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Topic: Dram Chips
Results
2011 / IEEE
By: Seung Jae Baik; Yong-Hoon Son; Euijoon Yoon; Yoo Gyun Shin; Gihyun Hwang; Jong-Wook Lee; Sanghun Jeon;
By: Seung Jae Baik; Yong-Hoon Son; Euijoon Yoon; Yoo Gyun Shin; Gihyun Hwang; Jong-Wook Lee; Sanghun Jeon;
2012 / IEEE
By: Cheng-Wei Cao; Zhang, D.W.; Peng-Fei Wang; Xing, C.; Qing-Qing Sun; Xi Lin; Song-Gan Zang;
By: Cheng-Wei Cao; Zhang, D.W.; Peng-Fei Wang; Xing, C.; Qing-Qing Sun; Xi Lin; Song-Gan Zang;
2012 / IEEE
By: Amirkhany, A.; Xingchao Yuan; Mishra, N.K.; Jie Shen; Beyene, W.T.; Chen, C.; Chin, T.J.; Dressier, D.; Huang, C.; Gadde, V.P.; Hekmat, M.; Kaviani, K.; Hai Lan; Phuong Le; Mahabaleshwara; Madden, C.; Mukherjee, S.; Raghavan, L.; Saito, K.; Secker, D.; Sendhil, A.; Schmitt, R.; Fazeel, S.; Srinivas, G.S.; Ting Wu; Chanh Tran; Vaidyanath, A.; Vyas, K.; Ling Yang; Jain, M.; Chang, K.-Y.K.; Wei, J.;
By: Amirkhany, A.; Xingchao Yuan; Mishra, N.K.; Jie Shen; Beyene, W.T.; Chen, C.; Chin, T.J.; Dressier, D.; Huang, C.; Gadde, V.P.; Hekmat, M.; Kaviani, K.; Hai Lan; Phuong Le; Mahabaleshwara; Madden, C.; Mukherjee, S.; Raghavan, L.; Saito, K.; Secker, D.; Sendhil, A.; Schmitt, R.; Fazeel, S.; Srinivas, G.S.; Ting Wu; Chanh Tran; Vaidyanath, A.; Vyas, K.; Ling Yang; Jain, M.; Chang, K.-Y.K.; Wei, J.;
2012 / IEEE
By: Kaviani, K.; Xingchao Yuan; Wei, J.; Amirkhany, A.; Jie Shen; Chin, T.J.; Thakkar, C.; Beyene, W.T.; Chan, N.; Chen, C.; Bing Ren Chuang; Dressler, D.; Gadde, V.P.; Hekmat, M.; Ho, E.; Huang, C.; Phuong Le; Mahabaleshwara; Madden, C.; Mishra, N.K.; Raghavan, L.; Saito, K.; Schmitt, R.; Secker, D.; Xudong Shi; Fazeel, S.; Srinivas, G.S.; Zhang, S.; Tran, C.; Vaidyanath, A.; Vyas, K.; Jain, M.; Kun-Yung Ken Chang; Ting Wu;
By: Kaviani, K.; Xingchao Yuan; Wei, J.; Amirkhany, A.; Jie Shen; Chin, T.J.; Thakkar, C.; Beyene, W.T.; Chan, N.; Chen, C.; Bing Ren Chuang; Dressler, D.; Gadde, V.P.; Hekmat, M.; Ho, E.; Huang, C.; Phuong Le; Mahabaleshwara; Madden, C.; Mishra, N.K.; Raghavan, L.; Saito, K.; Schmitt, R.; Secker, D.; Xudong Shi; Fazeel, S.; Srinivas, G.S.; Zhang, S.; Tran, C.; Vaidyanath, A.; Vyas, K.; Jain, M.; Kun-Yung Ken Chang; Ting Wu;
2012 / IEEE
By: Hyun-Woo Lee; Byong-Tae Chung; Beom-Ju Shin; Kyung-Hoon Kim; Kyung-Whan Kim; Jaeil Kim; Kwang-Hyun Kim; Jong-Ho Jung; Jae-Hwan Kim; Eun-Young Park; Jong-Sam Kim; Jong-Hwan Kim; Jin-Hee Cho; Namgyu Rye; Jun-Hyun Chun; Yunsaing Kim; Chulwoo Kim; Young-Jung Choi; Hoon Choi;
