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Topic: Fixation
Results
2011 / IEEE / 978-1-4577-0167-2
By: Bader, R.; Mittelmeier, W.; Ruther, C.; Timm, U.; Ewald, H.; Kluess, D.;
By: Bader, R.; Mittelmeier, W.; Ruther, C.; Timm, U.; Ewald, H.; Kluess, D.;
2007 / RSC Publishing
By: Matilde Fondo; Manuel R. Bermejo; Jesuacutes Sanmartiacuten; Noelia Ocampo; Ana M. GarciacuteaDeibe;
By: Matilde Fondo; Manuel R. Bermejo; Jesuacutes Sanmartiacuten; Noelia Ocampo; Ana M. GarciacuteaDeibe;
2007 / RSC Publishing
By: WingLeung Wong; KwokYin Wong; KamHan Lee; ZhongYuan Zhou; PakHo Chan; KwongChak Cheung;
By: WingLeung Wong; KwokYin Wong; KamHan Lee; ZhongYuan Zhou; PakHo Chan; KwongChak Cheung;
2007 / RSC Publishing
By: Daron E. Janzen; Gregory J. Grant; Donald G. VanDerveer; Maikel E. Botros;
By: Daron E. Janzen; Gregory J. Grant; Donald G. VanDerveer; Maikel E. Botros;
2009 / RSC Publishing
By: Tomoyuki Suzuki; Shinichiro Ichikawa; Yoshiaki Kokubo; Tsunetake Sekifnotereffnotereffootnote idfn2Research Fellow of the Japan Society for the Promotion of Science.footnote; Takao Ikariya; Yoshihito Kayaki;
By: Tomoyuki Suzuki; Shinichiro Ichikawa; Yoshiaki Kokubo; Tsunetake Sekifnotereffnotereffootnote idfn2Research Fellow of the Japan Society for the Promotion of Science.footnote; Takao Ikariya; Yoshihito Kayaki;
2009 / RSC Publishing
By: Heinz Gornitzka; Jean Escudieacute; Wolfgang W. Schoeller; Henri Ranaivonjatovo; Mohamed Lazraq; Sakina EchCherif El Kettani; Dumitru Ghereg;
By: Heinz Gornitzka; Jean Escudieacute; Wolfgang W. Schoeller; Henri Ranaivonjatovo; Mohamed Lazraq; Sakina EchCherif El Kettani; Dumitru Ghereg;
2009 / RSC Publishing
By: YunNan Guo; GongFeng Xu; Lang Zhao; Hongshan Ke; HongJie Zhang; XiYan Zhang; Jinkui Tang;
By: YunNan Guo; GongFeng Xu; Lang Zhao; Hongshan Ke; HongJie Zhang; XiYan Zhang; Jinkui Tang;
2015 / Lippincott Williams & Wilkins Journals
By: Heather A. Vallier; Andrea J. Dolenc; Nickolas J. Nahm; Benjamin R. Childs;
By: Heather A. Vallier; Andrea J. Dolenc; Nickolas J. Nahm; Benjamin R. Childs;
2016 / Lippincott Williams & Wilkins Journals
By: Brandon G. Santoni; Aniruddh N. Nayak; Seth A. Cooper; Ian R. Smithson; Jacob L. Cox; Scott T. Marberry; Roy W. Sanders;
By: Brandon G. Santoni; Aniruddh N. Nayak; Seth A. Cooper; Ian R. Smithson; Jacob L. Cox; Scott T. Marberry; Roy W. Sanders;
1997 / IEEE / 0-7803-4122-8
By: Trappenberg, T.; Dorris, M.C.; Munoz, D.P.; McMullen, P.; Klein, R.M.; Simpson, S.;
By: Trappenberg, T.; Dorris, M.C.; Munoz, D.P.; McMullen, P.; Klein, R.M.; Simpson, S.;
1998 / IEEE / 0-8186-8606-5
By: McDowell, L.; Eledath, J.; Gendel, G.; Pope, A.; Wixson, L.; Hansen, M.;
By: McDowell, L.; Eledath, J.; Gendel, G.; Pope, A.; Wixson, L.; Hansen, M.;
2000 / IEEE / 0-7803-6363-9
By: Pellkofer, M.; Lutzeler, M.; Gregor, R.; Dickmanns, E.D.; Siedersberger, K.H.;
By: Pellkofer, M.; Lutzeler, M.; Gregor, R.; Dickmanns, E.D.; Siedersberger, K.H.;
2000 / IEEE / 0-7803-7117-8
By: Gauthier, H.; Gauthier, R.; Saliba, R.; Petit-Ramel, M.; Meille, J.P.;
