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Topic: Electrode
Results
2011 / IEEE
By: Chi-Yen Huang; Chie-Tong Kuo; I-Min Jiang; Ru-Hsien Chiang; Cheng-Hsiung Chen; Chi-Huang Lin;
By: Chi-Yen Huang; Chie-Tong Kuo; I-Min Jiang; Ru-Hsien Chiang; Cheng-Hsiung Chen; Chi-Huang Lin;
2011 / IEEE / 978-1-4577-0860-2
By: Chenping Lv; Shichao Xu; Lidan Sun; Juan Chen; Hainan Wang; Jimei Zhang; Yueqian Yang; Heng Miao; Jiangli Lou;
By: Chenping Lv; Shichao Xu; Lidan Sun; Juan Chen; Hainan Wang; Jimei Zhang; Yueqian Yang; Heng Miao; Jiangli Lou;
2011 / IEEE / 978-1-61284-777-1
By: Yuang-Cherng Chiou; Chii-Rong Yang; Ming-Hua Shiao; Nien-Nan Chu; Rong-Tsong Lee; Chun-Ting Lin; Mao-Jung Huang; Chun-Ming Chang;
By: Yuang-Cherng Chiou; Chii-Rong Yang; Ming-Hua Shiao; Nien-Nan Chu; Rong-Tsong Lee; Chun-Ting Lin; Mao-Jung Huang; Chun-Ming Chang;
2011 / IEEE / 978-0-9541146-3-3
By: Xiaolu Wang; Fangming Ruan; Dlugosz, T.; Feng Zhou; Huaiyu Wang;
By: Xiaolu Wang; Fangming Ruan; Dlugosz, T.; Feng Zhou; Huaiyu Wang;
2011 / IEEE / 978-1-4577-1589-1
By: Aryan, N.P.; Rothermel, A.; Heusel, G.; Kibbel, S.; Brendler, C.; Asad, M.I.H.B.;
By: Aryan, N.P.; Rothermel, A.; Heusel, G.; Kibbel, S.; Brendler, C.; Asad, M.I.H.B.;
2011 / IEEE / 978-2-87487-022-4
By: Jess, N.; Baillargeat, D.; Delhote, N.; Gonzalez, J.M.; McGarry, S.; Roy, L.;
By: Jess, N.; Baillargeat, D.; Delhote, N.; Gonzalez, J.M.; McGarry, S.; Roy, L.;
2011 / IEEE / 978-0-9568086-0-8
By: Suganuma, K.; Kiju Lee; Strogies, J.; Wilke, K.; Albrecht, H.; Ueshima, M.; Kim, K.;
By: Suganuma, K.; Kiju Lee; Strogies, J.; Wilke, K.; Albrecht, H.; Ueshima, M.; Kim, K.;
Quick repairing of defects inside telescoping multi-walled carbon nanotubes using contact resistance
2011 / IEEE / 978-1-4577-1516-7By: Fukuda, T.; Saito, Y.; Yang, Z.; Ode, Y.; Nakajima, M.;
2012 / IEEE / 978-1-4673-0847-2
By: Nohisa, T.; Iguchi, N.; Okamoto, K.; Miyamura, M.; Hada, H.; Sakamoto, T.; Tada, M.; Banno, N.;
By: Nohisa, T.; Iguchi, N.; Okamoto, K.; Miyamura, M.; Hada, H.; Sakamoto, T.; Tada, M.; Banno, N.;
2012 / IEEE / 978-1-4577-1772-7
By: Friedrich Russold, M.; Lewis, S.; Kaniusas, E.; Meiners, T.; Gail, A.; Westendorff, S.; Dietl, H.; Krautschneider, W.; Schroder, D.; Abu-Saleh, L.; Hoffmann, K.; Dorge, T.; Ruff, R.;
By: Friedrich Russold, M.; Lewis, S.; Kaniusas, E.; Meiners, T.; Gail, A.; Westendorff, S.; Dietl, H.; Krautschneider, W.; Schroder, D.; Abu-Saleh, L.; Hoffmann, K.; Dorge, T.; Ruff, R.;
2012 / IEEE / 978-1-4673-1618-7
