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Topic: Deposited Energy

Results

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices
2011 / IEEE
By: Paillet, P.; Gaillardin, M.; Raine, M.; Bournel, A.; Girard, S.; Duhamel, O.;
Effect of Medium on Deposited Energy in Microsecond Electrical Explosion of Wires
2012 / IEEE
By: Qing Zhou; Lei Pang; Junping Zhao; Jun Zhang; Xuandong Liu; Wenyu Yan; Qiaogen Zhang;
Characterization of a Novel Diamond-Based Microdosimeter Prototype for Radioprotection Applications in Space Environments
2012 / IEEE
By: Prawer, S.; Jamieson, D.; Reinhard, M.I.; Prokopovich, D.A.; Lerch, M.L.F.; Siegele, R.N.; Livingstone, J.; Petasecca, M.; Guatelli, S.; Alves, A.D.C.; Ganesan, K.; Davis, J.A.; Rosenfeld, A.B.; Zaider, M.; Ziegler, J.; Dicello, J.F.; Pisacane, V.L.; Kuncic, Z.;
Image evaluation for CZT Compton PET using backprojection and MLEM method
2011 / IEEE / 978-1-4673-0120-6
By: Changyeon Yoon; Wonho Lee;
Effect of Subatmospheric Pressure on Deposited Energy for Electrical Wire Explosion in Air
2014 / IEEE
By: Deng, B.; Yu, L.; Song, W.; Wu, G.; Liu, X.; Zhang, Q.; Zhou, Q.; Chen, R.;
Study on Resistance and Energy Deposition of Spark Channel Under the Oscillatory Current Pulse
2014 / IEEE
By: Yang, H.; Zeng, F.; Liu, X.; Li, X.; Zhang, Q.;
Advances and applications of ABCI
1993 / IEEE / 0-7803-1203-1
By: Chin, Y.H.;
Vacuum ultraviolet emissions from the ionic excimer molecules (KrCs)/sup +/ and (HeAr)/sup +/ by low-energy electron-beam excitation
1995 / IEEE
By: Fontaine, B.; Delaporte, P.; Tischler, H.; Sentis, M.L.;
Observation of ultrafast electron behavior in femtosecond optical breakdown of dielectrics
1999 / IEEE / 1-55752-595-1
By: Ming Li; Gibson, G.N.; Chunlei Guo; Nibarger, J.P.; Menon, S.;
Homogeneous electrical explosion of refractory metal wires in a vacuum
2001 / IEEE / 0-7803-7141-0
By: Sarkisov, G.S.; De-Groot, J.S.; Sasorov, P.V.; Bauer, B.S.;
Detection of prompt luminescence from an imaging plate with heavy particle injection
2001 / IEEE
By: Sato, N.; Morimoto, K.; Higuchi, Y.; Tokanai, F.; Yasuda, N.; Gunji, S.; Sakurai, H.; Inui, E.;
Line edge roughness of developed resist at low dose electron beam exposure
2001 / IEEE / 4-89114-017-8
By: Kotera, M.; Yamada, T.;
Performance of a chamber for studying the liquid xenon response to nuclear recoils
2004 / IEEE / 0-7803-8700-7
By: Lopes, M.I.; Pereira, A.; Solovov, V.; Neves, F.; Chepel, V.; da Cunha, J.P.; Marques, R.F.; Policarpo, A.J.P.L.; Suva, C.P.; Lindote, A.; Mendes, P.;
Improved image reconstruction in small animal PET using a priori estimates of single-pixel events
2007 / IEEE / 978-1-4244-0922-8
By: Herranz, E.; Vicente, E.; Herraiz, J.L.; Espaa, S.; Udias, J.M.; Desco, M.; Vaquero, J.J.;
Charge-Collection Length Induced by Proton and Alpha Particle Injected Into Silicon Detectors Due to Funneling Effect
2009 / IEEE
By: Nunomiya, T.; Takada, M.; Nakamura, T.; Ishikura, T.;
The ATLAS TileCal read-out drivers signal reconstruction
2009 / IEEE / 978-1-4244-3961-4
By: Valero, A.;
A New Scintillator for Fast Neutron Detection: Single-Crystal ${\rm CeCl}_{3}({\rm CH}_{3}{\rm OH})_{4}$
2010 / IEEE
By: Neal, J.S.; Boatner, L.A.; Bell, Z.W.; McConchie, S.M.; Custelcean, R.; Ramey, J.O.; Kolopus, J.A.; Chakoumakos, B.C.; Wisniewska, M.; Wisniewski, D.;
Towards fast femtosecond laser micromachining of glass, effect of deposited energy
2010 / IEEE / 978-1-55752-890-2
By: Rajesh, S.; Bellouard, Y.;

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