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Topic: Electric Resistance
Results
2011 / IEEE
By: Tate, K.; Renshaw, J.; Ebong, A.; Chia-Wei Chen; Finot, M.; Rohatgi, A.; Zimbardi, F.;
By: Tate, K.; Renshaw, J.; Ebong, A.; Chia-Wei Chen; Finot, M.; Rohatgi, A.; Zimbardi, F.;
2012 / IEEE
By: Jie Fan; Wang, Q.; Wang, P.; Zhou, K.; Jiang, Y.H.; Yao, G.L.; Wang, Y.G.; Lei, T.F.; Xiaorong Luo; Zhang, Z.Y.; Udrea, F.; Zhaoji Li; Bo Zhang; Ge, R.;
By: Jie Fan; Wang, Q.; Wang, P.; Zhou, K.; Jiang, Y.H.; Yao, G.L.; Wang, Y.G.; Lei, T.F.; Xiaorong Luo; Zhang, Z.Y.; Udrea, F.; Zhaoji Li; Bo Zhang; Ge, R.;
2012 / IEEE
By: Tiemeijer, L.F.; Nazarian, A.L.; Pijper, R.M.T.; de Langen, M.; van Steenwijk, J.A.; John, D.L.;
By: Tiemeijer, L.F.; Nazarian, A.L.; Pijper, R.M.T.; de Langen, M.; van Steenwijk, J.A.; John, D.L.;
2012 / IEEE
By: Meneghesso, G.; Zanoni, E.; Ueda, D.; Tanaka, T.; Ueda, T.; de Santi, C.; Meneghini, M.;
By: Meneghesso, G.; Zanoni, E.; Ueda, D.; Tanaka, T.; Ueda, T.; de Santi, C.; Meneghini, M.;
2012 / IEEE
By: Srinivasan, V.S.S.; Ganguly, U.; Lodha, S.; Kuppurao, S.; Srinivasan, S.; Kim, Y.; Kumbhare, P.; Lashkare, S.; Bafna, P.; Karkare, P.; Chopra, S.;
By: Srinivasan, V.S.S.; Ganguly, U.; Lodha, S.; Kuppurao, S.; Srinivasan, S.; Kim, Y.; Kumbhare, P.; Lashkare, S.; Bafna, P.; Karkare, P.; Chopra, S.;
2012 / IEEE
By: Hong-Sik Shin; Min-Ho Kang; Jammy, R.; Hi-Deok Lee; Jung-Ho Yoo; Majhi, P.; Jung-Woo Oh; Ga-Won Lee;
By: Hong-Sik Shin; Min-Ho Kang; Jammy, R.; Hi-Deok Lee; Jung-Ho Yoo; Majhi, P.; Jung-Woo Oh; Ga-Won Lee;
Normally Off GaN Power MOSFET Grown on Sapphire Substrate With Highly Resistive Undoped Buffer Layer
2012 / IEEEBy: Jung-Hee Lee; Jae-Hyun Jeong; Jae-Hoon Lee;
2012 / IEEE
By: Maan, J.C.; Perenboom, J.A.A.J.; van Velsen, J.; Rook, J.; Wiegers, S.A.J.; den Ouden, A.;
By: Maan, J.C.; Perenboom, J.A.A.J.; van Velsen, J.; Rook, J.; Wiegers, S.A.J.; den Ouden, A.;
2010 / IEEE / 978-1-4244-5261-3
By: Wieczorek, L.; Hubble, L.; Raguse, B.; Cooper, J.; Chow, E.; Muller, K.;
By: Wieczorek, L.; Hubble, L.; Raguse, B.; Cooper, J.; Chow, E.; Muller, K.;
2011 / IEEE / 978-3-8007-3356-9
By: Jaehong Park; Kyounghoon Yang; Yongsik Jeong; Jooseok Lee; Jongwon Lee;
By: Jaehong Park; Kyounghoon Yang; Yongsik Jeong; Jooseok Lee; Jongwon Lee;
2011 / IEEE / 978-3-8007-3356-9
By: Low, T.S.; Colbus, P.; Dvorak, M.W.; Bing-Ruey Wu; D'Avanzo, D.;
By: Low, T.S.; Colbus, P.; Dvorak, M.W.; Bing-Ruey Wu; D'Avanzo, D.;