By: Kawamoto, Hiroaki; Ianov, Alexsandr Igorevitch; Sankai, Yoshiyuki;
By: Kawamoto, Hiroaki; Ianov, Alexsandr Igorevitch; Sankai, Yoshiyuki;
2012 / IEEE / 978-1-4673-1137-3
By: Seungmoo Lee; Honggun Kim; Jinhyung Park; Chilhee Chung; Ho-Kyu Kang; Seok Woo Nam; Mansug Kang; Namjin Cho; Eunkee Hong; Hayoung Yi; Young-Ho Koh; YongSoon Choi; ByeongJu Bae; Jun-Won Lee; Seungheon Lee;
By: Seungmoo Lee; Honggun Kim; Jinhyung Park; Chilhee Chung; Ho-Kyu Kang; Seok Woo Nam; Mansug Kang; Namjin Cho; Eunkee Hong; Hayoung Yi; Young-Ho Koh; YongSoon Choi; ByeongJu Bae; Jun-Won Lee; Seungheon Lee;
2012 / IEEE / 978-1-4673-1786-3
By: Ohta, J.; Sasagawa, K.; Davis, P.; Keren Li; Bing Zhang; Matsuda, T.;
By: Ohta, J.; Sasagawa, K.; Davis, P.; Keren Li; Bing Zhang; Matsuda, T.;
2012 / IEEE
By: Xinjun Liu; Jungho Shin; Myungwoo Son; Hyunsang Hwang; Moon-Ho Ham; Seungjae Jung; Sadaf, S.M.; Jubong Park; Seonghyun Kim; Wootae Lee; Sangsu Park; Daeseok Lee;
By: Xinjun Liu; Jungho Shin; Myungwoo Son; Hyunsang Hwang; Moon-Ho Ham; Seungjae Jung; Sadaf, S.M.; Jubong Park; Seonghyun Kim; Wootae Lee; Sangsu Park; Daeseok Lee;
2012 / IEEE
By: Dittmann, R.; Muenstermann, R.; Krug, I.; Daesung Park; Waser, R.; Mayer, J.; Besmehn, A.; Kronast, F.; Schneider, C.M.; Menke, T.;
By: Dittmann, R.; Muenstermann, R.; Krug, I.; Daesung Park; Waser, R.; Mayer, J.; Besmehn, A.; Kronast, F.; Schneider, C.M.; Menke, T.;
2013 / IEEE
By: Shih-Cheng Yen; Songsong Zhang; Hao Wang; Zhuolin Xiang; Minkyu Je; Dim-Lee Kwong; Thakor, Nitish V.; Yong-Ping Xu; Wei Mong Tsang; Chengkuo Lee;
By: Shih-Cheng Yen; Songsong Zhang; Hao Wang; Zhuolin Xiang; Minkyu Je; Dim-Lee Kwong; Thakor, Nitish V.; Yong-Ping Xu; Wei Mong Tsang; Chengkuo Lee;
2015 / IEEE
By: Meng-Li Zhao; Yao-Xiang Yue; Zai-Xian Zhang; Kong-Lin Wu; Xian-Wen Wang; Xian-Wen Wei; Juan Cheng;
By: Meng-Li Zhao; Yao-Xiang Yue; Zai-Xian Zhang; Kong-Lin Wu; Xian-Wen Wang; Xian-Wen Wei; Juan Cheng;
2014 / IEEE
2006 / RSC Publishing
By: Kohei Hosomizu; Tomokazu Umeyama; Keigo Mitamura; Hiroshi Imahori; Seiji Isoda; Kaname Yoshida; Yoshihiro Matano;
By: Kohei Hosomizu; Tomokazu Umeyama; Keigo Mitamura; Hiroshi Imahori; Seiji Isoda; Kaname Yoshida; Yoshihiro Matano;
2006 / RSC Publishing
By: Kotaro Morita; Norio Teramae; Seiichi Nishizawa; Yusuke Sato; Takehiro Seino; Weimin Huang; N. B. Sankaran;
By: Kotaro Morita; Norio Teramae; Seiichi Nishizawa; Yusuke Sato; Takehiro Seino; Weimin Huang; N. B. Sankaran;
2006 / RSC Publishing
By: Sheng Wang; Itamar Willner; Oleg Lioubashevski; Eugenii Katz; Avital Onopriyenko; Ronan Baron; He Tian;
