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Topic: Ferroelectric Switching
Results
2012 / IEEE
By: Nanni, P.; Buscaglia, M.T.; Buscaglia, V.; Harnagea, C.; Azodi, M.; Pignolet, A.; Rosei, F.;
By: Nanni, P.; Buscaglia, M.T.; Buscaglia, V.; Harnagea, C.; Azodi, M.; Pignolet, A.; Rosei, F.;
2010 / IEEE / 978-1-61284-986-7
By: Bennett, J.W.; Grinberg, I.; Tingting Qi; Nelson, K.A.; Ka-Lo Yeh; Rappe, A.M.; Young-Han Shin;
By: Bennett, J.W.; Grinberg, I.; Tingting Qi; Nelson, K.A.; Ka-Lo Yeh; Rappe, A.M.; Young-Han Shin;
2007 / American Institute of Physics
By: Haisheng Xu; Xiaobing Liu; Juhua Zhong; Dong Shen; Jianhua Chen;
By: Haisheng Xu; Xiaobing Liu; Juhua Zhong; Dong Shen; Jianhua Chen;
2008 / American Institute of Physics
By: J. Y. Jo; S. M. Yang; H. S. Han; D. J. Kim; W. S. Choi; T. W. Noh; T. K. Song; J.-G. Yoon; C.-Y. Koo; J.-H. Cheon; S.-H. Kim;
By: J. Y. Jo; S. M. Yang; H. S. Han; D. J. Kim; W. S. Choi; T. W. Noh; T. K. Song; J.-G. Yoon; C.-Y. Koo; J.-H. Cheon; S.-H. Kim;
2008 / American Institute of Physics
By: Klaus Müller; Dipankar Mandal; Karsten Henkel; Ioanna Paloumpa; Dieter Schmeisser;
By: Klaus Müller; Dipankar Mandal; Karsten Henkel; Ioanna Paloumpa; Dieter Schmeisser;
1990 / IEEE / 0-7803-0190-0
By: Sanchez, L.E.; Wu, S.Y.; Geideman, W.A.; Watanabe, S.H.; Naik, I.K.; Liu, W.M.; Maderic, B.P.;
By: Sanchez, L.E.; Wu, S.Y.; Geideman, W.A.; Watanabe, S.H.; Naik, I.K.; Liu, W.M.; Maderic, B.P.;
1992 / IEEE / 0-7803-0465-9
By: Schrimpf, R.D.; Teowee, G.; Lee, S.C.; Galloway, K.F.; Uhlmann, D.R.; Birnie, D.P., III;
By: Schrimpf, R.D.; Teowee, G.; Lee, S.C.; Galloway, K.F.; Uhlmann, D.R.; Birnie, D.P., III;
1994 / IEEE / 0-7803-1847-1
By: Ulenaers, M.J.E.; Moors, W.G.J.; Dormans, G.J.M.; Spierings, G.A.C.M.; Larsen, P.K.;
By: Ulenaers, M.J.E.; Moors, W.G.J.; Dormans, G.J.M.; Spierings, G.A.C.M.; Larsen, P.K.;
1996 / IEEE / 0-7803-3355-1
By: Pan, M.-J.; Cross, L.E.; Yoshikawa, S.; Markowski, K.A.; Park, S.-E.;
By: Pan, M.-J.; Cross, L.E.; Yoshikawa, S.; Markowski, K.A.; Park, S.-E.;
1996 / IEEE / 0-7803-3355-1
By: Pan, M.-J.; Cross, L.E.; Yoshikawa, S.; Park, S.-E.; Markowski, K.A.;
By: Pan, M.-J.; Cross, L.E.; Yoshikawa, S.; Park, S.-E.; Markowski, K.A.;
1999 / IEEE
By: Jiann-Ruey Chen; Chin-Yuan Hsu; Shu, C.Y.; Fang, Y.K.; Jyh-Jier Ho; Chen, F.Y.; Ju, M.S.;
By: Jiann-Ruey Chen; Chin-Yuan Hsu; Shu, C.Y.; Fang, Y.K.; Jyh-Jier Ho; Chen, F.Y.; Ju, M.S.;
1998 / IEEE / 0-7803-4959-8
By: Geunbae Lim; Kyongmi Lee; Jong Up Jeon; Won-Kyu Moon; Pak, Y.E.; Hyunjung Shin; Ki Hyun Yoon; Jeong Hwan Park;
By: Geunbae Lim; Kyongmi Lee; Jong Up Jeon; Won-Kyu Moon; Pak, Y.E.; Hyunjung Shin; Ki Hyun Yoon; Jeong Hwan Park;
1998 / IEEE / 0-7803-4959-8
By: Shrout, T.R.; Park, S.-E.; Yoshikawa, S.; Vedula, V.R.; Pan, M.-J.; Pertsch, P.;
By: Shrout, T.R.; Park, S.-E.; Yoshikawa, S.; Vedula, V.R.; Pan, M.-J.; Pertsch, P.;
1999 / IEEE / 0-7803-5025-1
