Gschohsmann, W.; Atassi, I.;
2011 / IEEE / 978-4-907764-39-5
By: Nilkhamhang, I.; Tantaworrasilp, A.; Nithi-Uthai, S.; Tungpimolrut, K.; Ekkachai, K.;
By: Nilkhamhang, I.; Tantaworrasilp, A.; Nithi-Uthai, S.; Tungpimolrut, K.; Ekkachai, K.;
2011 / IEEE / 978-1-61284-456-5
By: Min Jeong Kim; Hansang Chae; Tri Cong Phung; Hyouk Ryeol Choi; Dongmin Choi; Ja Choon Koo; Hyungpil Moon; Seung Hoon Shin;
By: Min Jeong Kim; Hansang Chae; Tri Cong Phung; Hyouk Ryeol Choi; Dongmin Choi; Ja Choon Koo; Hyungpil Moon; Seung Hoon Shin;
2011 / IEEE / 978-1-61284-456-5
By: Takubo, T.; Ohara, K.; Kawakami, D.; Arai, T.; Tanikawa, T.; Ichikawa, A.; Mae, Y.;
By: Takubo, T.; Ohara, K.; Kawakami, D.; Arai, T.; Tanikawa, T.; Ichikawa, A.; Mae, Y.;
2011 / IEEE / 978-1-61284-456-5
By: Albu-Schaffer, A.; Grange, S.; Thielmann, S.; Rouiller, P.; Conti, F.; Hagn, U.; Helmer, P.; Tobergte, A.; Hirzinger, G.;
By: Albu-Schaffer, A.; Grange, S.; Thielmann, S.; Rouiller, P.; Conti, F.; Hagn, U.; Helmer, P.; Tobergte, A.; Hirzinger, G.;
2011 / IEEE / 978-1-4577-1589-1
By: Nakada, M.; Hayashi, Y.; Hamada, J.; Kagawa, H.; Watanabe, T.; Yoneyama, T.;
By: Nakada, M.; Hayashi, Y.; Hamada, J.; Kagawa, H.; Watanabe, T.; Yoneyama, T.;