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Topic: Electromechanical Effects
Results
2011 / IEEE
By: Gajendiran, V.; Jee Lean Lim; Yong Cheng Poh; Peng Du; OrGrady, G.; Cheng, L.K.; Pullan, A.J.; Buist, M.L.;
By: Gajendiran, V.; Jee Lean Lim; Yong Cheng Poh; Peng Du; OrGrady, G.; Cheng, L.K.; Pullan, A.J.; Buist, M.L.;
Predictor-Based Compensation for Electromechanical Delay During Neuromuscular Electrical Stimulation
2011 / IEEEBy: Gregory, C.M.; Sharma, N.; Dixon, W.E.;
Tem analyses of the local crystal and domain structures in (na1-xkx)0.5bi0.5tio3 perovskite ceramics
2011 / IEEEBy: Skapin, S.D.; Otonicar, M.; Jancar, B.;
2011 / IEEE
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
By: Shih, W.Y.; Youngsoo Chung; Wei Wu; Xiang Li; Shung, K.K.; Qifa Zhou; Wei-Heng Shih;
2012 / IEEE
By: Matsuda, T.; Miura, M.; Hara, M.; Matsuda, S.; Hashimoto, K.; Satoh, Y.; Ueda, U.M.;
By: Matsuda, T.; Miura, M.; Hara, M.; Matsuda, S.; Hashimoto, K.; Satoh, Y.; Ueda, U.M.;
Study of erosion resistance and mechanical properties of unsaturated polyester based nano-composites
2012 / IEEEBy: D'Melo, D.; Singal, V.; Bhattacharya, S.; Chaudhari, L.; Sharma, R.A.; Nehete, K.;
2011 / IEEE / 978-1-61284-385-8
By: Askew, S.; Abdallah, M.; Diftler, R.; Linn, D.; Permenter, F.; Ihrke, C.; Platt, R.; Bridgewater, L.;
By: Askew, S.; Abdallah, M.; Diftler, R.; Linn, D.; Permenter, F.; Ihrke, C.; Platt, R.; Bridgewater, L.;
2011 / IEEE / 978-1-61284-777-1
By: Jun Liu; Weili Shi; Zhenxin Tan; Chenyang Xue; Wendong Zhang; Jijun Xiong; Binzhen Zhang;
By: Jun Liu; Weili Shi; Zhenxin Tan; Chenyang Xue; Wendong Zhang; Jijun Xiong; Binzhen Zhang;
2011 / IEEE / 978-1-4577-1025-4
By: Galantini, F.; De Rossi, D.; Levita, G.; Carpi, F.; Gallone, G.;
By: Galantini, F.; De Rossi, D.; Levita, G.; Carpi, F.; Gallone, G.;
2011 / IEEE / 978-1-4673-0378-1
By: Delaiba, A.C.; Saraiva, E.; Baltar, F.J.A.; Rosentino, A.J.P.; Guimaraes, R.; Fernandes, D.; Neves, W.; De Oliveira, J.C.; Lynce, M.;
By: Delaiba, A.C.; Saraiva, E.; Baltar, F.J.A.; Rosentino, A.J.P.; Guimaraes, R.; Fernandes, D.; Neves, W.; De Oliveira, J.C.; Lynce, M.;
2011 / IEEE / 978-1-61284-972-0
By: Jennings, S.; Cavagnino, A.; Boglietti, A.; Staton, D.; Popescu, M.; Barucki, T.;
By: Jennings, S.; Cavagnino, A.; Boglietti, A.; Staton, D.; Popescu, M.; Barucki, T.;
2011 / IEEE / 978-2-87487-023-1
By: Mulloni, V.; Resta, G.; Solazzi, F.; Farinelli, P.; Margesin, B.;
By: Mulloni, V.; Resta, G.; Solazzi, F.; Farinelli, P.; Margesin, B.;
2011 / IEEE / 978-1-4673-1078-9
By: Long Wu; Ming-Cheng Chure; Chia-Cheng Tung; Bing-Huei Chen; King-Kung Wu;
By: Long Wu; Ming-Cheng Chure; Chia-Cheng Tung; Bing-Huei Chen; King-Kung Wu;
2012 / IEEE / 978-1-4673-1405-3
By: Lenaghan, S.; Zhonghua Xu; Mingjun Zhang; Lijin Xia; Gilmore, D.;
By: Lenaghan, S.; Zhonghua Xu; Mingjun Zhang; Lijin Xia; Gilmore, D.;
2010 / American Institute of Physics
By: O. Ovchinnikov; S. Jesse; S. Guo; K. Seal; P. Bintachitt; I. Fujii; S. Trolier-McKinstry; S. V. Kalinin;
By: O. Ovchinnikov; S. Jesse; S. Guo; K. Seal; P. Bintachitt; I. Fujii; S. Trolier-McKinstry; S. V. Kalinin;
2007 / American Institute of Physics
By: Takahiko Yanagitani; Masato Kiuchi; Mami Matsukawa; Yoshiaki Watanabe;
By: Takahiko Yanagitani; Masato Kiuchi; Mami Matsukawa; Yoshiaki Watanabe;
2008 / American Institute of Physics
By: Veng-cheong Lo; Winnie Wing-yee Chung; Haixia Cao; Xiao Dai;
By: Veng-cheong Lo; Winnie Wing-yee Chung; Haixia Cao; Xiao Dai;
1991 / IEEE
By: Quate, C.F.; Steinmetz, D.; Akamine, S.; Ho, J.; Lujan, R.; Rawson, E.G.; Khuri-Yakub, B.T.; Hadimioglu, B.; Zesch, J.C.; Lim, M.;
By: Quate, C.F.; Steinmetz, D.; Akamine, S.; Ho, J.; Lujan, R.; Rawson, E.G.; Khuri-Yakub, B.T.; Hadimioglu, B.; Zesch, J.C.; Lim, M.;
Electrokinetics and electromechanics in controlled release from ionizable gels: theory & experiments
1994 / IEEE / 0-7803-2050-6By: Siegel, R.A.; Sachs, J.R.;
1995 / IEEE / 0-7803-2940-6
By: Palmier, D.; Philippot, E.; Bigler, E.; Zarembovitch, A.; Martin, G.; Bonjour, C.; Gohier, R.;
By: Palmier, D.; Philippot, E.; Bigler, E.; Zarembovitch, A.; Martin, G.; Bonjour, C.; Gohier, R.;
1995 / IEEE / 0-7803-2040-9
By: Llewellyn, J.P.; Lewis, T.J.; Hampton, R.N.; Freestone, J.; Van Der Sluijs, M.J.;
By: Llewellyn, J.P.; Lewis, T.J.; Hampton, R.N.; Freestone, J.; Van Der Sluijs, M.J.;
1996 / IEEE / 0-7803-3615-1
By: Hawkins, P.; Lethiecq, M.; Levassort, F.; Millar, C.E.; Gomez, T.; Ringgard, E.; James, A.; Montero de Espinosa, F.;
By: Hawkins, P.; Lethiecq, M.; Levassort, F.; Millar, C.E.; Gomez, T.; Ringgard, E.; James, A.; Montero de Espinosa, F.;