By: Giacometti, J.A.; de Figueiredo, M.T.; Hoschkara, M.; von Seggern, H.; Ferreira, G.F.L.;
By: Giacometti, J.A.; de Figueiredo, M.T.; Hoschkara, M.; von Seggern, H.; Ferreira, G.F.L.;
2000 / IEEE
By: Jeong Hwan Park; Kyung-Mee Lee; Hyunjung Shin; Ki Hyun Yoon; Won-Kyu Moon; Pak, Y.E.; Geunbae Lim; Jong Up Jeon;
By: Jeong Hwan Park; Kyung-Mee Lee; Hyunjung Shin; Ki Hyun Yoon; Won-Kyu Moon; Pak, Y.E.; Geunbae Lim; Jong Up Jeon;
1996 / IEEE / 1-55752-443-2
By: Yariv, A.; Min Zhang; Xiaolin Tong; Agranat, A.; Leyva, V.; Hofmeister, R.;
By: Yariv, A.; Min Zhang; Xiaolin Tong; Agranat, A.; Leyva, V.; Hofmeister, R.;
2001 / IEEE / 0-7803-7197-6
By: Sidorkin, A.A.; Sidorkin, A.S.; Milovidova, S.D.; Rogazinskaya, O.V.;
By: Sidorkin, A.A.; Sidorkin, A.S.; Milovidova, S.D.; Rogazinskaya, O.V.;
2000 / IEEE / 0-7803-5940-2
By: Ryu, S.O.; Yoo, I.K.; Chung, J.W.; Kim, B.M.; Lee, J.K.; Suchicital, C.;
By: Ryu, S.O.; Yoo, I.K.; Chung, J.W.; Kim, B.M.; Lee, J.K.; Suchicital, C.;
2000 / IEEE / 0-7803-5940-2
By: Sung An Kim; Seong Jun Kang; Dong Hoon Chang; Yung Sup Yoon; Kook Pyo Lee;
By: Sung An Kim; Seong Jun Kang; Dong Hoon Chang; Yung Sup Yoon; Kook Pyo Lee;
2001 / IEEE / 1-55752-662-1
By: Fejer, M.M.; Alexandrovski, A.; Nakamura, M.; Takekawa, S.; Furukawa, Y.; Kitamura, K.;
By: Fejer, M.M.; Alexandrovski, A.; Nakamura, M.; Takekawa, S.; Furukawa, Y.; Kitamura, K.;
2001 / IEEE / 1-55752-662-1
By: Nakamura, M.; Takekawa, S.; Furukawab, Y.; Kitamura, K.; Fejer, M.M.; Alexandrovski, A.;
By: Nakamura, M.; Takekawa, S.; Furukawab, Y.; Kitamura, K.; Fejer, M.M.; Alexandrovski, A.;
2001 / IEEE
By: Hoya, K.; Kamoshida, M.; Ogiwara, R.; Itoh, Y.; Miyakawa, T.; Takeuchi, Y.; Doumae, S.M.; Oowaki, Y.; Kunishima, I.; Takashima, D.; Yamakawa, K.; Kanaya, H.; Ozaki, T.;
By: Hoya, K.; Kamoshida, M.; Ogiwara, R.; Itoh, Y.; Miyakawa, T.; Takeuchi, Y.; Doumae, S.M.; Oowaki, Y.; Kunishima, I.; Takashima, D.; Yamakawa, K.; Kanaya, H.; Ozaki, T.;
2001 / IEEE / 0-7803-6520-8
By: Koike, H.; Maejima, Y.; Yamada, J.; Takeuchi, H.; Seike, A.; Tanabe, N.; Mori, H.; Toyoshima, H.; Hada, H.; Hase, T.; Kasai, N.; Miwa, T.; Sugiyama, H.; Nakura, T.; Kobayashi, S.; Tatsumi, T.;
By: Koike, H.; Maejima, Y.; Yamada, J.; Takeuchi, H.; Seike, A.; Tanabe, N.; Mori, H.; Toyoshima, H.; Hada, H.; Hase, T.; Kasai, N.; Miwa, T.; Sugiyama, H.; Nakura, T.; Kobayashi, S.; Tatsumi, T.;
2001 / IEEE / 0-7803-6520-8
By: Yu, J.; Sun, J.L.; Meng, X.J.; Lai, Z.Q.; Wang, G.S.; Chu, J.H.; Guo, S.L.;
By: Yu, J.; Sun, J.L.; Meng, X.J.; Lai, Z.Q.; Wang, G.S.; Chu, J.H.; Guo, S.L.;
2002 / IEEE / 1-55752-706-7
By: Hatano, H.; Kurimura, S.; Nakamura, M.; Jayavel, R.; Liu, Y.; Kitamura, K.;
By: Hatano, H.; Kurimura, S.; Nakamura, M.; Jayavel, R.; Liu, Y.; Kitamura, K.;
2002 / IEEE / 1-55752-706-7
By: Marowsky, G.; Soria, S.; Aktsipetrov, O.A.; Murzina, T.V.; Fokin, Yu.G.;
By: Marowsky, G.; Soria, S.; Aktsipetrov, O.A.; Murzina, T.V.; Fokin, Yu.G.;