By: Gauthier, H.; Gauthier, R.; Saliba, R.; Petit-Ramel, M.; Meille, J.P.;
2005 / IEEE / 0-7803-8741-4
By: Shuqian Luo; Peiping Zhu; Xiulai Gao; Hang Shu; Xin Gao; Bo Liu; Hongxia Yin;
By: Shuqian Luo; Peiping Zhu; Xiulai Gao; Hang Shu; Xin Gao; Bo Liu; Hongxia Yin;
2005 / IEEE / 0-7803-8741-4
By: Zheng, G.; Nolte, L.P.; Vangenot, C.; Di Venuto, C.; Marti, G.; Sagbo, S.;
By: Zheng, G.; Nolte, L.P.; Vangenot, C.; Di Venuto, C.; Marti, G.; Sagbo, S.;
2006 / IEEE / 978-981-05-79
By: Seah, L.K.; Murukeshan, V.M.; Ng, B.K.; Dinish, U.S.; Fu, C.Y.; Lim-Tan, S.K.;
By: Seah, L.K.; Murukeshan, V.M.; Ng, B.K.; Dinish, U.S.; Fu, C.Y.; Lim-Tan, S.K.;
2008 / IEEE / 978-1-4244-2813-7
By: Plukker, S.G.L.; van Zantvoort, J.H.C.; de Waardt, H.; Koonen, A.M.J.; Khoe, G.D.; Dekkers, E.C.A.;
By: Plukker, S.G.L.; van Zantvoort, J.H.C.; de Waardt, H.; Koonen, A.M.J.; Khoe, G.D.; Dekkers, E.C.A.;
2009 / IEEE / 978-1-4244-4999-6
By: Pramadihanto, D.; Purwanto, D.; Arief, Z.; Minato, K.; Sato, T.;
By: Pramadihanto, D.; Purwanto, D.; Arief, Z.; Minato, K.; Sato, T.;
2006 / Springer Science+Business Media / 0930-343X
By: M. Kon; D. Egmond; B. Franssen; E. Wassenaar;
By: M. Kon; D. Egmond; B. Franssen; E. Wassenaar;
2006 / Springer Science+Business Media / 1439-0590
By: Marcus Schönaich; Christine Voigt; Helmut Lill;
By: Marcus Schönaich; Christine Voigt; Helmut Lill;
2006 / Springer Science+Business Media / 0021-5155
By: Takashi Fujikado; Miki Sawa; Yasuo Tano; Yasushi Ikuno; Ayako Toyoda; Fumi Gomi;
By: Takashi Fujikado; Miki Sawa; Yasuo Tano; Yasushi Ikuno; Ayako Toyoda; Fumi Gomi;
2006 / Springer Science+Business Media / 1567-7230
By: Konstantinos Kostarelos; Daniela Reale; Dimitris Dermatas; Ennio Rao; Deok Moon;
By: Konstantinos Kostarelos; Daniela Reale; Dimitris Dermatas; Ennio Rao; Deok Moon;
2007 / Springer Science+Business Media / 0936-8051
By: D. Shanahan; S. Dhillon; S. Deshmukh; R. Bassi; V. Sadaiyyappan; A. Kumar;
By: D. Shanahan; S. Dhillon; S. Deshmukh; R. Bassi; V. Sadaiyyappan; A. Kumar;
2007 / Springer Science+Business Media / 0942-2056
By: Fabio Ziranu; Laura Deriu; Carlo Fabbriciani; Giuseppe Milano; Pier Mulas;
By: Fabio Ziranu; Laura Deriu; Carlo Fabbriciani; Giuseppe Milano; Pier Mulas;
2007 / Springer Science+Business Media / 1672-0733
By: Qun Liu; Guijin Zhu; Wen Chen; Zhou Li; Haining Luo;
By: Qun Liu; Guijin Zhu; Wen Chen; Zhou Li; Haining Luo;
2007 / Springer Science+Business Media / 0032-079X
By: A. Oberson; S. Nanzer; C. Bosshard; D. Dubois; P. Mäder; E. Frossard;
By: A. Oberson; S. Nanzer; C. Bosshard; D. Dubois; P. Mäder; E. Frossard;
2007 / Springer Science+Business Media / 0916-8370
By: Kazuhiro Kogure; James Mitchell; Masahiko Nishimura; Eriko Kamiya; Shinji Izumiyama;
By: Kazuhiro Kogure; James Mitchell; Masahiko Nishimura; Eriko Kamiya; Shinji Izumiyama;
2008 / Springer Science+Business Media / 0942-2056
By: Anthony Bull; Andrew Edwards; Andrew Amis; Ian McDermott; Denny Lie;
By: Anthony Bull; Andrew Edwards; Andrew Amis; Ian McDermott; Denny Lie;
2008 / Springer Science+Business Media / 0942-2056