By: Hyun-Woo Lee; Byong-Tae Chung; Beom-Ju Shin; Kyung-Hoon Kim; Kyung-Whan Kim; Jaeil Kim; Kwang-Hyun Kim; Jong-Ho Jung; Jae-Hwan Kim; Eun-Young Park; Jong-Sam Kim; Jong-Hwan Kim; Jin-Hee Cho; Namgyu Rye; Jun-Hyun Chun; Yunsaing Kim; Chulwoo Kim; Young-Jung Choi; Hoon Choi;
2012 / IEEE
By: Byong-Tae Chung; Young-Jung Choi; Chulwoo Kim; Kwan-Weon Kim; Hyun-Woo Lee; Ju-Hwan Sohn; Young-Kyoung Choi; Ki-Han Kim; Nak-Kyu Park;
By: Byong-Tae Chung; Young-Jung Choi; Chulwoo Kim; Kwan-Weon Kim; Hyun-Woo Lee; Ju-Hwan Sohn; Young-Kyoung Choi; Ki-Han Kim; Nak-Kyu Park;
2012 / IEEE
By: Jing Chen; Qingqing Wu; Fossum, J.G.; Xi Wang; Pang, A.; Zhenming Zhou; Zhichao Lu; Chao Qiu; Tao Yu; Zhan Chai; Jiexin Luo; Le Li;
By: Jing Chen; Qingqing Wu; Fossum, J.G.; Xi Wang; Pang, A.; Zhenming Zhou; Zhichao Lu; Chao Qiu; Tao Yu; Zhan Chai; Jiexin Luo; Le Li;
2012 / IEEE
By: Fukushima, T.; Ohara, Y.; Naganuma, H.; Tani, T.; Kangwook Lee; Koyanagi, M.; Tanaka, T.;
By: Fukushima, T.; Ohara, Y.; Naganuma, H.; Tani, T.; Kangwook Lee; Koyanagi, M.; Tanaka, T.;
2009 / IEEE / 978-1-4577-0493-2
By: McPeak, R.; Edmonds, L.; Adell, P.C.; McClure, S.S.; Scheick, L.;
By: McPeak, R.; Edmonds, L.; Adell, P.C.; McClure, S.S.; Scheick, L.;
2011 / IEEE / 978-1-61284-175-5
By: Bishan He; Fainstein, D.; Safran, J.; Golz, J.; Iyer, S.; Ken Rim; Kirihata, T.; Robson, N.; Barth, J.; Leu, D.; Kothandaraman, C.; Maier, G.; Himmel, B.; Cestero, A.; Yan Sun; Vehabovic, A.; Weaver, T.; Ming Yin;
By: Bishan He; Fainstein, D.; Safran, J.; Golz, J.; Iyer, S.; Ken Rim; Kirihata, T.; Robson, N.; Barth, J.; Leu, D.; Kothandaraman, C.; Maier, G.; Himmel, B.; Cestero, A.; Yan Sun; Vehabovic, A.; Weaver, T.; Ming Yin;
2011 / IEEE / 978-1-4577-0642-4
By: Daneshtalab, M.; Tenhunen, H.; Plosila, J.; Liljeberg, P.; Ebrahimi, M.;
By: Daneshtalab, M.; Tenhunen, H.; Plosila, J.; Liljeberg, P.; Ebrahimi, M.;
2011 / IEEE / 978-1-61284-175-5
By: Amirkhany, A.; Secker, D.; Wu, T.; Kaviani, K.; Yuan, C.; Chang, K.; Jain, M.; Vyas, K.; Vaidyanath, A.; Tran, C.; Srinivas, S.; Shuaeb, F.; Shi, X.; Wei, J.; Saito, K.; Raghavan, L.; Mishra, N.; Madden, C.; M, M.; Le, P.; Huang, C.; Gadde, V.; Dressler, D.; Beyene, W.; Chin, T.; Chen, C.; Shen, J.;
By: Amirkhany, A.; Secker, D.; Wu, T.; Kaviani, K.; Yuan, C.; Chang, K.; Jain, M.; Vyas, K.; Vaidyanath, A.; Tran, C.; Srinivas, S.; Shuaeb, F.; Shi, X.; Wei, J.; Saito, K.; Raghavan, L.; Mishra, N.; Madden, C.; M, M.; Le, P.; Huang, C.; Gadde, V.; Dressler, D.; Beyene, W.; Chin, T.; Chen, C.; Shen, J.;
2011 / IEEE / 978-1-61284-175-5
By: Yongju Kim; Jaemin Jang; Jinyeong Moon; Seongjun Lee; Daehan Kwon; Hongseok Choi; Geunwoo Park; Byongtae Chung;