2011 / IEEE / 978-1-61284-247-9
By: Mieze, A.; Chaari, R.; Vinassa, J.; Simon, R.; Jed, H.A.; Briat, O.; Eddahech, A.;
By: Mieze, A.; Chaari, R.; Vinassa, J.; Simon, R.; Jed, H.A.; Briat, O.; Eddahech, A.;
2011 / IEEE / 978-1-61284-247-9
By: Dries, C.; Fursin, L.; Li, X.; Alexandrov, P.; Burke, T.; Zhao, J.;
By: Dries, C.; Fursin, L.; Li, X.; Alexandrov, P.; Burke, T.; Zhao, J.;
2011 / IEEE / 978-966-335-357-9
By: Shvedov, S.V.; Vysotski, V.B.; Borisenko, V.E.; Leshok, A.A.; Lazarouk, S.K.; Katsuba, P.S.;
By: Shvedov, S.V.; Vysotski, V.B.; Borisenko, V.E.; Leshok, A.A.; Lazarouk, S.K.; Katsuba, P.S.;
2011 / IEEE / 978-1-4577-0490-1
By: Coelho, R.R.; Cunha, G.G.; de Oliveira Costa Figueiredo, M.; Coelho, D.R.;
By: Coelho, R.R.; Cunha, G.G.; de Oliveira Costa Figueiredo, M.; Coelho, D.R.;
2011 / IEEE / 978-0-9568086-0-8
By: Schindler-Saefkow, F.; Michel, B.; Wunderle, B.; Rzepka, S.; Otto, A.; Rost, F.;
By: Schindler-Saefkow, F.; Michel, B.; Wunderle, B.; Rzepka, S.; Otto, A.; Rost, F.;
2011 / IEEE / 978-1-4577-2141-0
By: Ning Lu; Floresca, H.C.; Kim, J.; Cha, D.K.; Park, S.Y.; Kim, M.J.; Wang, J.G.;
By: Ning Lu; Floresca, H.C.; Kim, J.; Cha, D.K.; Park, S.Y.; Kim, M.J.; Wang, J.G.;
2011 / IEEE / 978-1-4577-1756-7
By: Verma, M.; Shrestha, P.; Orlowski, M.; Baumgart, H.; Cheung, K.P.; Yuhong Kang;
By: Verma, M.; Shrestha, P.; Orlowski, M.; Baumgart, H.; Cheung, K.P.; Yuhong Kang;
2011 / IEEE / 978-1-4577-1516-7
By: Keng-chih Liang; Chia-hao Tu; Waileong Chen; Yonhua Tzeng; Chuan-Pu Liu; Chih-Yi Liu;
By: Keng-chih Liang; Chia-hao Tu; Waileong Chen; Yonhua Tzeng; Chuan-Pu Liu; Chih-Yi Liu;
2012 / IEEE / 978-1-4577-1318-7
By: Tinoco, J.C.; Raskin, J.-P.; Martinez-Lopez, A.G.; Alvarado, J.;
By: Tinoco, J.C.; Raskin, J.-P.; Martinez-Lopez, A.G.; Alvarado, J.;
2012 / IEEE / 978-80-214-4470-6
By: Vrba, K.; Dostal, T.; Koton, J.; Jerabek, J.; Herencsar, N.; Sotner, R.;
By: Vrba, K.; Dostal, T.; Koton, J.; Jerabek, J.; Herencsar, N.; Sotner, R.;
2012 / IEEE / 978-1-4673-1081-9
By: Gilmer, D.C.; Young-Fisher, K.G.; Bersuker, G.; Butcher, B.; Kalantarian, A.; Kirsch, P.D.; Jammy, R.; Geer, R.; Nishi, Y.;
By: Gilmer, D.C.; Young-Fisher, K.G.; Bersuker, G.; Butcher, B.; Kalantarian, A.; Kirsch, P.D.; Jammy, R.; Geer, R.; Nishi, Y.;
Integration of a low-k organic polymer material (k=2.3) for reducing both resistance and capacitance
2012 / IEEE / 978-1-4673-1137-3By: Kawakami, H.; Koga, K.; Akiyama, Y.; Hirai, M.; Tada, M.; Nakatani, K.;