By: Yong Lee; Jin Ahn; Jin Kim; Jung Park; Jong Park; Chong-Bum Kim; Su Lee;
By: Yong Lee; Jin Ahn; Jin Kim; Jung Park; Jong Park; Chong-Bum Kim; Su Lee;
2008 / Springer Science+Business Media / 0014-4819
By: P. Broekhoven; Caroline Schraa-Tam; Josef Geest; Maarten Frens; Marion Smits; Aad Lugt;
By: P. Broekhoven; Caroline Schraa-Tam; Josef Geest; Maarten Frens; Marion Smits; Aad Lugt;
2008 / Springer Science+Business Media / 0014-4819
By: Donald Goff; Katy Thakkar; Dara Manoach; Jason Barton; Manisha Pandita;
By: Donald Goff; Katy Thakkar; Dara Manoach; Jason Barton; Manisha Pandita;
2008 / Springer Science+Business Media / 0014-4819
By: Patricia Cisarik; Harold Bedell; Jianliang Tong; Thao Lien;
By: Patricia Cisarik; Harold Bedell; Jianliang Tong; Thao Lien;
2008 / Springer Science+Business Media / 1863-9933
By: Arndt Schulz; Stefan Fuchs; Lutz Simon; Klaus Seide; Andreas Paech; Christian Queitsch;
By: Arndt Schulz; Stefan Fuchs; Lutz Simon; Klaus Seide; Andreas Paech; Christian Queitsch;
2008 / Springer Science+Business Media / 0178-2762
By: P. Rekha; A. Arun; Chiu-Chung Young; Wei-An Lai;
By: P. Rekha; A. Arun; Chiu-Chung Young; Wei-An Lai;
2008 / Springer Science+Business Media / 0163-2116
By: Masaki Sanaka; Yasushi Kuyama; Takatsugu Yamamoto;
By: Masaki Sanaka; Yasushi Kuyama; Takatsugu Yamamoto;
2008 / Springer Science+Business Media / 0026-2617
By: I. Tsaplina; E. Krasil’nikova; T. Kondrat’eva; I. Stadnichuk; T. Bogdanova; V. Duda; N. Suzina; L. Zakharchuk; A. Zhuravleva; M. Egorova;
By: I. Tsaplina; E. Krasil’nikova; T. Kondrat’eva; I. Stadnichuk; T. Bogdanova; V. Duda; N. Suzina; L. Zakharchuk; A. Zhuravleva; M. Egorova;
2009 / Springer Science+Business Media / 0942-2056
By: Duncan Meuffels; Jan Verhaar; Marnix Niggebrugge;
By: Duncan Meuffels; Jan Verhaar; Marnix Niggebrugge;
2009 / Springer Science+Business Media / 0942-2056
By: Kelvin Shi; Susan Finkle; Brian Joyce; Chadwick Prodromos; Aaron Hecker;
By: Kelvin Shi; Susan Finkle; Brian Joyce; Chadwick Prodromos; Aaron Hecker;
2009 / Springer Science+Business Media / 1633-8065
By: Jegyun Chon; Chulhyung Lee; Myungsang Moon; Hyunyoon Jeong; Hyeonseok Jeong; Changsoo Lee;
By: Jegyun Chon; Chulhyung Lee; Myungsang Moon; Hyunyoon Jeong; Hyeonseok Jeong; Changsoo Lee;
2009 / Springer Science+Business Media / 1633-8065
By: Mark Dolan; Aaron Glynn; Michael Leonard; Uthman Alao;
By: Mark Dolan; Aaron Glynn; Michael Leonard; Uthman Alao;
2009 / Springer Science+Business Media / 0179-0358
By: G. Fratino; S. Avanzini; A. Molinari; P. Buffa; E. Castagnola; R. Haupt;
By: G. Fratino; S. Avanzini; A. Molinari; P. Buffa; E. Castagnola; R. Haupt;
2009 / Springer Science+Business Media / 1863-2521
By: Sumeet Garg; Matthew Dobbs; Perry Schoenecker; Scott Luhmann; J. Gordon;
By: Sumeet Garg; Matthew Dobbs; Perry Schoenecker; Scott Luhmann; J. Gordon;
2009 / Springer Science+Business Media / 1558-9447
By: John Capo; Tosca Kinchelow; Kenneth Brooks; Virak Tan; Michaele Manigrasso; Kristin Francisco;
By: John Capo; Tosca Kinchelow; Kenneth Brooks; Virak Tan; Michaele Manigrasso; Kristin Francisco;