By: Yongju Kim; Jaemin Jang; Jinyeong Moon; Seongjun Lee; Daehan Kwon; Hongseok Choi; Geunwoo Park; Byongtae Chung;
2011 / IEEE / 978-1-61284-175-5
By: Amirkhany, A.; Wei, J.; Yuan, C.; Chang, K.; Jain, M.; Vyas, K.; Vaidyanathan, A.; Tran, C.; Wu, T.; Srinivas, S.; Shuaeb, F.; Secker, D.; Saito, K.; Raghavan, L.; Mukherjee, S.; Madden, C.; M, M.; Le, P.; Kaviani, K.; Gadde, V.; Huang, C.; Chin, T.; Beyene, W.; Shen, J.; Mishra, N.;
By: Amirkhany, A.; Wei, J.; Yuan, C.; Chang, K.; Jain, M.; Vyas, K.; Vaidyanathan, A.; Tran, C.; Wu, T.; Srinivas, S.; Shuaeb, F.; Secker, D.; Saito, K.; Raghavan, L.; Mukherjee, S.; Madden, C.; M, M.; Le, P.; Kaviani, K.; Gadde, V.; Huang, C.; Chin, T.; Beyene, W.; Shen, J.; Mishra, N.;
2011 / IEEE / 978-1-4244-9949-6
By: Banna, S.; Tang, C.; Sang-Min Hwang; Hong, S.-J.; Van Buskirk, M.; Lee, J.-H.; Roh, J.-S.; Cho, S.-H.; Sung-Woong Chung; Park, J.-W.; Chung, S.-J.; Lee, J.-Y.; Seung-Hwan Lee; Joong-Sik Kim; Jungtae Kwon; Kim, D.; Thurgate, T.; Gupta, M.; Bhardwaj, S.;
By: Banna, S.; Tang, C.; Sang-Min Hwang; Hong, S.-J.; Van Buskirk, M.; Lee, J.-H.; Roh, J.-S.; Cho, S.-H.; Sung-Woong Chung; Park, J.-W.; Chung, S.-J.; Lee, J.-Y.; Seung-Hwan Lee; Joong-Sik Kim; Jungtae Kwon; Kim, D.; Thurgate, T.; Gupta, M.; Bhardwaj, S.;
2011 / IEEE / 978-1-61284-372-8
By: Franklin, D.; Schulz, M.; de Supinski, B.R.; Biswas, S.; Chong, F.T.; Sherwood, T.;
By: Franklin, D.; Schulz, M.; de Supinski, B.R.; Biswas, S.; Chong, F.T.; Sherwood, T.;
2011 / IEEE / 978-1-4577-0468-0
By: Urgaonkar, B.; Gupta, A.; Youngjae Kim; Sivasubramaniam, A.; Berman, P.;
By: Urgaonkar, B.; Gupta, A.; Youngjae Kim; Sivasubramaniam, A.; Berman, P.;
2011 / IEEE / 978-1-61284-857-0
By: Tingting Hwang; Jen-Chieh Yeh; Chuan-Nan Liu; Yi-Ta Wu; Yuan Xie; Shau-Yin Tseng; Wei-Heng Lo; Po-Yang Hsu; Tao Zhang;
By: Tingting Hwang; Jen-Chieh Yeh; Chuan-Nan Liu; Yi-Ta Wu; Yuan Xie; Shau-Yin Tseng; Wei-Heng Lo; Po-Yang Hsu; Tao Zhang;
2011 / IEEE / 978-1-61284-857-0
By: Inoue, K.; Murakami, K.; Fukumoto, N.; Ueno, S.; Hashiguchi, S.;
By: Inoue, K.; Murakami, K.; Fukumoto, N.; Ueno, S.; Hashiguchi, S.;
2011 / IEEE / 978-1-4577-0223-5
By: Tsuchiya, R.; Takemura, R.; Itoh, K.; Kotabe, A.; Horiguchi, M.;
By: Tsuchiya, R.; Takemura, R.; Itoh, K.; Kotabe, A.; Horiguchi, M.;
2011 / IEEE / 978-1-4577-0708-7
By: Yong Chul Oh; Jiyoung Kim; Ki-Whan Song; Hyungi Kim; Sua Kim; Kanguk Kim; Yoosang Hwang; Huijung Kim; Hyunwoo Chung; Chilhee Chung; Gyo-Young Jin; Hyeongsun Hong;
By: Yong Chul Oh; Jiyoung Kim; Ki-Whan Song; Hyungi Kim; Sua Kim; Kanguk Kim; Yoosang Hwang; Huijung Kim; Hyunwoo Chung; Chilhee Chung; Gyo-Young Jin; Hyeongsun Hong;