By: Sheng Wang; Itamar Willner; Oleg Lioubashevski; Eugenii Katz; Avital Onopriyenko; Ronan Baron; He Tian;
2006 / RSC Publishing
By: Sandie E. Dann; Roger J. Mortimer; Susan J. Stott; Frank Marken; Munetaka Oyama;
By: Sandie E. Dann; Roger J. Mortimer; Susan J. Stott; Frank Marken; Munetaka Oyama;
2007 / RSC Publishing
By: Geoffrey J. Ashwell; Philip D. Buckle; Catherine J. Bartlett; Piotr Wierzchowiec;
By: Geoffrey J. Ashwell; Philip D. Buckle; Catherine J. Bartlett; Piotr Wierzchowiec;
2007 / RSC Publishing
By: Jan Rossmeisl; Gustav S. Karlberg; Egill Skuacutelason; Jens K. Noslashrskov; Hannes Joacutensson; Jeff Greeley; Thomas Bligaard;
By: Jan Rossmeisl; Gustav S. Karlberg; Egill Skuacutelason; Jens K. Noslashrskov; Hannes Joacutensson; Jeff Greeley; Thomas Bligaard;
2007 / RSC Publishing
By: Gerbrand Ceder; Jordi Cabana; Kisuk Kang; Julien Breacuteger; Clare P. Grey;
By: Gerbrand Ceder; Jordi Cabana; Kisuk Kang; Julien Breacuteger; Clare P. Grey;
2007 / RSC Publishing
By: Peter G. Bruce; A. Robert Armstrong; Bruno Delobelfnotereffnotereffootnote idfn2Present address LRCS, Universiteacute Picardie Jules Verne, 33 Rue SaintLeu, 80039 Amiens, France.footnote; Christopher Lyness;
By: Peter G. Bruce; A. Robert Armstrong; Bruno Delobelfnotereffnotereffootnote idfn2Present address LRCS, Universiteacute Picardie Jules Verne, 33 Rue SaintLeu, 80039 Amiens, France.footnote; Christopher Lyness;
2008 / RSC Publishing
By: Yasuhiro Funahashi; Hidekazu Arii; Yuya Hayashi; Kazuma Shinozaki; Tomohiko Inomata; Hideki Masuda; Tomohiro Ozawa;
By: Yasuhiro Funahashi; Hidekazu Arii; Yuya Hayashi; Kazuma Shinozaki; Tomohiko Inomata; Hideki Masuda; Tomohiro Ozawa;
2008 / RSC Publishing
By: Yunqi Liu; Gui Yu; Chongan Di; Daoben Zhu; Dacheng Wei; Weiping Wu; Yunlong Guo;
By: Yunqi Liu; Gui Yu; Chongan Di; Daoben Zhu; Dacheng Wei; Weiping Wu; Yunlong Guo;
2008 / RSC Publishing
By: R. Halseid; J. Fuhrmann; J. Behm; Z. Jusys; H. Zhao; M. Chojak; H. Langmach; E. Holzbecher;
By: R. Halseid; J. Fuhrmann; J. Behm; Z. Jusys; H. Zhao; M. Chojak; H. Langmach; E. Holzbecher;
2008 / RSC Publishing
By: Alessandro Varotto; Charles M. Drain; Gangyu Liu; Jessica Koehne; Mikki Vinodu; Louis Todaro;
By: Alessandro Varotto; Charles M. Drain; Gangyu Liu; Jessica Koehne; Mikki Vinodu; Louis Todaro;
2008 / RSC Publishing
By: Patrice Simon; MarieJolle Menu; PierreLouis Taberna; Marie Gressier; Laurent Bazin;
By: Patrice Simon; MarieJolle Menu; PierreLouis Taberna; Marie Gressier; Laurent Bazin;