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Topic: Finite Element Modeling
Results
2011 / IEEE
By: Ameen, A.; Hoon-Sik Kim; Sang Min Won; Rogers, J.A.; Nanshu Lu; Duenas, T.; Del Solar, C.; Dae-Gon Kim;
By: Ameen, A.; Hoon-Sik Kim; Sang Min Won; Rogers, J.A.; Nanshu Lu; Duenas, T.; Del Solar, C.; Dae-Gon Kim;
2012 / IEEE
By: Schlegel, J.P.; Espindola, A.A.; Bastos, J.P.A.; Iamamura, B.A.T.; Batistela, N.J.; Sadowski, N.;
By: Schlegel, J.P.; Espindola, A.A.; Bastos, J.P.A.; Iamamura, B.A.T.; Batistela, N.J.; Sadowski, N.;
2011 / IEEE / 978-1-61284-878-5
By: Mork, J.; Lodahl, P.; Nielsen, T.R.; Gregersen, N.; Yuntian Chen;
By: Mork, J.; Lodahl, P.; Nielsen, T.R.; Gregersen, N.; Yuntian Chen;
2011 / IEEE / 978-2-35500-016-4
By: Wittler, O.; Schacht, R.; Nowak, T.; Lang, K.-D.; Walter, H.; May, D.; Ras, M.A.; Wunderle, B.;
By: Wittler, O.; Schacht, R.; Nowak, T.; Lang, K.-D.; Walter, H.; May, D.; Ras, M.A.; Wunderle, B.;
2011 / IEEE / 978-1-4244-9289-3
By: Bousack, H.; Damalla, D.; von der Emde, G.; Gottwald, M.; Mayekar, K.;
By: Bousack, H.; Damalla, D.; von der Emde, G.; Gottwald, M.; Mayekar, K.;
2011 / IEEE / 978-1-4244-9289-3
By: Uhde, E.; Waag, A.; Merzsch, S.; Doering, L.; Wasisto, H.S.; Peiner, E.;
By: Uhde, E.; Waag, A.; Merzsch, S.; Doering, L.; Wasisto, H.S.; Peiner, E.;
2011 / IEEE / 978-1-61284-704-7
By: Xiaoxi Guo; Lijun Chen; Yongjun Chen; Shaohui Huang; Shaoyin Duan; Boliang Wang;
By: Xiaoxi Guo; Lijun Chen; Yongjun Chen; Shaohui Huang; Shaoyin Duan; Boliang Wang;
2011 / IEEE / 978-1-4577-1982-0
By: De Wolf, I.; Beyne, E.; Cherman, V.; Van der Plas, G.; Vandepitte, D.; Rebibis, K.J.; Vandevelde, B.; Ivankovic, A.; La Manna, A.;
By: De Wolf, I.; Beyne, E.; Cherman, V.; Van der Plas, G.; Vandepitte, D.; Rebibis, K.J.; Vandevelde, B.; Ivankovic, A.; La Manna, A.;
2012 / IEEE / 978-1-4673-1142-7
By: Eucker, S.A.; Sullivan, S.; Hashmi, S.K.; Margulies, S.S.; Lee, J.; Coats, B.;
By: Eucker, S.A.; Sullivan, S.; Hashmi, S.K.; Margulies, S.S.; Lee, J.; Coats, B.;
2012 / IEEE
By: Yamada, R.; Turrioni, D.; Lombardo, V.; Gallo, G.; Bossert, M.; Barzi, E.; Zlobin, A.V.;
By: Yamada, R.; Turrioni, D.; Lombardo, V.; Gallo, G.; Bossert, M.; Barzi, E.; Zlobin, A.V.;
2014 / IEEE
By: Montmitonnet, P.; Blayac, S.; Di-Giacomo, A.; Fornara, P.; Rivero, C.; Orellana, S.; Arrazat, B.; Inal, K.;
By: Montmitonnet, P.; Blayac, S.; Di-Giacomo, A.; Fornara, P.; Rivero, C.; Orellana, S.; Arrazat, B.; Inal, K.;
2015 / IEEE
By: Veltman, A.; Ferreira, J.A.; Polinder, H.; van der Geest, M.; Tsiara, N.; Wolmarans, J.J.;
By: Veltman, A.; Ferreira, J.A.; Polinder, H.; van der Geest, M.; Tsiara, N.; Wolmarans, J.J.;
1993 / IEEE / 0-7803-0794-1
By: Niu, T.M.; McCreary, J.; Clementi, J.; Hill, G.; Varcoe, J.; Palomaki, J.;
By: Niu, T.M.; McCreary, J.; Clementi, J.; Hill, G.; Varcoe, J.; Palomaki, J.;
1994 / IEEE / 0-7803-0914-6
By: Knight, R.W.; Matthai, K.W.; White, J.D.; Johnson, R.W.; Suhling, J.C.; Burcham, S.W.; Romanczuk, C.S.;
By: Knight, R.W.; Matthai, K.W.; White, J.D.; Johnson, R.W.; Suhling, J.C.; Burcham, S.W.; Romanczuk, C.S.;
1993 / IEEE / 0-8186-5470-8
By: Cornhill, J.F.; Veress, A.I.; Thomas, J.D.; Herderick, E.E.; Powell, K.A.;
By: Cornhill, J.F.; Veress, A.I.; Thomas, J.D.; Herderick, E.E.; Powell, K.A.;
1994 / IEEE / 0-7803-2012-3
By: Adamowski, J.C.; Higuti, R.T.; Buiochi, F.; Simon, C.; Silva, E.C.N.;
By: Adamowski, J.C.; Higuti, R.T.; Buiochi, F.; Simon, C.; Silva, E.C.N.;