2011 / IEEE / 978-1-4577-0223-5
By: Mishra, N.K.; Amirkhany, A.; Sendhil, A.; Mukherjee, S.; Phuong Le; Jain, M.;
By: Mishra, N.K.; Amirkhany, A.; Sendhil, A.; Mukherjee, S.; Phuong Le; Jain, M.;
2011 / IEEE / 978-1-4503-0715-4
By: Tei-Wei Kuo; Yuan-Hao Chang; Goossens, K.; Dutoit, D.; Vivet, P.; Clermidy, F.; Po-Chun Huang; Akesson, B.; Wingard, D.;
By: Tei-Wei Kuo; Yuan-Hao Chang; Goossens, K.; Dutoit, D.; Vivet, P.; Clermidy, F.; Po-Chun Huang; Akesson, B.; Wingard, D.;
2011 / IEEE / 978-1-4244-8340-2
By: Lee, B.S.; Byun, H.I.; Park, Y.D.; Chung, C.H.; Ha, K.H.; Hong, S.Y.; Choi, Y.; Shin, Y.H.; Suh, S.D.; Joe, I.S.; Kim, S.G.; Cho, K.S.; Na, K.W.; Ji, H.-C.; Lee, K.-H.; Shin, D.J.; Pyo, J.;
By: Lee, B.S.; Byun, H.I.; Park, Y.D.; Chung, C.H.; Ha, K.H.; Hong, S.Y.; Choi, Y.; Shin, Y.H.; Suh, S.D.; Joe, I.S.; Kim, S.G.; Cho, K.S.; Na, K.W.; Ji, H.-C.; Lee, K.-H.; Shin, D.J.; Pyo, J.;
2011 / IEEE / 978-1-4577-1954-7
By: Reinman, G.; Ir, J.; Gyung-Su Byun; Therdsteerasukdi, K.; Chang, M.F.; Cong, J.;
By: Reinman, G.; Ir, J.; Gyung-Su Byun; Therdsteerasukdi, K.; Chang, M.F.; Cong, J.;
1T-DRAM at the 22nm technology node and beyond: An alternative to DRAM with high-k storage capacitor
2011 / IEEE / 978-1-4577-1025-4By: Martinez, F.; Sagnes, B.; Chang, S.J.; Hubert, A.; Guegan, G.; Pascal, F.; Cristoloveanu, S.; Bawedin, M.; Hoffmann, A.; Valenza, M.;
2011 / IEEE / 978-1-61284-760-3
By: Claeys, C.; Jurczak, M.; Aoulaiche, M.; Simoen, E.; Galeti, M.; Martino, J.A.; Rodrigues, M.; Collaert, N.;
By: Claeys, C.; Jurczak, M.; Aoulaiche, M.; Simoen, E.; Galeti, M.; Martino, J.A.; Rodrigues, M.; Collaert, N.;
2011 / IEEE / 978-1-4577-0586-1
By: Grurmann, K.; Herrmann, M.; Ferlet-Cavrois, V.; Kettunen, H.; Gliem, F.;
By: Grurmann, K.; Herrmann, M.; Ferlet-Cavrois, V.; Kettunen, H.; Gliem, F.;
2011 / IEEE / 978-1-4577-0586-1
By: Lochon, F.; Grandjean, M.; Mazurek, M.; Damery, J.C.; Dangla, D.; Standarovski, D.; Guerre, F.X.;
By: Lochon, F.; Grandjean, M.; Mazurek, M.; Damery, J.C.; Dangla, D.; Standarovski, D.; Guerre, F.X.;
2011 / IEEE / 978-1-4577-0586-1
By: Harboe-Sorensen, R.; Pleskac, R.; Ferlet-Cavrois, V.; Durante, M.; Hoeffgen, S.K.; Weinand, U.; Schardt, D.; Poivey, C.; Lennartz, W.; Nieminen, P.; Metzger, S.; Menicucci, A.; Mathes, M.; LaTessa, C.; Kuhnhenn, J.; Kuendgen, T.;
By: Harboe-Sorensen, R.; Pleskac, R.; Ferlet-Cavrois, V.; Durante, M.; Hoeffgen, S.K.; Weinand, U.; Schardt, D.; Poivey, C.; Lennartz, W.; Nieminen, P.; Metzger, S.; Menicucci, A.; Mathes, M.; LaTessa, C.; Kuhnhenn, J.; Kuendgen, T.;