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Topic: Electron Trajectories
Results
1989 / IEEE
By: Mock, R.; Sheridan, T.; Baldwin, G.T.; Carlson, G.A.; Beutler, D.E.; Klingler, R.S.; Halbleib, J.A.; Sanford, T.W.L.; Poukey, J.W.; Knott, D.P.;
By: Mock, R.; Sheridan, T.; Baldwin, G.T.; Carlson, G.A.; Beutler, D.E.; Klingler, R.S.; Halbleib, J.A.; Sanford, T.W.L.; Poukey, J.W.; Knott, D.P.;
1993 / IEEE
By: Abe, K.; Antilogus, P.; Aston, D.; Baird, K.; Bean, A.; Ben-David, R.; Bienz, T.; Bird, F.; Caldwell, D.O.; Cavalli-Sforza, M.; Coller, J.; Coyle, P.; Coyne, D.; Dasu, S.; Dolinsky, S.; d'Oliveira, A.; Duboscq, J.; Dunwoodie, W.; Hallewell, G.; Hasegawa, K.; Hasegawa, Y.; Huber, J.; Iwasaki, Y.; Jacques, P.; Johnson, R.A.; Kalelkar, M.; Kawahara, H.; Kwon, Y.; Leith, D.W.G.S.; Liu, X.; Lu, A.; Manly, S.; Martinez, J.; Mathys, L.; McHugh, S.; Meadows, B.; Muller, G.; Muller, D.; Nagamine, T.; Nussbaum, M.; Pavel, T.J.; Plano, R.; Ratcliff, B.; Rensing, P.; Santha, A.K.S.; Schultz, D.; Shank, J.T.; Shapiro, S.; Simopoulos, C.; Snyder, J.; Sokoloff, M.D.; Solodov, E.; Stamer, P.; Stockdale, I.; Suekane, F.; Toge, N.; Turk, J.; Va'vra, J.; Whitaker, J.S.; Williams, D.A.; Williams, S.H.; Wilson, R.J.; Word, G.; Yellin, S.; Yuta, H.;
By: Abe, K.; Antilogus, P.; Aston, D.; Baird, K.; Bean, A.; Ben-David, R.; Bienz, T.; Bird, F.; Caldwell, D.O.; Cavalli-Sforza, M.; Coller, J.; Coyle, P.; Coyne, D.; Dasu, S.; Dolinsky, S.; d'Oliveira, A.; Duboscq, J.; Dunwoodie, W.; Hallewell, G.; Hasegawa, K.; Hasegawa, Y.; Huber, J.; Iwasaki, Y.; Jacques, P.; Johnson, R.A.; Kalelkar, M.; Kawahara, H.; Kwon, Y.; Leith, D.W.G.S.; Liu, X.; Lu, A.; Manly, S.; Martinez, J.; Mathys, L.; McHugh, S.; Meadows, B.; Muller, G.; Muller, D.; Nagamine, T.; Nussbaum, M.; Pavel, T.J.; Plano, R.; Ratcliff, B.; Rensing, P.; Santha, A.K.S.; Schultz, D.; Shank, J.T.; Shapiro, S.; Simopoulos, C.; Snyder, J.; Sokoloff, M.D.; Solodov, E.; Stamer, P.; Stockdale, I.; Suekane, F.; Toge, N.; Turk, J.; Va'vra, J.; Whitaker, J.S.; Williams, D.A.; Williams, S.H.; Wilson, R.J.; Word, G.; Yellin, S.; Yuta, H.;
1996 / IEEE / 0-7803-3594-5
By: Rogovin, V.I.; Pimenov, V.G.; Penzyakov, V.V.; Petrosyan, A.I.; Shesterkin, V.I.; Semyonov, V.C.; Grigoriev, Y.A.; Kudryashov, V.P.;
By: Rogovin, V.I.; Pimenov, V.G.; Penzyakov, V.V.; Petrosyan, A.I.; Shesterkin, V.I.; Semyonov, V.C.; Grigoriev, Y.A.; Kudryashov, V.P.;
1999 / IEEE / 0-7803-5224-6
By: Wang, W.C.; Wan, C.H.; Lin, C.M.; Lai, J.T.; Lan, Y.C.; Hu, Y.; Lin, T.L.; Tsai, J.H.; Chen, S.H.;
By: Wang, W.C.; Wan, C.H.; Lin, C.M.; Lai, J.T.; Lan, Y.C.; Hu, Y.; Lin, T.L.; Tsai, J.H.; Chen, S.H.;
1999 / IEEE / 0-7803-5829-5
By: Yoshikawa, K.; Toku, H.; Yamamoto, Y.; Masuda, K.; Hoshino, C.; Ohnishi, M.;
By: Yoshikawa, K.; Toku, H.; Yamamoto, Y.; Masuda, K.; Hoshino, C.; Ohnishi, M.;
