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Topic: Environmental Degradation
Results
2011 / IEEE / 978-1-4577-1354-5
By: Niaz, H.; Solangi, K.H.; Saidur, R.; Rahim, N.A.; Fayaz, H.; Hossain, M.S.;
By: Niaz, H.; Solangi, K.H.; Saidur, R.; Rahim, N.A.; Fayaz, H.; Hossain, M.S.;
2011 / IEEE / 978-1-4244-8165-1
By: Jingtao Hou; Yingyong Ge; Yuanlong Zhang; Meijia Shi; Zhichao Yang;
By: Jingtao Hou; Yingyong Ge; Yuanlong Zhang; Meijia Shi; Zhichao Yang;
2011 / IEEE / 978-1-4244-8165-1
By: Ping Ning; Li-ping Yang; Jian-hong Huang; Yu Zhou; Xin-yun Zhou;
By: Ping Ning; Li-ping Yang; Jian-hong Huang; Yu Zhou; Xin-yun Zhou;
2011 / IEEE / 978-1-4577-1005-6
By: Lehmann, E.; Tapley, I.; Caccetta, P.; Lowell, K.; Zheng-Shu Zhou; Milne, A.; Mitchell, A.L.; Held, A.;
By: Lehmann, E.; Tapley, I.; Caccetta, P.; Lowell, K.; Zheng-Shu Zhou; Milne, A.; Mitchell, A.L.; Held, A.;
2011 / IEEE / 978-1-4577-1643-0
By: Mackay, R.; Craenen, B.; Picioreanu, C.; Schmidt, S.I.; Theodoropoulos, G.; Kreft, J.;
By: Mackay, R.; Craenen, B.; Picioreanu, C.; Schmidt, S.I.; Theodoropoulos, G.; Kreft, J.;
2011 / IEEE / 978-1-4577-0045-3
By: Kwan, P.; Al-Mamun, H.A.; Shihavuddin, A.; Bari, A.S.M.H.; Ahmed, F.;
By: Kwan, P.; Al-Mamun, H.A.; Shihavuddin, A.; Bari, A.S.M.H.; Ahmed, F.;
2011 / American Institute of Physics
By: C. C. White; K. T. Tan; E. P. O'Brien; D. L. Hunston; R. S. Williams; J. W. Chin;
By: C. C. White; K. T. Tan; E. P. O'Brien; D. L. Hunston; R. S. Williams; J. W. Chin;
1988 / IEEE
By: Tsao, S.S.; Thome, F.V.; Fleetwood, D.M.; Schwank, J.R.; Dandini, V.J.; Dressendorfer, P.V.;
By: Tsao, S.S.; Thome, F.V.; Fleetwood, D.M.; Schwank, J.R.; Dandini, V.J.; Dressendorfer, P.V.;
1991 / IEEE / 0-87942-585-7
By: Boltshauser, T.E.; Denton, D.D.; Buncick, M.C.; Ralston, A.R.K.; Baltes, H.P.; Funk, J.M.;
By: Boltshauser, T.E.; Denton, D.D.; Buncick, M.C.; Ralston, A.R.K.; Baltes, H.P.; Funk, J.M.;
1992 / IEEE / 0-7803-0649-X
By: Dong-Young, Y.; Hwangbo, S.; Jeong, D.-W.; Sim, S.-J.; Suh, K.S.; Han, M.-K.; Lee, J.-H.;
By: Dong-Young, Y.; Hwangbo, S.; Jeong, D.-W.; Sim, S.-J.; Suh, K.S.; Han, M.-K.; Lee, J.-H.;