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Topic: Data Collection
Results
2012 / IEEE
By: Bligaard, T.; DuBak, M.; Greeley, J.; Nestorov, S.; N�rskov, J.K.; Landis, D.D.; Hummelsh�j, J.S.; Jacobsen, K.W.;
By: Bligaard, T.; DuBak, M.; Greeley, J.; Nestorov, S.; N�rskov, J.K.; Landis, D.D.; Hummelsh�j, J.S.; Jacobsen, K.W.;
2012 / IEEE
By: Rogers, Marc; Pfleeger, Shari Lawrence; Stolfo, Sal; Losavio, Michael; Caputo, Deanna; Caine, Kelly; Bashir, Masooda;
By: Rogers, Marc; Pfleeger, Shari Lawrence; Stolfo, Sal; Losavio, Michael; Caputo, Deanna; Caine, Kelly; Bashir, Masooda;
2011 / IEEE / 978-1-4577-0513-7
By: Selavo, L.; Kanonirs, G.; Zviedris, R.; Strazdins, G.; Mednis, A.;
By: Selavo, L.; Kanonirs, G.; Zviedris, R.; Strazdins, G.; Mednis, A.;
2011 / IEEE / 978-1-4577-0513-7
By: Nikoletseas, S.; Angelopoulos, C.M.; Raptopoulos, C.; Patroumpa, D.;
By: Nikoletseas, S.; Angelopoulos, C.M.; Raptopoulos, C.; Patroumpa, D.;
2011 / IEEE / 978-1-4577-0339-3
By: Aziz, W.A.W.; Syahmi, M.Z.; Othman, Z.; Anuar, A.; Zulkarnaini, M.A.;
By: Aziz, W.A.W.; Syahmi, M.Z.; Othman, Z.; Anuar, A.; Zulkarnaini, M.A.;
2011 / IEEE / 978-1-4577-0088-0
By: Guillen, J.; Antonijuan, J.; Puig, P.; Palanques, A.; Manuel, A.; Nogueras, M.;
By: Guillen, J.; Antonijuan, J.; Puig, P.; Palanques, A.; Manuel, A.; Nogueras, M.;
2011 / IEEE / 978-1-4577-0530-4
By: Tae Eun Choe; Hakeem, A.; Li Yu; Gupta, H.; Locasto, M.; Haering, N.;
By: Tae Eun Choe; Hakeem, A.; Li Yu; Gupta, H.; Locasto, M.; Haering, N.;
2011 / IEEE / 978-1-4577-0088-0
By: Menendez, M.; Losada, I.J.; Mendez, F.J.; Fernandez, J.; Fita, L.; Garcia-Diez, M.; Camus, P.; Tomas, A.;
By: Menendez, M.; Losada, I.J.; Mendez, F.J.; Fernandez, J.; Fita, L.; Garcia-Diez, M.; Camus, P.; Tomas, A.;
2011 / IEEE / 978-1-61284-088-8
By: Zhonghua Wang; Yang Liu; Jingrui Zhao; Yongqing Jiang; Tianling Lv; Bingxin Wei;
By: Zhonghua Wang; Yang Liu; Jingrui Zhao; Yongqing Jiang; Tianling Lv; Bingxin Wei;
2011 / IEEE / 978-1-61284-449-7
By: Xiao, H.; Wu, Y.M.; Ding, S.T.; Zheng, X.H.; Niu, J.W.; Qi, J.C.;
By: Xiao, H.; Wu, Y.M.; Ding, S.T.; Zheng, X.H.; Niu, J.W.; Qi, J.C.;
2011 / IEEE / 978-1-61284-722-1
By: Li Shiwu; Yang Zhongkai; Qiao Feiyan; Ji Bingkui; Yang Zhifa; Wang Linhong;
By: Li Shiwu; Yang Zhongkai; Qiao Feiyan; Ji Bingkui; Yang Zhifa; Wang Linhong;
2011 / IEEE / 978-0-9836283-0-9
By: Lally, S.; Farah, T.; Trajkovic, L.; Xu, D.; Paul, R.; Al-Rousan, N.; Gill, R.;
By: Lally, S.; Farah, T.; Trajkovic, L.; Xu, D.; Paul, R.; Al-Rousan, N.; Gill, R.;
2011 / IEEE / 978-1-4244-8165-1
By: Lei Chen; Zhengyu Chen; Jian Xu; Geng Yang; Haiyong Wang; Zhen Yang;
By: Lei Chen; Zhengyu Chen; Jian Xu; Geng Yang; Haiyong Wang; Zhen Yang;
2011 / IEEE / 978-1-4244-6051-9
By: Ngwira, C.; Ssessanga, N.; Habarulema, J.B.; Athieno, R.; McKinnell, L.;
By: Ngwira, C.; Ssessanga, N.; Habarulema, J.B.; Athieno, R.; McKinnell, L.;
2011 / IEEE / 978-1-4577-1005-6
By: Latvakowski, H.; Fish, C.; Bingham, G.; Scott, D.; Greenman, M.; Yong Han; Zavyalov, V.; Esplin, M.;
By: Latvakowski, H.; Fish, C.; Bingham, G.; Scott, D.; Greenman, M.; Yong Han; Zavyalov, V.; Esplin, M.;
2011 / IEEE / 978-1-4577-1002-5
By: Orths, A.; Cuk, V.; Kling, W.L.; Myrzik, J.M.A.; Heskes, P.J.M.; Schegner, P.; Meyer, J.; Romero Gordon, J.M.; Bohm, M.; Preis, D.; Jager, J.; Konig, S.; Browne, N.; Langella, R.; Testa, A.; Grandi, A.L.Z.; Macedo, J.R.; da Silva Lira, M.M.; Leitao, J.J.A.L.; Ribeiro, P.F.; Vandevelde, L.; Desmet, J.; Debruyne, C.; Verhelst, B.; Timens, R.B.; Cobben, J.F.G.;
By: Orths, A.; Cuk, V.; Kling, W.L.; Myrzik, J.M.A.; Heskes, P.J.M.; Schegner, P.; Meyer, J.; Romero Gordon, J.M.; Bohm, M.; Preis, D.; Jager, J.; Konig, S.; Browne, N.; Langella, R.; Testa, A.; Grandi, A.L.Z.; Macedo, J.R.; da Silva Lira, M.M.; Leitao, J.J.A.L.; Ribeiro, P.F.; Vandevelde, L.; Desmet, J.; Debruyne, C.; Verhelst, B.; Timens, R.B.; Cobben, J.F.G.;