2001 / IEEE / 0-7803-7120-8
By: McLean, J.; Goldsack, T.J.; Cooper, G.M.; Threadgold, J.; Forster, D.W.; Pearce, A.G.;
By: McLean, J.; Goldsack, T.J.; Cooper, G.M.; Threadgold, J.; Forster, D.W.; Pearce, A.G.;
2002 / IEEE / 0-7803-7407-X
By: Stockwell, B.; Bohlen, H.; Wright, E.; Balkcum, A.; Zitelli, L.; Friedlander, F.; Lenci, S.; Eisen, E.; Cox, L.; Cattelino, M.;
By: Stockwell, B.; Bohlen, H.; Wright, E.; Balkcum, A.; Zitelli, L.; Friedlander, F.; Lenci, S.; Eisen, E.; Cox, L.; Cattelino, M.;
2001 / IEEE / 966-7968-00-6
By: Golenitskii, I.I.; Doukhina, N.G.; Batrakov, A.A.; Koushchevskaja, T.P.;
By: Golenitskii, I.I.; Doukhina, N.G.; Batrakov, A.A.; Koushchevskaja, T.P.;
2004 / IEEE / 0-7803-8261-7
By: Trubetskov, D.I.; Sokolov, D.V.; Ryskin, N.M.; Rozhnev, A.G.; Khomitch, V.B.; Rumyantsev, S.A.; Pobedonostsev, A.S.;
By: Trubetskov, D.I.; Sokolov, D.V.; Ryskin, N.M.; Rozhnev, A.G.; Khomitch, V.B.; Rumyantsev, S.A.; Pobedonostsev, A.S.;
2006 / IEEE / 1-4244-0125-9
By: Ho, H.F.; Shin, L.J.; Chung, M.; Tzeng, Y.; Weng, M.H.; Chiou, J.M.; Huang, B.R.;
By: Ho, H.F.; Shin, L.J.; Chung, M.; Tzeng, Y.; Weng, M.H.; Chiou, J.M.; Huang, B.R.;
2005 / IEEE / 0-7803-9300-7
By: Jinwoo Yoo; Pashkovsky, V.G.; Volynets, V.N.; Wontaek Park; Tolmachev, Yu.N.;
By: Jinwoo Yoo; Pashkovsky, V.G.; Volynets, V.N.; Wontaek Park; Tolmachev, Yu.N.;
2005 / IEEE / 0-7803-9300-7
By: Tran, H.; Bauer, A.; Shephard, M.; Read, M.; Beall, M.; Vogler, W.; Ives, L.; Thuc Bui; Neilson, J.;
By: Tran, H.; Bauer, A.; Shephard, M.; Read, M.; Beall, M.; Vogler, W.; Ives, L.; Thuc Bui; Neilson, J.;
Collection field dependence of charging-up of insulators in low voltage scanning electron microscope
2007 / IEEE / 978-4-9902472-4-9By: Maekawa, T.; Kotera, M.; Tanaka, H.;
2007 / IEEE / 978-4-9902472-4-9
By: Aoki, T.; Neo, Y.; Saito, N.; Sakai, T.; Mimura, H.; Kanemaru, S.; Yasumuro, C.; Nagao, M.; Soda, T.;
By: Aoki, T.; Neo, Y.; Saito, N.; Sakai, T.; Mimura, H.; Kanemaru, S.; Yasumuro, C.; Nagao, M.; Soda, T.;
2008 / IEEE / 978-1-55752-859-9
By: Kim Ta Phuoc; Albert, F.; Rousse, A.; Lefrou, T.; Shah, R.; Douillet, D.; Tafzi, A.; Burgy, F.; Fitour, R.;
By: Kim Ta Phuoc; Albert, F.; Rousse, A.; Lefrou, T.; Shah, R.; Douillet, D.; Tafzi, A.; Burgy, F.; Fitour, R.;
2009 / IEEE / 978-1-4244-3500-5
By: Liang Pan; Xiaobing Zhang; Wei Lei; Yunsong Di; Chaobo Min; Rui Lu;
By: Liang Pan; Xiaobing Zhang; Wei Lei; Yunsong Di; Chaobo Min; Rui Lu;
2010 / Springer Science+Business Media / 0164-0313
By: Mahmood Sedaghatizade; Fatemeh Khodadadi Azadboni;
By: Mahmood Sedaghatizade; Fatemeh Khodadadi Azadboni;
2010 / Springer Science+Business Media / 0164-0313
By: Mahmood Sedaghatizade; Fatemeh Khodadadi Azadboni;
By: Mahmood Sedaghatizade; Fatemeh Khodadadi Azadboni;
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